Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | CuMnAs film thickness | 45nm | — | |||
| Feature Period | SAW wavelength | 5.73um | — | |||
| Voltage Shift | peak-to-peak amplitude of oscillating piezoelectric potential | 0.35V | — | |||
| Strain | surface SAW-induced strain | 0.01% | — | |||
| Spin Axis Rotation | averaged overall spin-axis rotation | 2.4deg | — | |||
| Temperature | XAS/XMLD measurement temperature | 235K | — | |||
| Temperature | XMLD imaging temperature | 223K | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | CuMnAs film thickness | 45nm | — | |||
| Feature Period | SAW wavelength | 5.73um | — | |||
| Voltage Shift | peak-to-peak amplitude of oscillating piezoelectric potential | 0.35V | — | |||
| Strain | surface SAW-induced strain | 0.01% | — | |||
| Spin Axis Rotation | averaged overall spin-axis rotation | 2.4deg | — | |||
| Temperature | XAS/XMLD measurement temperature | 235K | — | |||
| Temperature | XMLD imaging temperature | 223K | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | CuMnAs film thickness | 45nm | — | |||
| Feature Period | SAW wavelength | 5.73um | — | |||
| Voltage Shift | peak-to-peak amplitude of oscillating piezoelectric potential | 0.35V | — | |||
| Strain | surface SAW-induced strain | 0.01% | — | |||
| Spin Axis Rotation | averaged overall spin-axis rotation | 2.4deg | — | |||
| Temperature | XAS/XMLD measurement temperature | 235K | — | |||
| Temperature | XMLD imaging temperature | 223K | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | CuMnAs film thickness | 45nm | — | |||
| Feature Period | SAW wavelength | 5.73um | — | |||
| Voltage Shift | peak-to-peak amplitude of oscillating piezoelectric potential | 0.35V | — | |||
| Strain | surface SAW-induced strain | 0.01% | — | |||
| Spin Axis Rotation | averaged overall spin-axis rotation | 2.4deg | — | |||
| Temperature | XAS/XMLD measurement temperature | 235K | — | |||
| Temperature | XMLD imaging temperature | 223K | — |