Research paper
Experimental GrowthExperimental CharacterizationEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
1 preparation3 characterizations5 figures
1 preparation2 characterizations21 properties6 figures
1 preparation1 characterization2 properties1 figure
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Band Edge Position | MoS₂ conduction band minimum | 0.28eV | — | |||
| Density Of States Feature Width | WTe₂ density-of-states dip width | 60meV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.75eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.25eV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.58eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2.21eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.63eV | — | |||
| Band Shift | MoS₂ valence-band shift | 200meV | — | |||
| Band Shift | WTe₂ valence-band shift | 170meV | — | |||
| Band Shift | MoS₂ valence-band shift | 70meV | — | |||
| Band Shift | WTe₂ valence-band shift | 140meV | — | |||
| Core Level Position | W 4f7/2 | 31.8eV | — | |||
| Core Level Position | Te 4d5/2 | 40.6eV | — | |||
| Core Level Position | Te 4d5/2 | 41.8eV | — | |||
| Core Level Position | W-S component | 33.25eV | — | |||
| Xps Binding Energy Shift | W 4f | 80meV | — | |||
| Xps Binding Energy | W 4f7/2 | 31.8eV | — | |||
| Xps Binding Energy | Te 4d5/2 | 40.6eV | — | — | ||
| Xps Binding Energy | Te 4d | 41.8eV | — | — | ||
| Xps Binding Energy | W 4f | 33.25eV | — | |||
| Xps Vbm | — | 0.75eV | — | |||
| Xps Vbm | — | 2eV | — | |||
| Xps Vbm | — | 1.25eV | — | |||
| Xps Vbm | — | 1.04eV | — |
Related documents with shared materials, methods, properties, or citations.
Visualizing intercalation effects in 2D materials using AFM based techniques
Near-surface InAs 2DEG on a GaAs substrate: characterization and superconducting proximity effect
Synthesis of a semimetallic Weyl ferromagnet with point Fermi surface
Magnetic anisotropy related to hybridization between Fe 3d and As 4p orbitals in a bcc Fe-As thin film
Imaging van Hove Singularity Heterogeneity in Overdoped Graphene
Host-atom-driven transformation of a honeycomb oxide into a dodecagonal quasicrystal
Flux-periodic supercurrent oscillations in an Aharonov–Bohm–type nanowire Josephson junction
Epitaxial Growth and Electronic Properties of Quasi–Free-Standing Rhombohedral WSe2 Bilayers on Cubic W(110)
Engineering 2D Van der Waals Electrode via MBE-Grown Weyl Semimetal 1T′-WTe2 for Enhanced Photodetection in InSe
Unusual ferromagnetic band evolution and high Curie temperature in monolayer 1T-CrTe2 on bilayer graphene
Bottom-up realization of a type-II organic–TMD heterointerface: Pentacene on monolayer WS2
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
1 preparation3 characterizations5 figures
1 preparation2 characterizations21 properties6 figures
1 preparation1 characterization2 properties1 figure
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Band Edge Position | MoS₂ conduction band minimum | 0.28eV | — | |||
| Density Of States Feature Width | WTe₂ density-of-states dip width | 60meV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.75eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.25eV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.58eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2.21eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.63eV | — | |||
| Band Shift | MoS₂ valence-band shift | 200meV | — | |||
| Band Shift | WTe₂ valence-band shift | 170meV | — | |||
| Band Shift | MoS₂ valence-band shift | 70meV | — | |||
| Band Shift | WTe₂ valence-band shift | 140meV | — | |||
| Core Level Position | W 4f7/2 | 31.8eV | — | |||
| Core Level Position | Te 4d5/2 | 40.6eV | — | |||
| Core Level Position | Te 4d5/2 | 41.8eV | — | |||
| Core Level Position | W-S component | 33.25eV | — | |||
| Xps Binding Energy Shift | W 4f | 80meV | — | |||
| Xps Binding Energy | W 4f7/2 | 31.8eV | — | |||
| Xps Binding Energy | Te 4d5/2 | 40.6eV | — | — | ||
| Xps Binding Energy | Te 4d | 41.8eV | — | — | ||
| Xps Binding Energy | W 4f | 33.25eV | — | |||
| Xps Vbm | — | 0.75eV | — | |||
| Xps Vbm | — | 2eV | — | |||
| Xps Vbm | — | 1.25eV | — | |||
| Xps Vbm | — | 1.04eV | — |
Related documents with shared materials, methods, properties, or citations.
