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Characterization · Analysis · Process optimization

Materials intelligence for labs and fabs

Matter42 turns Raman, PL, XRD, and AFM measurements into defect densities, uniformity maps, and film-quality metrics with the method and calibration status attached. Use it to characterize samples, qualify materials, or optimize a process, whichever side of the loop your team owns.

Read the docs
Works withRamanPLXRDAFMIRXPS
Growth methodsMOCVDMBECVDALDPVD

Sample workspace

WS2 Raman map

1,077 pixels parsed
spatial map · E2g FWHMx=-7.1, y=4.8 um
Explore
Cluster
Estimate
E2g linewidthanalysis tool

Defect density map ready

885 valid Raman pixels · mean FWHM 7.6 cm⁻¹

Suggested next step

Compare defect type classification against the clean interior mask before making process conclusions.

Platform

One home for your materials intelligence

Measurements, growth records, literature, and simulation in a shared workspace, so what your team knows about a material lives with the project instead of scattered across notebooks, one-off scripts, and institutional memory.

01

Bring in any measurement

Raman, PL, microscopy, tabular data, and literature land in one project workspace, straight from the instrument or the fab floor.

Multimodal intake

02

Ask scientific questions

The agent keeps project context, cites files, and calls domain tools instead of leaving analysis in a generic chat.

Context preserved

03

Map defect populations

Explore spectra, cluster regions, estimate defect density, and classify likely defect families.

Spatial maps

04

Connect to process knobs

Use simulation and structured outputs to reason from growth conditions to measurable material quality.

Process signal

Products

Three ways into the materials intelligence loop

Analyze measured samples with Atlas, model growth with Apollo, and interrogate the structured research record with Literature.

View all products
01

Structured paper database

Literature

Search materials, recipes, measurements, figures, claims, and citations as structured scientific evidence.

papersrecipescitations
Try the public demo
02

Characterization + analysis

Atlas

Turn Raman, PL, XRD, AFM, and microscopy into reviewable maps, metrics, and material-quality decisions.

measurementsanalysisevidence
Explore Atlas
03

Growth + simulation

Apollo

Connect growth conditions to nucleation, defects, uniformity, and process windows across simulation scales.

growthkineticsprocess
Explore Apollo

Agent analysis

Intelligence that shows its work

Every result comes back as an interactive figure with the numbers behind it: which pixels were used, which were masked, and whether the estimate sits inside calibration. These are real outputs from measured samples, not illustrations.

AFM surface roughness

Loading Plotly figure...

A calibrated Bruker scan is plane- and line-leveled into a topography map with ISO-style roughness metrics. Raw heights are stored untouched.

Roughness report

Sa 5.0 nm, Sq 6.8 nm over a 1 um scan after plane and scan-line leveling. Right-tailed height distribution (skewness 1.02) from grown islands, 262,144 valid pixels.

MetricValueStatus
Sa (mean abs)5.0 nmleveled
Sq (RMS)6.8 nmleveled
Skewness1.02right-tailed
Excess kurtosis1.42peaked

Workflow

From raw data to intelligence in three steps

Every project moves through the same loop, so results stay comparable across samples, runs, and team members, and every decision traces back to the measurement behind it.

01

Collect

Create a project and upload the raw files that define a sample, experiment, or growth run.

Raman map · PL file · paper

02

Analyze

Let the agent parse data, inspect maps, run defect tools, and return figures with structured outputs.

parse · cluster · estimate

03

Decide

Compare regions, document caveats, and turn analysis into a decision: a qualification report, a spec check, or the next process run.

compare · cite · decide

See the full workflow

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis so the connection from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, embedded behind your instruments, or delivered alongside our scientists as a service.

Read the materials characterization story

Team

Built by people who have run the experiments

Decades of combined experience in materials physics, multiscale simulation, and large-scale science programs, applied to turning raw characterization data into intelligence teams can act on.

Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

JL

Jonathan Leonard

Semiconductor Equipment Engineer

Meet the full team

Supported by

Backed by a community of builders, researchers, and company creators.

South Park Commons

Request a walkthrough

See materials intelligence on your data

Bring a Raman map, PL scan, or process question. We'll show how the agent analyzes it, what the outputs look like, and how it fits your workflow, as a platform, an integration, or an engagement with our team.

Explore docs
Matter42

Automated analysis and decision support for thin film and 2D semiconductor characterization.

ProductsTeamCareersDocsBlog
LinkedInPrivacy PolicyTerms and Conditions

Copyright © 2026 Matter42. All rights reserved.

Matter42
ProductsTeamCareersDocsBlog
Sign in
ProductsTeamCareersDocsBlog
Sign in

Characterization · Analysis · Process optimization

Materials intelligence for labs and fabs

Matter42 turns Raman, PL, XRD, and AFM measurements into defect densities, uniformity maps, and film-quality metrics with the method and calibration status attached. Use it to characterize samples, qualify materials, or optimize a process, whichever side of the loop your team owns.

Read the docs
Works withRamanPLXRDAFMIRXPS
Growth methodsMOCVDMBECVDALDPVD

Sample workspace

WS2 Raman map

1,077 pixels parsed
spatial map · E2g FWHMx=-7.1, y=4.8 um
Explore
Cluster
Estimate
E2g linewidthanalysis tool

Defect density map ready

885 valid Raman pixels · mean FWHM 7.6 cm⁻¹

Suggested next step

Compare defect type classification against the clean interior mask before making process conclusions.

Platform

One home for your materials intelligence

Measurements, growth records, literature, and simulation in a shared workspace, so what your team knows about a material lives with the project instead of scattered across notebooks, one-off scripts, and institutional memory.

01

Bring in any measurement

Raman, PL, microscopy, tabular data, and literature land in one project workspace, straight from the instrument or the fab floor.

Multimodal intake

02

Ask scientific questions

The agent keeps project context, cites files, and calls domain tools instead of leaving analysis in a generic chat.

Context preserved

03

Map defect populations

Explore spectra, cluster regions, estimate defect density, and classify likely defect families.

Spatial maps

04

Connect to process knobs

Use simulation and structured outputs to reason from growth conditions to measurable material quality.

Process signal

Products

Three ways into the materials intelligence loop

Analyze measured samples with Atlas, model growth with Apollo, and interrogate the structured research record with Literature.

View all products
01

Structured paper database

Literature

Search materials, recipes, measurements, figures, claims, and citations as structured scientific evidence.

papersrecipescitations
Try the public demo
02

Characterization + analysis

Atlas

Turn Raman, PL, XRD, AFM, and microscopy into reviewable maps, metrics, and material-quality decisions.

measurementsanalysisevidence
Explore Atlas
03

Growth + simulation

Apollo

Connect growth conditions to nucleation, defects, uniformity, and process windows across simulation scales.

growthkineticsprocess
Explore Apollo

Agent analysis

Intelligence that shows its work

Every result comes back as an interactive figure with the numbers behind it: which pixels were used, which were masked, and whether the estimate sits inside calibration. These are real outputs from measured samples, not illustrations.

AFM surface roughness

Loading Plotly figure...

A calibrated Bruker scan is plane- and line-leveled into a topography map with ISO-style roughness metrics. Raw heights are stored untouched.

Roughness report

Sa 5.0 nm, Sq 6.8 nm over a 1 um scan after plane and scan-line leveling. Right-tailed height distribution (skewness 1.02) from grown islands, 262,144 valid pixels.

MetricValueStatus
Sa (mean abs)5.0 nmleveled
Sq (RMS)6.8 nmleveled
Skewness1.02right-tailed
Excess kurtosis1.42peaked

Workflow

From raw data to intelligence in three steps

Every project moves through the same loop, so results stay comparable across samples, runs, and team members, and every decision traces back to the measurement behind it.

