Research paper
Experimental CharacterizationComputational DFT| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Afm Roughness | surface roughness | 4.3nm | — | |||
| Afm Thickness | WS₂ thickness range | 5.5-12nm | — | |||
| Raman Peak | E2g1 | 357cm⁻¹ | — | |||
| Raman Peak | Ag₁ | 423cm⁻¹ | — | |||
| Transport Resistance | SLG film resistance | 2200ohm | — | |||
| Transport Resistance | SLG/WS₂ heterostructure resistance | 248ohm | — | |||
| Spin To Charge Conversion Efficiency | IREE efficiency | enhanced | — | |||
| Xps Binding Energy | S 2p3/2 | 162.6eV | — | |||
| Xps Spin Orbit Splitting | S 2p3/2 | 1.1eV | — | |||
| Xps Binding Energy | S 2p1/2 | 163.7eV | — | |||
| Xps Spin Orbit Splitting | S 2p1/2 | 1.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 32.6eV | — | |||
| Xps Spin Orbit Splitting | W 4f7/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.7eV | — | |||
| Xps Spin Orbit Splitting | W 4f5/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 35.8eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Afm Roughness | surface roughness | 4.3nm | — | |||
| Afm Thickness | WS₂ thickness range | 5.5-12nm | — | |||
| Raman Peak | E2g1 | 357cm⁻¹ | — | |||
| Raman Peak | Ag₁ | 423cm⁻¹ | — | |||
| Transport Resistance | SLG film resistance | 2200ohm | — | |||
| Transport Resistance | SLG/WS₂ heterostructure resistance | 248ohm | — | |||
| Spin To Charge Conversion Efficiency | IREE efficiency | enhanced | — | |||
| Xps Binding Energy | S 2p3/2 | 162.6eV | — | |||
| Xps Spin Orbit Splitting | S 2p3/2 | 1.1eV | — | |||
| Xps Binding Energy | S 2p1/2 | 163.7eV | — | |||
| Xps Spin Orbit Splitting | S 2p1/2 | 1.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 32.6eV | — | |||
| Xps Spin Orbit Splitting | W 4f7/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.7eV | — | |||
| Xps Spin Orbit Splitting | W 4f5/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 35.8eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Afm Roughness | surface roughness | 4.3nm | — | |||
| Afm Thickness | WS₂ thickness range | 5.5-12nm | — | |||
| Raman Peak | E2g1 | 357cm⁻¹ | — | |||
| Raman Peak | Ag₁ | 423cm⁻¹ | — | |||
| Transport Resistance | SLG film resistance | 2200ohm | — | |||
| Transport Resistance | SLG/WS₂ heterostructure resistance | 248ohm | — | |||
| Spin To Charge Conversion Efficiency | IREE efficiency | enhanced | — | |||
| Xps Binding Energy | S 2p3/2 | 162.6eV | — | |||
| Xps Spin Orbit Splitting | S 2p3/2 | 1.1eV | — | |||
| Xps Binding Energy | S 2p1/2 | 163.7eV | — | |||
| Xps Spin Orbit Splitting | S 2p1/2 | 1.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 32.6eV | — | |||
| Xps Spin Orbit Splitting | W 4f7/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.7eV | — | |||
| Xps Spin Orbit Splitting | W 4f5/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 35.8eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Afm Roughness | surface roughness | 4.3nm | — | |||
| Afm Thickness | WS₂ thickness range | 5.5-12nm | — | |||
| Raman Peak | E2g1 | 357cm⁻¹ | — | |||
| Raman Peak | Ag₁ | 423cm⁻¹ | — | |||
| Transport Resistance | SLG film resistance | 2200ohm | — | |||
| Transport Resistance | SLG/WS₂ heterostructure resistance | 248ohm | — | |||
| Spin To Charge Conversion Efficiency | IREE efficiency | enhanced | — | |||
| Xps Binding Energy | S 2p3/2 | 162.6eV | — | |||
| Xps Spin Orbit Splitting | S 2p3/2 | 1.1eV | — | |||
| Xps Binding Energy | S 2p1/2 | 163.7eV | — | |||
| Xps Spin Orbit Splitting | S 2p1/2 | 1.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 32.6eV | — | |||
| Xps Spin Orbit Splitting | W 4f7/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f5/2 | 34.7eV | — | |||
| Xps Spin Orbit Splitting | W 4f5/2 | 2.1eV | — | |||
| Xps Binding Energy | W 4f7/2 | 35.8eV | — |