Research paper
Computational MultiscaleTheoreticalEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
28 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | GaAs p-contact | 3.412 | — | |||
| Layer Thickness | GaAs p-contact | 50nm | — | |||
| Refractive Index | Al0.4Ga0.6As cladding | 3.212 | — | |||
| Layer Thickness | Al0.4Ga0.6As cladding | 1400nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 70nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 2nm | — | |||
| Layer Count | InAs quantum dot repeats | 5 | — | |||
| Refractive Index | InAs quantum dots | 3.532 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 6nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | GaAs barrier | 37.5nm | — | |||
| Refractive Index | GaAs barrier | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 32.5nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs n-contact | 50nm | — | |||
| Refractive Index | GaAs n-contact | 3.412 | — | |||
| Layer Thickness | Bonding layer | 30nm | — | |||
| Refractive Index | Bonding layer | 1.75 | — | |||
| Layer Thickness | SiO₂ | 100nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si waveguide | 220nm | — | |||
| Refractive Index | Si waveguide | 3.5 | — | |||
| Layer Thickness | SiO₂ | 500nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si substrate | 300um | — | |||
| Refractive Index | Si substrate | 3.5 | — |
Related documents with shared materials, methods, properties, or citations.
Quantum Dots / Spin Qubits
Nonlinear integrated quantum photonics with AlGaAs
LOW VOLTAGE HIGH EFFICIENCY GALLIUM ARSENIDE POWER AMPLIFIER
High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots
Thermal Noise Measurement Below the Standard Quantum Limit
Finite element 3-D model of a double quantum ring: effects of electric and laser fields on the interband transition
GROUP V DOPING OF GAAS-BASED LAYERS TO IMPROVE RADIATION TOLERANCE OF SOLAR CELLS
Enhanced effective masses, spin-orbit polarization, and dispersion relations in 2D hole gases under strongly asymmetric confinement
INTEGRATED GAAS ACTIVE DEVICES WITH IMPROVED OPTICAL COUPLING TO DIELECTRIC WAVEGUIDES
Frequency stability of 2.5 × 10−17 in a Si cavity with AlGaAs crystalline mirrors
Integrated emitters with CMOS-compatible tuning for large scale quantum SiN photonic circuits
Photo-birefringent effects in crystalline AlGaAs mirror coatings
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
28 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | GaAs p-contact | 3.412 | — | |||
| Layer Thickness | GaAs p-contact | 50nm | — | |||
| Refractive Index | Al0.4Ga0.6As cladding | 3.212 | — | |||
| Layer Thickness | Al0.4Ga0.6As cladding | 1400nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 70nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 2nm | — | |||
| Layer Count | InAs quantum dot repeats | 5 | — | |||
| Refractive Index | InAs quantum dots | 3.532 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 6nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | GaAs barrier | 37.5nm | — | |||
| Refractive Index | GaAs barrier | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 32.5nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs n-contact | 50nm | — | |||
| Refractive Index | GaAs n-contact | 3.412 | — | |||
| Layer Thickness | Bonding layer | 30nm | — | |||
| Refractive Index | Bonding layer | 1.75 | — | |||
| Layer Thickness | SiO₂ | 100nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si waveguide | 220nm | — | |||
| Refractive Index | Si waveguide | 3.5 | — | |||
| Layer Thickness | SiO₂ | 500nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si substrate | 300um | — | |||
| Refractive Index | Si substrate | 3.5 | — |
Related documents with shared materials, methods, properties, or citations.
Quantum Dots / Spin Qubits
Nonlinear integrated quantum photonics with AlGaAs
LOW VOLTAGE HIGH EFFICIENCY GALLIUM ARSENIDE POWER AMPLIFIER
High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots
Thermal Noise Measurement Below the Standard Quantum Limit
Finite element 3-D model of a double quantum ring: effects of electric and laser fields on the interband transition
GROUP V DOPING OF GAAS-BASED LAYERS TO IMPROVE RADIATION TOLERANCE OF SOLAR CELLS
Enhanced effective masses, spin-orbit polarization, and dispersion relations in 2D hole gases under strongly asymmetric confinement
INTEGRATED GAAS ACTIVE DEVICES WITH IMPROVED OPTICAL COUPLING TO DIELECTRIC WAVEGUIDES
Frequency stability of 2.5 × 10−17 in a Si cavity with AlGaAs crystalline mirrors
Integrated emitters with CMOS-compatible tuning for large scale quantum SiN photonic circuits
Photo-birefringent effects in crystalline AlGaAs mirror coatings
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
28 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | GaAs p-contact | 3.412 | — | |||
| Layer Thickness | GaAs p-contact | 50nm | — | |||
| Refractive Index | Al0.4Ga0.6As cladding | 3.212 | — | |||
| Layer Thickness | Al0.4Ga0.6As cladding | 1400nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 70nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 2nm | — | |||
| Layer Count | InAs quantum dot repeats | 5 | — | |||
| Refractive Index | InAs quantum dots | 3.532 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 6nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | GaAs barrier | 37.5nm | — | |||
| Refractive Index | GaAs barrier | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 32.5nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs n-contact | 50nm | — | |||
| Refractive Index | GaAs n-contact | 3.412 | — | |||
| Layer Thickness | Bonding layer | 30nm | — | |||
| Refractive Index | Bonding layer | 1.75 | — | |||
| Layer Thickness | SiO₂ | 100nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si waveguide | 220nm | — | |||
| Refractive Index | Si waveguide | 3.5 | — | |||
| Layer Thickness | SiO₂ | 500nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si substrate | 300um | — | |||
| Refractive Index | Si substrate | 3.5 | — |
Related documents with shared materials, methods, properties, or citations.