01

Collect

Create a project and upload the raw files that define a sample, experiment, or growth run.

Raman map · PL file · paper

02

Analyze

Let the agent parse data, inspect maps, run defect tools, and return figures with structured outputs.

parse · cluster · estimate

03

Decide

Compare regions, document caveats, and turn analysis into a decision: a qualification report, a spec check, or the next process run.

compare · cite · decide

See the full workflow

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis so the connection from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, embedded behind your instruments, or delivered alongside our scientists as a service.

Read the materials characterization story

Team

Built by people who have run the experiments

Decades of combined experience in materials physics, multiscale simulation, and large-scale science programs, applied to turning raw characterization data into intelligence teams can act on.

Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

JL

Jonathan Leonard

Semiconductor Equipment Engineer

Meet the full team

Supported by

Backed by a community of builders, researchers, and company creators.

South Park Commons

Request a walkthrough

See materials intelligence on your data

Bring a Raman map, PL scan, or process question. We'll show how the agent analyzes it, what the outputs look like, and how it fits your workflow, as a platform, an integration, or an engagement with our team.

Explore docs
Matter42

Automated analysis and decision support for thin film and 2D semiconductor characterization.

ProductsTeamCareersDocsBlog
LinkedInPrivacy PolicyTerms and Conditions

Copyright © 2026 Matter42. All rights reserved.

Matter42
ProductsTeamCareersDocsBlog
Sign in
ProductsTeamCareersDocsBlog
Sign in

Characterization · Analysis · Process optimization

Materials intelligence for labs and fabs

Matter42 turns Raman, PL, XRD, and AFM measurements into defect densities, uniformity maps, and film-quality metrics with the method and calibration status attached. Use it to characterize samples, qualify materials, or optimize a process, whichever side of the loop your team owns.

Read the docs
Works withRamanPLXRDAFMIRXPS
Growth methodsMOCVDMBECVDALDPVD

Sample workspace

WS2 Raman map

1,077 pixels parsed
spatial map · E2g FWHMx=-7.1, y=4.8 um
Explore
Cluster
Estimate
E2g linewidthanalysis tool

Defect density map ready

885 valid Raman pixels · mean FWHM 7.6 cm⁻¹

Suggested next step

Compare defect type classification against the clean interior mask before making process conclusions.

Platform

One home for your materials intelligence

Measurements, growth records, literature, and simulation in a shared workspace, so what your team knows about a material lives with the project instead of scattered across notebooks, one-off scripts, and institutional memory.

01

Bring in any measurement

Raman, PL, microscopy, tabular data, and literature land in one project workspace, straight from the instrument or the fab floor.

Multimodal intake

02

Ask scientific questions

The agent keeps project context, cites files, and calls domain tools instead of leaving analysis in a generic chat.

Context preserved

03

Map defect populations

Explore spectra, cluster regions, estimate defect density, and classify likely defect families.

Spatial maps

04

Connect to process knobs

Use simulation and structured outputs to reason from growth conditions to measurable material quality.

Process signal

Products

Three ways into the materials intelligence loop

Analyze measured samples with Atlas, model growth with Apollo, and interrogate the structured research record with Literature.

View all products
01

Structured paper database

Literature

Search materials, recipes, measurements, figures, claims, and citations as structured scientific evidence.

papersrecipescitations
Try the public demo
02

Characterization + analysis

Atlas

Turn Raman, PL, XRD, AFM, and microscopy into reviewable maps, metrics, and material-quality decisions.

measurementsanalysisevidence
Explore Atlas
03

Growth + simulation

Apollo

Connect growth conditions to nucleation, defects, uniformity, and process windows across simulation scales.

growthkineticsprocess
Explore Apollo

Agent analysis

Intelligence that shows its work

Every result comes back as an interactive figure with the numbers behind it: which pixels were used, which were masked, and whether the estimate sits inside calibration. These are real outputs from measured samples, not illustrations.

