Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Tom Kretzschmar; Sebastian Ritter; Anand Kumar; Tobias Vogl; Falk Eilenberger; Falko Schmidt

doi:10.1021/acsaom.4c00200

Paper

Atlas literature

Research paper

Experimental Characterization

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Tom Kretzschmar, Sebastian Ritter, Anand Kumar, Tobias Vogl et al.

arXiv·2024·10.1021/acsaom.4c00200·arXiv:2402.18199

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

4 preparations3 characterizations2 figures

ExperimentalhBNStudied Material

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

4 preparations3 characterizations2 figures

ExperimentalhBNStudied Material

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

4 preparations3 characterizations2 figures

ExperimentalhBNStudied Material

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes | Matter42 Literature

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

Quantitative investigation of quantum emitter yield in drop-casted hexagonal boron nitride nanoflakes

Samples

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the acetone condition.

Drop-casted hBN nanoflakes from Merck (Sigma-Aldrich) deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening in the water+surfactant condition.

Drop-casted hBN nanoflakes from Graphene Supermarket deposited on a SiO₂ wafer and annealed after drying; sample set used for optical/SPE screening.

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