Integrated Mode-Hop-Free Tunable Lasers at 780 nm for Chip-Scale Classical and Quantum Photonic Applications

Paper

Atlas literature

Research paper

Experimental Characterization

Joshua E. Castro, Eber Nolasco-Martinez, Paolo Pintus, Zeyu Zhang et al.

Applied Optics·2024·10.1364/ao.XX.XXXXXX·arXiv:2407.15438

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

3 characterizations13 properties1 figure

ExperimentalGaAsStudied MaterialSi₃N₄Studied MaterialSiO₂Substrate / DielectricSiSubstrate / Dielectric

1 characterization1 property1 figure

ExperimentalSi₃N₄Studied MaterialSiO₂Substrate / DielectricSiSubstrate / Dielectric

1 characterization2 properties1 figure

Experimental87RbStudied Material

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Integrated Mode-Hop-Free Tunable Lasers at 780 nm for Chip-Scale Classical and Quantum Photonic Applications | Matter42 Literature