AFM surface roughness

Loading Plotly figure...

A calibrated Bruker scan is plane- and line-leveled into a topography map with ISO-style roughness metrics. Raw heights are stored untouched.

Roughness report

Sa 5.0 nm, Sq 6.8 nm over a 1 um scan after plane and scan-line leveling. Right-tailed height distribution (skewness 1.02) from grown islands, 262,144 valid pixels.

MetricValueStatus
Sa (mean abs)5.0 nmleveled
Sq (RMS)6.8 nmleveled
Skewness1.02right-tailed
Excess kurtosis1.42peaked

Workflow

From raw data to intelligence in three steps

Every project moves through the same loop, so results stay comparable across samples, runs, and team members, and every decision traces back to the measurement behind it.

01

Collect

Create a project and upload the raw files that define a sample, experiment, or growth run.

Raman map · PL file · paper

02

Analyze

Let the agent parse data, inspect maps, run defect tools, and return figures with structured outputs.

parse · cluster · estimate

03

Decide

Compare regions, document caveats, and turn analysis into a decision: a qualification report, a spec check, or the next process run.

compare · cite · decide

See the full workflow

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis so the connection from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, embedded behind your instruments, or delivered alongside our scientists as a service.

Read the materials characterization story

Team

Built by people who have run the experiments

Decades of combined experience in materials physics, multiscale simulation, and large-scale science programs, applied to turning raw characterization data into intelligence teams can act on.

Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

JL

Jonathan Leonard

Semiconductor Equipment Engineer

Meet the full team

Supported by

Backed by a community of builders, researchers, and company creators.

South Park Commons

Request a walkthrough

See materials intelligence on your data

Bring a Raman map, PL scan, or process question. We'll show how the agent analyzes it, what the outputs look like, and how it fits your workflow, as a platform, an integration, or an engagement with our team.

Explore docs
Matter42

Automated analysis and decision support for thin film and 2D semiconductor characterization.

ProductsTeamCareersDocsBlog
LinkedInPrivacy PolicyTerms and Conditions

Copyright © 2026 Matter42. All rights reserved.

Matter42
ProductsTeamCareersDocsBlog
Sign in
ProductsTeamCareersDocsBlog
Sign in

Characterization · Analysis · Process optimization

Materials intelligence for labs and fabs

Matter42 turns Raman, PL, XRD, and AFM measurements into defect densities, uniformity maps, and film-quality metrics with the method and calibration status attached. Use it to characterize samples, qualify materials, or optimize a process, whichever side of the loop your team owns.

Read the docs
Works withRamanPLXRDAFMIRXPS
Growth methodsMOCVDMBECVDALDPVD

Sample workspace

WS2 Raman map

1,077 pixels parsed
spatial map · E2g FWHMx=-7.1, y=4.8 um
Explore
Cluster
Estimate
E2g linewidthanalysis tool

Defect density map ready

885 valid Raman pixels · mean FWHM 7.6 cm⁻¹

Suggested next step

Compare defect type classification against the clean interior mask before making process conclusions.

Platform

One home for your materials intelligence

Measurements, growth records, literature, and simulation in a shared workspace, so what your team knows about a material lives with the project instead of scattered across notebooks, one-off scripts, and institutional memory.

01

Bring in any measurement

Raman, PL, microscopy, tabular data, and literature land in one project workspace, straight from the instrument or the fab floor.

Multimodal intake

02

Ask scientific questions

The agent keeps project context, cites files, and calls domain tools instead of leaving analysis in a generic chat.

Context preserved

03

Map defect populations

Explore spectra, cluster regions, estimate defect density, and classify likely defect families.

Spatial maps

04

Connect to process knobs

Use simulation and structured outputs to reason from growth conditions to measurable material quality.

Process signal

Products

Three ways into the materials intelligence loop

Analyze measured samples with Atlas, model growth with Apollo, and interrogate the structured research record with Literature.

