Research paper
Computational DFT| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Sw Defect Restoration Energy | restoration energy | 4.1eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.55eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 3.62eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.36eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.34eV | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.29angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.37angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.36angstrom | — | |||
| Sw Defect Width | WSW | 5.31angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Length | LSW | 6.8angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 7.06angstrom | — | |||
| Sw Defect Length | LSW | 7.05angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.01angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.48angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.07angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.4angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.04angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Sw Defect Activation Energy | activation energy | 9.9eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.65eV | — | |||
| Sw Defect Activation Energy | activation energy | 8.42eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.71eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.73eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.1eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.35eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.39eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Sw Defect Restoration Energy | restoration energy | 4.1eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.55eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 3.62eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.36eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.34eV | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.29angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.37angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.36angstrom | — | |||
| Sw Defect Width | WSW | 5.31angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Length | LSW | 6.8angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 7.06angstrom | — | |||
| Sw Defect Length | LSW | 7.05angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.01angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.48angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.07angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.4angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.04angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Sw Defect Activation Energy | activation energy | 9.9eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.65eV | — | |||
| Sw Defect Activation Energy | activation energy | 8.42eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.71eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.73eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.1eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.35eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.39eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Sw Defect Restoration Energy | restoration energy | 4.1eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.55eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 3.62eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.36eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.34eV | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.29angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.37angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.36angstrom | — | |||
| Sw Defect Width | WSW | 5.31angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Length | LSW | 6.8angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 7.06angstrom | — | |||
| Sw Defect Length | LSW | 7.05angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.01angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.48angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.07angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.4angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.04angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Sw Defect Activation Energy | activation energy | 9.9eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.65eV | — | |||
| Sw Defect Activation Energy | activation energy | 8.42eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.71eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.73eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.1eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.35eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.39eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Sw Defect Restoration Energy | restoration energy | 4.1eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.55eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 3.62eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.36eV | — | |||
| Sw Defect Restoration Energy | restoration energy | 2.34eV | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.29angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.4angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.37angstrom | — | |||
| Sw Defect Shortest Bond Length | dC-C | 1.36angstrom | — | |||
| Sw Defect Width | WSW | 5.31angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.18angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Width | WSW | 5.54angstrom | — | |||
| Sw Defect Length | LSW | 6.8angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 6.74angstrom | — | |||
| Sw Defect Length | LSW | 7.06angstrom | — | |||
| Sw Defect Length | LSW | 7.05angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.01angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.48angstrom | — | |||
| Sw Defect Ripple Height | RSW | 1.07angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.4angstrom | — | |||
| Sw Defect Ripple Height | RSW | 0.04angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.16angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Interface Distance | ds | 2.56angstrom | — | |||
| Sw Defect Activation Energy | activation energy | 9.9eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.65eV | — | |||
| Sw Defect Activation Energy | activation energy | 8.42eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.71eV | — | |||
| Sw Defect Activation Energy | activation energy | 7.73eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 5.1eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.8eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.35eV | — | |||
| Sw Defect Formation Energy | formation energy | 4.39eV | — |