Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Width | graphene width | 3um | — | |||
| Device Length | graphene length along CPW | 33um | — | |||
| Device Width | graphene width | 20um | — | |||
| Device Length | graphene length along CPW | 3um | — | |||
| Substrate Thickness | hBN thickness | 78nm | — | |||
| Substrate Thickness | hBN thickness | 84nm | — | |||
| Substrate Thickness | SiO₂ thickness | 285nm | — | |||
| Device Width | CPW center-line width | 1um | — | |||
| Device Width | CPW center-line width | 33.3um | — | |||
| Sheet Resistance | room temperature resistance | 110ohm/sq | — | |||
| Sheet Resistance | room temperature resistance | 90ohm/sq | — | |||
| Magnetic Field | measurement magnetic field | 9T | — | |||
| Magnetic Field | measurement magnetic field | 18T | — | |||
| Temperature | measurement temperature | 300mK | — | |||
| Temperature | measurement temperature | 60mK | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 36mdB | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 14mdB | — | |||
| Microwave Sensitivity | sensitivity | -1244dB/S | — | |||
| Microwave Sensitivity | sensitivity | -179dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -434dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -217dB/S | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Width | graphene width | 3um | — | |||
| Device Length | graphene length along CPW | 33um | — | |||
| Device Width | graphene width | 20um | — | |||
| Device Length | graphene length along CPW | 3um | — | |||
| Substrate Thickness | hBN thickness | 78nm | — | |||
| Substrate Thickness | hBN thickness | 84nm | — | |||
| Substrate Thickness | SiO₂ thickness | 285nm | — | |||
| Device Width | CPW center-line width | 1um | — | |||
| Device Width | CPW center-line width | 33.3um | — | |||
| Sheet Resistance | room temperature resistance | 110ohm/sq | — | |||
| Sheet Resistance | room temperature resistance | 90ohm/sq | — | |||
| Magnetic Field | measurement magnetic field | 9T | — | |||
| Magnetic Field | measurement magnetic field | 18T | — | |||
| Temperature | measurement temperature | 300mK | — | |||
| Temperature | measurement temperature | 60mK | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 36mdB | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 14mdB | — | |||
| Microwave Sensitivity | sensitivity | -1244dB/S | — | |||
| Microwave Sensitivity | sensitivity | -179dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -434dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -217dB/S | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Width | graphene width | 3um | — | |||
| Device Length | graphene length along CPW | 33um | — | |||
| Device Width | graphene width | 20um | — | |||
| Device Length | graphene length along CPW | 3um | — | |||
| Substrate Thickness | hBN thickness | 78nm | — | |||
| Substrate Thickness | hBN thickness | 84nm | — | |||
| Substrate Thickness | SiO₂ thickness | 285nm | — | |||
| Device Width | CPW center-line width | 1um | — | |||
| Device Width | CPW center-line width | 33.3um | — | |||
| Sheet Resistance | room temperature resistance | 110ohm/sq | — | |||
| Sheet Resistance | room temperature resistance | 90ohm/sq | — | |||
| Magnetic Field | measurement magnetic field | 9T | — | |||
| Magnetic Field | measurement magnetic field | 18T | — | |||
| Temperature | measurement temperature | 300mK | — | |||
| Temperature | measurement temperature | 60mK | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 36mdB | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 14mdB | — | |||
| Microwave Sensitivity | sensitivity | -1244dB/S | — | |||
| Microwave Sensitivity | sensitivity | -179dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -434dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -217dB/S | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Width | graphene width | 3um | — | |||
| Device Length | graphene length along CPW | 33um | — | |||
| Device Width | graphene width | 20um | — | |||
| Device Length | graphene length along CPW | 3um | — | |||
| Substrate Thickness | hBN thickness | 78nm | — | |||
| Substrate Thickness | hBN thickness | 84nm | — | |||
| Substrate Thickness | SiO₂ thickness | 285nm | — | |||
| Device Width | CPW center-line width | 1um | — | |||
| Device Width | CPW center-line width | 33.3um | — | |||
| Sheet Resistance | room temperature resistance | 110ohm/sq | — | |||
| Sheet Resistance | room temperature resistance | 90ohm/sq | — | |||
| Magnetic Field | measurement magnetic field | 9T | — | |||
| Magnetic Field | measurement magnetic field | 18T | — | |||
| Temperature | measurement temperature | 300mK | — | |||
| Temperature | measurement temperature | 60mK | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 36mdB | — | |||
| Quantum Hall Plateau Drop | average transmitted-power drop per Landau level | 14mdB | — | |||
| Microwave Sensitivity | sensitivity | -1244dB/S | — | |||
| Microwave Sensitivity | sensitivity | -179dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -434dB/S | — | |||
| Microwave Sensitivity | simple-model predicted sensitivity | -217dB/S | — |