View all products
01

Structured paper database

Literature

Search materials, recipes, measurements, figures, claims, and citations as structured scientific evidence.

papersrecipescitations
Try the public demo
02

Characterization + analysis

Atlas

Turn Raman, PL, XRD, AFM, and microscopy into reviewable maps, metrics, and material-quality decisions.

measurementsanalysisevidence
Explore Atlas
03

Growth + simulation

Apollo

Connect growth conditions to nucleation, defects, uniformity, and process windows across simulation scales.

growthkineticsprocess
Explore Apollo

Agent analysis

Intelligence that shows its work

Every result comes back as an interactive figure with the numbers behind it: which pixels were used, which were masked, and whether the estimate sits inside calibration. These are real outputs from measured samples, not illustrations.

AFM surface roughness

Loading Plotly figure...

A calibrated Bruker scan is plane- and line-leveled into a topography map with ISO-style roughness metrics. Raw heights are stored untouched.

Roughness report

Sa 5.0 nm, Sq 6.8 nm over a 1 um scan after plane and scan-line leveling. Right-tailed height distribution (skewness 1.02) from grown islands, 262,144 valid pixels.

MetricValueStatus
Sa (mean abs)5.0 nmleveled
Sq (RMS)6.8 nmleveled
Skewness1.02right-tailed
Excess kurtosis1.42peaked

Workflow

From raw data to intelligence in three steps

Every project moves through the same loop, so results stay comparable across samples, runs, and team members, and every decision traces back to the measurement behind it.

01

Collect

Create a project and upload the raw files that define a sample, experiment, or growth run.

Raman map · PL file · paper

02

Analyze

Let the agent parse data, inspect maps, run defect tools, and return figures with structured outputs.

parse · cluster · estimate

03

Decide

Compare regions, document caveats, and turn analysis into a decision: a qualification report, a spec check, or the next process run.

compare · cite · decide

See the full workflow

Why we're building this

Every lab and every fab should have materials intelligence on tap.

Today that expertise lives in a handful of people, one-off scripts, and institutional memory. Matter42 combines calibrated physics-based models with multimodal analysis so the connection from measurement to decision is explicit, repeatable, and reviewable, whether it runs as your team's workspace, embedded behind your instruments, or delivered alongside our scientists as a service.

Read the materials characterization story

Team

Built by people who have run the experiments

Decades of combined experience in materials physics, multiscale simulation, and large-scale science programs, applied to turning raw characterization data into intelligence teams can act on.

Matthias Kling, PhD

Matthias Kling, PhD

Co-Founder

Thomas Linker, PhD

Thomas Linker, PhD

Co-Founder

Kamila Stepniowska

Kamila Stepniowska

Founding Team Member

Kalai Ramea, PhD

Kalai Ramea, PhD

Chief AI Officer

Michael Curtis, PhD

Michael Curtis, PhD

Materials Scientist

Srikar Jandhyala, PhD

Srikar Jandhyala, PhD

VP of Product

Bala Radhakrishnan, PhD

Bala Radhakrishnan, PhD

Head of Process Intelligence

Ali Al Kadhim, PhD

Ali Al Kadhim, PhD

Research Engineer

Matt Moderwell

Matt Moderwell

Founding Engineer

Kirtana Romfh

Kirtana Romfh

Multiscale Simulation Engineer

JL

Jonathan Leonard

Semiconductor Equipment Engineer

Meet the full team

Supported by

Backed by a community of builders, researchers, and company creators.

South Park Commons

Request a walkthrough

See materials intelligence on your data

Bring a Raman map, PL scan, or process question. We'll show how the agent analyzes it, what the outputs look like, and how it fits your workflow, as a platform, an integration, or an engagement with our team.

Explore docs
Matter42

Automated analysis and decision support for thin film and 2D semiconductor characterization.

ProductsTeamCareersDocsBlog
LinkedInPrivacy PolicyTerms and Conditions

Copyright © 2026 Matter42. All rights reserved.