Research paperExperimental CharacterizationTheoreticalAxionic tunneling from a topological Kondo insulatorSaikat Banerjee, Anuva Aishwarya, Fei Liu, Lin Jiao et al.arXiv·2025·arXiv:2512.05057AbstractWe report a direct signature of axionic physics obtained through scanning tunneling microscopy (STM). Using an SmB₆ nanowire tip and magnetic Fe₁+xTe substrate, we show that the observed voltage-reversed spin contrast originates from axionic electrodynamics rather than static magnetism or spin-polarized currents from topological surface states. Small voltages on the order of tens of meV generate tip moments of order 0.1 μB that reverse with applied bias, consistent with a voltage-induced magnetization on the SmB₆ surface.Read more
SmB₆ nanowire tip used in STM tunneling measurements and interpreted as exhibiting voltage-induced magnetization.1 characterization5 properties3 figuresExperimentalSmB₆Studied MaterialExpand
Antiferromagnetic Fe₁+xTe substrate used as the tunneling target for magnetic contrast measurements.1 characterization3 figuresExperimentalFe₁+xTeStudied MaterialExpand
Conventional chromium magnetic tip used as a reference for normalized spin-contrast comparison.1 characterization3 figuresReferenceCrCapping Or ContactExpand
Research paperExperimental CharacterizationTheoreticalAxionic tunneling from a topological Kondo insulatorSaikat Banerjee, Anuva Aishwarya, Fei Liu, Lin Jiao et al.arXiv·2025·arXiv:2512.05057AbstractWe report a direct signature of axionic physics obtained through scanning tunneling microscopy (STM). Using an SmB₆ nanowire tip and magnetic Fe₁+xTe substrate, we show that the observed voltage-reversed spin contrast originates from axionic electrodynamics rather than static magnetism or spin-polarized currents from topological surface states. Small voltages on the order of tens of meV generate tip moments of order 0.1 μB that reverse with applied bias, consistent with a voltage-induced magnetization on the SmB₆ surface.Read more
SmB₆ nanowire tip used in STM tunneling measurements and interpreted as exhibiting voltage-induced magnetization.1 characterization5 properties3 figuresExperimentalSmB₆Studied MaterialExpand
Antiferromagnetic Fe₁+xTe substrate used as the tunneling target for magnetic contrast measurements.1 characterization3 figuresExperimentalFe₁+xTeStudied MaterialExpand
Conventional chromium magnetic tip used as a reference for normalized spin-contrast comparison.1 characterization3 figuresReferenceCrCapping Or ContactExpand
Research paperExperimental CharacterizationTheoreticalAxionic tunneling from a topological Kondo insulatorSaikat Banerjee, Anuva Aishwarya, Fei Liu, Lin Jiao et al.arXiv·2025·arXiv:2512.05057AbstractWe report a direct signature of axionic physics obtained through scanning tunneling microscopy (STM). Using an SmB₆ nanowire tip and magnetic Fe₁+xTe substrate, we show that the observed voltage-reversed spin contrast originates from axionic electrodynamics rather than static magnetism or spin-polarized currents from topological surface states. Small voltages on the order of tens of meV generate tip moments of order 0.1 μB that reverse with applied bias, consistent with a voltage-induced magnetization on the SmB₆ surface.Read more
SmB₆ nanowire tip used in STM tunneling measurements and interpreted as exhibiting voltage-induced magnetization.1 characterization5 properties3 figuresExperimentalSmB₆Studied MaterialExpand
Antiferromagnetic Fe₁+xTe substrate used as the tunneling target for magnetic contrast measurements.1 characterization3 figuresExperimentalFe₁+xTeStudied MaterialExpand
Conventional chromium magnetic tip used as a reference for normalized spin-contrast comparison.1 characterization3 figuresReferenceCrCapping Or ContactExpand
Research paperExperimental CharacterizationTheoreticalAxionic tunneling from a topological Kondo insulatorSaikat Banerjee, Anuva Aishwarya, Fei Liu, Lin Jiao et al.arXiv·2025·arXiv:2512.05057AbstractWe report a direct signature of axionic physics obtained through scanning tunneling microscopy (STM). Using an SmB₆ nanowire tip and magnetic Fe₁+xTe substrate, we show that the observed voltage-reversed spin contrast originates from axionic electrodynamics rather than static magnetism or spin-polarized currents from topological surface states. Small voltages on the order of tens of meV generate tip moments of order 0.1 μB that reverse with applied bias, consistent with a voltage-induced magnetization on the SmB₆ surface.Read more
SmB₆ nanowire tip used in STM tunneling measurements and interpreted as exhibiting voltage-induced magnetization.1 characterization5 properties3 figuresExperimentalSmB₆Studied MaterialExpand
Antiferromagnetic Fe₁+xTe substrate used as the tunneling target for magnetic contrast measurements.1 characterization3 figuresExperimentalFe₁+xTeStudied MaterialExpand
Conventional chromium magnetic tip used as a reference for normalized spin-contrast comparison.1 characterization3 figuresReferenceCrCapping Or ContactExpand
