Research paperExperimental CharacterizationSurface Hydrogen Coverage on Pt/Graphene Measured by Carbon Ion ERDAChien-Hsu Chen, Huan Niu, Hung-Kai Yu, Tsung Te Lin et al.2025·arXiv:2512.23261AbstractThis study experimentally investigates hydrogen adsorption on Pt-decorated graphene using Elastic Recoil Detection Analysis (ERDA). A 4.1 MeV C₂+ ion beam and a PIPS detector were used to quantify hydrogen depth profiles in graphene/SiO₂/Si samples. The work compares bare graphene, Pt-decorated graphene, and a pristine silicon reference under hydrogen exposure, finding negligible uptake on bare graphene and substantial uptake on Pt-decorated graphene, consistent with a spillover-assisted adsorption mechanism.Read more
Bare monolayer graphene on 90 nm SiO₂/Si substrate, measured before and after carbon-ion irradiation and hydrogen exposure.1 preparation1 characterization1 property4 figuresExperimentalCStudied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pt-decorated monolayer graphene on 90 nm SiO₂/Si substrate, measured after hydrogen exposure cycles.1 preparation1 characterization2 properties4 figuresExperimentalCStudied MaterialPtCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pristine (001) n-type silicon wafer used as a hydrogen reference.1 propertySiSubstrate / DielectricExpand
Research paperExperimental CharacterizationSurface Hydrogen Coverage on Pt/Graphene Measured by Carbon Ion ERDAChien-Hsu Chen, Huan Niu, Hung-Kai Yu, Tsung Te Lin et al.2025·arXiv:2512.23261AbstractThis study experimentally investigates hydrogen adsorption on Pt-decorated graphene using Elastic Recoil Detection Analysis (ERDA). A 4.1 MeV C₂+ ion beam and a PIPS detector were used to quantify hydrogen depth profiles in graphene/SiO₂/Si samples. The work compares bare graphene, Pt-decorated graphene, and a pristine silicon reference under hydrogen exposure, finding negligible uptake on bare graphene and substantial uptake on Pt-decorated graphene, consistent with a spillover-assisted adsorption mechanism.Read more
Bare monolayer graphene on 90 nm SiO₂/Si substrate, measured before and after carbon-ion irradiation and hydrogen exposure.1 preparation1 characterization1 property4 figuresExperimentalCStudied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pt-decorated monolayer graphene on 90 nm SiO₂/Si substrate, measured after hydrogen exposure cycles.1 preparation1 characterization2 properties4 figuresExperimentalCStudied MaterialPtCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pristine (001) n-type silicon wafer used as a hydrogen reference.1 propertySiSubstrate / DielectricExpand
Research paperExperimental CharacterizationSurface Hydrogen Coverage on Pt/Graphene Measured by Carbon Ion ERDAChien-Hsu Chen, Huan Niu, Hung-Kai Yu, Tsung Te Lin et al.2025·arXiv:2512.23261AbstractThis study experimentally investigates hydrogen adsorption on Pt-decorated graphene using Elastic Recoil Detection Analysis (ERDA). A 4.1 MeV C₂+ ion beam and a PIPS detector were used to quantify hydrogen depth profiles in graphene/SiO₂/Si samples. The work compares bare graphene, Pt-decorated graphene, and a pristine silicon reference under hydrogen exposure, finding negligible uptake on bare graphene and substantial uptake on Pt-decorated graphene, consistent with a spillover-assisted adsorption mechanism.Read more
Bare monolayer graphene on 90 nm SiO₂/Si substrate, measured before and after carbon-ion irradiation and hydrogen exposure.1 preparation1 characterization1 property4 figuresExperimentalCStudied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pt-decorated monolayer graphene on 90 nm SiO₂/Si substrate, measured after hydrogen exposure cycles.1 preparation1 characterization2 properties4 figuresExperimentalCStudied MaterialPtCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pristine (001) n-type silicon wafer used as a hydrogen reference.1 propertySiSubstrate / DielectricExpand
Research paperExperimental CharacterizationSurface Hydrogen Coverage on Pt/Graphene Measured by Carbon Ion ERDAChien-Hsu Chen, Huan Niu, Hung-Kai Yu, Tsung Te Lin et al.2025·arXiv:2512.23261AbstractThis study experimentally investigates hydrogen adsorption on Pt-decorated graphene using Elastic Recoil Detection Analysis (ERDA). A 4.1 MeV C₂+ ion beam and a PIPS detector were used to quantify hydrogen depth profiles in graphene/SiO₂/Si samples. The work compares bare graphene, Pt-decorated graphene, and a pristine silicon reference under hydrogen exposure, finding negligible uptake on bare graphene and substantial uptake on Pt-decorated graphene, consistent with a spillover-assisted adsorption mechanism.Read more
Bare monolayer graphene on 90 nm SiO₂/Si substrate, measured before and after carbon-ion irradiation and hydrogen exposure.1 preparation1 characterization1 property4 figuresExperimentalCStudied MaterialSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pt-decorated monolayer graphene on 90 nm SiO₂/Si substrate, measured after hydrogen exposure cycles.1 preparation1 characterization2 properties4 figuresExperimentalCStudied MaterialPtCapping Or ContactSiO₂Substrate / DielectricSiSubstrate / DielectricExpand
Pristine (001) n-type silicon wafer used as a hydrogen reference.1 propertySiSubstrate / DielectricExpand