Quantum Dots / Spin Qubits
Nonlinear integrated quantum photonics with AlGaAs
LOW VOLTAGE HIGH EFFICIENCY GALLIUM ARSENIDE POWER AMPLIFIER
High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots
Thermal Noise Measurement Below the Standard Quantum Limit
Finite element 3-D model of a double quantum ring: effects of electric and laser fields on the interband transition
GROUP V DOPING OF GAAS-BASED LAYERS TO IMPROVE RADIATION TOLERANCE OF SOLAR CELLS
Enhanced effective masses, spin-orbit polarization, and dispersion relations in 2D hole gases under strongly asymmetric confinement
INTEGRATED GAAS ACTIVE DEVICES WITH IMPROVED OPTICAL COUPLING TO DIELECTRIC WAVEGUIDES
Frequency stability of 2.5 × 10−17 in a Si cavity with AlGaAs crystalline mirrors
Integrated emitters with CMOS-compatible tuning for large scale quantum SiN photonic circuits
Photo-birefringent effects in crystalline AlGaAs mirror coatings
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
28 properties
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Refractive Index | GaAs p-contact | 3.412 | — | |||
| Layer Thickness | GaAs p-contact | 50nm | — | |||
| Refractive Index | Al0.4Ga0.6As cladding | 3.212 | — | |||
| Layer Thickness | Al0.4Ga0.6As cladding | 1400nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 70nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 2nm | — | |||
| Layer Count | InAs quantum dot repeats | 5 | — | |||
| Refractive Index | InAs quantum dots | 3.532 | — | |||
| Layer Thickness | In0.18Ga0.82As capping | 6nm | — | |||
| Refractive Index | In0.18Ga0.82As capping | 3.434 | — | |||
| Layer Thickness | GaAs barrier | 37.5nm | — | |||
| Refractive Index | GaAs barrier | 3.412 | — | |||
| Layer Thickness | GaAs waveguide | 32.5nm | — | |||
| Refractive Index | GaAs waveguide | 3.412 | — | |||
| Layer Thickness | GaAs n-contact | 50nm | — | |||
| Refractive Index | GaAs n-contact | 3.412 | — | |||
| Layer Thickness | Bonding layer | 30nm | — | |||
| Refractive Index | Bonding layer | 1.75 | — | |||
| Layer Thickness | SiO₂ | 100nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si waveguide | 220nm | — | |||
| Refractive Index | Si waveguide | 3.5 | — | |||
| Layer Thickness | SiO₂ | 500nm | — | |||
| Refractive Index | SiO₂ | 1.45 | — | |||
| Layer Thickness | Si substrate | 300um | — | |||
| Refractive Index | Si substrate | 3.5 | — |
Related documents with shared materials, methods, properties, or citations.
Quantum Dots / Spin Qubits
Nonlinear integrated quantum photonics with AlGaAs
LOW VOLTAGE HIGH EFFICIENCY GALLIUM ARSENIDE POWER AMPLIFIER
High-β lasing in photonic-defect semiconductor-dielectric hybrid microresonators with embedded InGaAs quantum dots
Thermal Noise Measurement Below the Standard Quantum Limit
Finite element 3-D model of a double quantum ring: effects of electric and laser fields on the interband transition
GROUP V DOPING OF GAAS-BASED LAYERS TO IMPROVE RADIATION TOLERANCE OF SOLAR CELLS
Enhanced effective masses, spin-orbit polarization, and dispersion relations in 2D hole gases under strongly asymmetric confinement
INTEGRATED GAAS ACTIVE DEVICES WITH IMPROVED OPTICAL COUPLING TO DIELECTRIC WAVEGUIDES
Frequency stability of 2.5 × 10−17 in a Si cavity with AlGaAs crystalline mirrors
Integrated emitters with CMOS-compatible tuning for large scale quantum SiN photonic circuits
Photo-birefringent effects in crystalline AlGaAs mirror coatings