Visualizing intercalation effects in 2D materials using AFM based techniques
Near-surface InAs 2DEG on a GaAs substrate: characterization and superconducting proximity effect
Synthesis of a semimetallic Weyl ferromagnet with point Fermi surface
Magnetic anisotropy related to hybridization between Fe 3d and As 4p orbitals in a bcc Fe-As thin film
Imaging van Hove Singularity Heterogeneity in Overdoped Graphene
Host-atom-driven transformation of a honeycomb oxide into a dodecagonal quasicrystal
Flux-periodic supercurrent oscillations in an Aharonov–Bohm–type nanowire Josephson junction
Epitaxial Growth and Electronic Properties of Quasi–Free-Standing Rhombohedral WSe2 Bilayers on Cubic W(110)
Engineering 2D Van der Waals Electrode via MBE-Grown Weyl Semimetal 1T′-WTe2 for Enhanced Photodetection in InSe
Unusual ferromagnetic band evolution and high Curie temperature in monolayer 1T-CrTe2 on bilayer graphene
Bottom-up realization of a type-II organic–TMD heterointerface: Pentacene on monolayer WS2
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
1 preparation3 characterizations5 figures
1 preparation2 characterizations21 properties6 figures
1 preparation1 characterization2 properties1 figure
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Band Edge Position | MoS₂ conduction band minimum | 0.28eV | — | |||
| Density Of States Feature Width | WTe₂ density-of-states dip width | 60meV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.75eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.25eV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.58eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2.21eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.63eV | — | |||
| Band Shift | MoS₂ valence-band shift | 200meV | — | |||
| Band Shift | WTe₂ valence-band shift | 170meV | — | |||
| Band Shift | MoS₂ valence-band shift | 70meV | — | |||
| Band Shift | WTe₂ valence-band shift | 140meV | — | |||
| Core Level Position | W 4f7/2 | 31.8eV | — | |||
| Core Level Position | Te 4d5/2 | 40.6eV | — | |||
| Core Level Position | Te 4d5/2 | 41.8eV | — | |||
| Core Level Position | W-S component | 33.25eV | — | |||
| Xps Binding Energy Shift | W 4f | 80meV | — | |||
| Xps Binding Energy | W 4f7/2 | 31.8eV | — | |||
| Xps Binding Energy | Te 4d5/2 | 40.6eV | — | — | ||
| Xps Binding Energy | Te 4d | 41.8eV | — | — | ||
| Xps Binding Energy | W 4f | 33.25eV | — | |||
| Xps Vbm | — | 0.75eV | — | |||
| Xps Vbm | — | 2eV | — | |||
| Xps Vbm | — | 1.25eV | — | |||
| Xps Vbm | — | 1.04eV | — |
Related documents with shared materials, methods, properties, or citations.
Visualizing intercalation effects in 2D materials using AFM based techniques
Near-surface InAs 2DEG on a GaAs substrate: characterization and superconducting proximity effect
Synthesis of a semimetallic Weyl ferromagnet with point Fermi surface
Magnetic anisotropy related to hybridization between Fe 3d and As 4p orbitals in a bcc Fe-As thin film
Imaging van Hove Singularity Heterogeneity in Overdoped Graphene
Host-atom-driven transformation of a honeycomb oxide into a dodecagonal quasicrystal
Flux-periodic supercurrent oscillations in an Aharonov–Bohm–type nanowire Josephson junction
Epitaxial Growth and Electronic Properties of Quasi–Free-Standing Rhombohedral WSe2 Bilayers on Cubic W(110)
Engineering 2D Van der Waals Electrode via MBE-Grown Weyl Semimetal 1T′-WTe2 for Enhanced Photodetection in InSe
Unusual ferromagnetic band evolution and high Curie temperature in monolayer 1T-CrTe2 on bilayer graphene
Bottom-up realization of a type-II organic–TMD heterointerface: Pentacene on monolayer WS2
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
No measurements recorded
1 preparation3 characterizations5 figures
1 preparation2 characterizations21 properties6 figures
1 preparation1 characterization2 properties1 figure
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Band Edge Position | MoS₂ conduction band minimum | 0.28eV | — | |||
| Density Of States Feature Width | WTe₂ density-of-states dip width | 60meV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.75eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.25eV | — | |||
| Band Edge Position | WTe₂ second highest valence band maximum at Γ | 0.58eV | — | |||
| Band Edge Position | MoS₂ valence band maximum at K | 2.21eV | — | |||
| Band Offset | WTe₂-MoS₂ valence-band separation | 1.63eV | — | |||
| Band Shift | MoS₂ valence-band shift | 200meV | — | |||
| Band Shift | WTe₂ valence-band shift | 170meV | — | |||
| Band Shift | MoS₂ valence-band shift | 70meV | — | |||
| Band Shift | WTe₂ valence-band shift | 140meV | — | |||
| Core Level Position | W 4f7/2 | 31.8eV | — | |||
| Core Level Position | Te 4d5/2 | 40.6eV | — | |||
| Core Level Position | Te 4d5/2 | 41.8eV | — | |||
| Core Level Position | W-S component | 33.25eV | — | |||
| Xps Binding Energy Shift | W 4f | 80meV | — | |||
| Xps Binding Energy | W 4f7/2 | 31.8eV | — | |||
| Xps Binding Energy | Te 4d5/2 | 40.6eV | — | — | ||
| Xps Binding Energy | Te 4d | 41.8eV | — | — | ||
| Xps Binding Energy | W 4f | 33.25eV | — | |||
| Xps Vbm | — | 0.75eV | — | |||
| Xps Vbm | — | 2eV | — | |||
| Xps Vbm | — | 1.25eV | — | |||
| Xps Vbm | — | 1.04eV | — |
Related documents with shared materials, methods, properties, or citations.
Visualizing intercalation effects in 2D materials using AFM based techniques
Near-surface InAs 2DEG on a GaAs substrate: characterization and superconducting proximity effect
Synthesis of a semimetallic Weyl ferromagnet with point Fermi surface
Magnetic anisotropy related to hybridization between Fe 3d and As 4p orbitals in a bcc Fe-As thin film
Imaging van Hove Singularity Heterogeneity in Overdoped Graphene
Host-atom-driven transformation of a honeycomb oxide into a dodecagonal quasicrystal
Flux-periodic supercurrent oscillations in an Aharonov–Bohm–type nanowire Josephson junction
Epitaxial Growth and Electronic Properties of Quasi–Free-Standing Rhombohedral WSe2 Bilayers on Cubic W(110)
Engineering 2D Van der Waals Electrode via MBE-Grown Weyl Semimetal 1T′-WTe2 for Enhanced Photodetection in InSe
Unusual ferromagnetic band evolution and high Curie temperature in monolayer 1T-CrTe2 on bilayer graphene
Bottom-up realization of a type-II organic–TMD heterointerface: Pentacene on monolayer WS2