Research paper
Experimental GrowthExperimental CharacterizationComputed Phonon| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | film thickness | 40nm | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0002) | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0004) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (111) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (222) | — | |||
| Elemental Composition | Mn | 4.71at.% | — | |||
| Elemental Composition | Te | 4.58at.% | — | |||
| Raman Peak | Eg | 121cm⁻¹ | — | |||
| Raman Peak | A1g | 140cm⁻¹ | — | |||
| Raman Peak | GaAs substrate mode | 268cm⁻¹ | — | |||
| Calculated Phonon Mode | bulk Raman-active mode | Eg | — | |||
| Phase Symmetry | monolayer symmetry | P-3m1 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | film thickness | 40nm | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0002) | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0004) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (111) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (222) | — | |||
| Elemental Composition | Mn | 4.71at.% | — | |||
| Elemental Composition | Te | 4.58at.% | — | |||
| Raman Peak | Eg | 121cm⁻¹ | — | |||
| Raman Peak | A1g | 140cm⁻¹ | — | |||
| Raman Peak | GaAs substrate mode | 268cm⁻¹ | — | |||
| Calculated Phonon Mode | bulk Raman-active mode | Eg | — | |||
| Phase Symmetry | monolayer symmetry | P-3m1 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | film thickness | 40nm | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0002) | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0004) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (111) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (222) | — | |||
| Elemental Composition | Mn | 4.71at.% | — | |||
| Elemental Composition | Te | 4.58at.% | — | |||
| Raman Peak | Eg | 121cm⁻¹ | — | |||
| Raman Peak | A1g | 140cm⁻¹ | — | |||
| Raman Peak | GaAs substrate mode | 268cm⁻¹ | — | |||
| Calculated Phonon Mode | bulk Raman-active mode | Eg | — | |||
| Phase Symmetry | monolayer symmetry | P-3m1 | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Film Thickness | film thickness | 40nm | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0002) | — | |||
| Xrd Peak Pattern | MnTe film reflection | (0004) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (111) | — | |||
| Xrd Peak Pattern | GaAs substrate reflection | (222) | — | |||
| Elemental Composition | Mn | 4.71at.% | — | |||
| Elemental Composition | Te | 4.58at.% | — | |||
| Raman Peak | Eg | 121cm⁻¹ | — | |||
| Raman Peak | A1g | 140cm⁻¹ | — | |||
| Raman Peak | GaAs substrate mode | 268cm⁻¹ | — | |||
| Calculated Phonon Mode | bulk Raman-active mode | Eg | — | |||
| Phase Symmetry | monolayer symmetry | P-3m1 | — |