Research paper
Experimental GrowthExperimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stm Apparent Height | intercalated BL island height | 32.1pm | — | |||
| Stm Rms Roughness | intercalated island roughness | 10.1pm | — | |||
| Stm Rms Roughness | buffer-layer roughness | 17.9pm | — | |||
| Stm Apparent Height | L₁ height | 77.6pm | — | |||
| Stm Apparent Height | L₂ height | 323.8pm | — | |||
| Stm Apparent Height Difference | L₂ minus L₁ | 244.8pm | — | |||
| Surface Periodicity | Pt-induced moiré periodicity | 2.92nm | — | |||
| Surface Periodicity | graphene superstructure repeat | 12monolayerfraction | — | |||
| Surface Lattice Constant | Pt-Pt distance in intercalated hexagonal layer | 0.266nm | — | |||
| Arpes Dirac Point | Dirac point relative to EF | -0.48eV | — | |||
| Arpes State Energy | non-dispersive BL state | 0.4eV | — | |||
| Arpes State Energy | non-dispersive BL state | 1.2eV | — | |||
| Arpes Dirac Point Shift | Dirac point shift after complete intercalation | towards EF | — | |||
| Intercalated Island Size | maximum lateral size of intercalated islands in MLG far from step edges | 20nm | — | |||
| Xps Binding Energy | C 1s | 284.95eV | — | |||
| Xps Binding Energy | C 1s | 285.6eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Binding Energy | C 1s | 284.5eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 101.64eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 71.4eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.4eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 72.3eV | — | |||
| Xps Binding Energy | C 1s | 284.52eV | — | |||
| Xps Binding Energy | C 1s | 282.83eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.57eV | — | |||
| Xps Binding Energy | C 1s | 284.59eV | — | |||
| Xps Binding Energy | C 1s | 283.25eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.98eV | — | |||
| Xps Binding Energy Shift | — | 1.1eV | — | |||
| Xps Binding Energy Shift | — | 0.65eV | — | |||
| Xps Binding Energy Shift | — | 0.4eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stm Apparent Height | intercalated BL island height | 32.1pm | — | |||
| Stm Rms Roughness | intercalated island roughness | 10.1pm | — | |||
| Stm Rms Roughness | buffer-layer roughness | 17.9pm | — | |||
| Stm Apparent Height | L₁ height | 77.6pm | — | |||
| Stm Apparent Height | L₂ height | 323.8pm | — | |||
| Stm Apparent Height Difference | L₂ minus L₁ | 244.8pm | — | |||
| Surface Periodicity | Pt-induced moiré periodicity | 2.92nm | — | |||
| Surface Periodicity | graphene superstructure repeat | 12monolayerfraction | — | |||
| Surface Lattice Constant | Pt-Pt distance in intercalated hexagonal layer | 0.266nm | — | |||
| Arpes Dirac Point | Dirac point relative to EF | -0.48eV | — | |||
| Arpes State Energy | non-dispersive BL state | 0.4eV | — | |||
| Arpes State Energy | non-dispersive BL state | 1.2eV | — | |||
| Arpes Dirac Point Shift | Dirac point shift after complete intercalation | towards EF | — | |||
| Intercalated Island Size | maximum lateral size of intercalated islands in MLG far from step edges | 20nm | — | |||
| Xps Binding Energy | C 1s | 284.95eV | — | |||
| Xps Binding Energy | C 1s | 285.6eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Binding Energy | C 1s | 284.5eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 101.64eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 71.4eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.4eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 72.3eV | — | |||
| Xps Binding Energy | C 1s | 284.52eV | — | |||
| Xps Binding Energy | C 1s | 282.83eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.57eV | — | |||
| Xps Binding Energy | C 1s | 284.59eV | — | |||
| Xps Binding Energy | C 1s | 283.25eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.98eV | — | |||
| Xps Binding Energy Shift | — | 1.1eV | — | |||
| Xps Binding Energy Shift | — | 0.65eV | — | |||
| Xps Binding Energy Shift | — | 0.4eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stm Apparent Height | intercalated BL island height | 32.1pm | — | |||
| Stm Rms Roughness | intercalated island roughness | 10.1pm | — | |||
| Stm Rms Roughness | buffer-layer roughness | 17.9pm | — | |||
| Stm Apparent Height | L₁ height | 77.6pm | — | |||
| Stm Apparent Height | L₂ height | 323.8pm | — | |||
| Stm Apparent Height Difference | L₂ minus L₁ | 244.8pm | — | |||
| Surface Periodicity | Pt-induced moiré periodicity | 2.92nm | — | |||
| Surface Periodicity | graphene superstructure repeat | 12monolayerfraction | — | |||
| Surface Lattice Constant | Pt-Pt distance in intercalated hexagonal layer | 0.266nm | — | |||
| Arpes Dirac Point | Dirac point relative to EF | -0.48eV | — | |||
| Arpes State Energy | non-dispersive BL state | 0.4eV | — | |||
| Arpes State Energy | non-dispersive BL state | 1.2eV | — | |||
| Arpes Dirac Point Shift | Dirac point shift after complete intercalation | towards EF | — | |||
| Intercalated Island Size | maximum lateral size of intercalated islands in MLG far from step edges | 20nm | — | |||
| Xps Binding Energy | C 1s | 284.95eV | — | |||
| Xps Binding Energy | C 1s | 285.6eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Binding Energy | C 1s | 284.5eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 101.64eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 71.4eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.4eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 72.3eV | — | |||
| Xps Binding Energy | C 1s | 284.52eV | — | |||
| Xps Binding Energy | C 1s | 282.83eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.57eV | — | |||
| Xps Binding Energy | C 1s | 284.59eV | — | |||
| Xps Binding Energy | C 1s | 283.25eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.98eV | — | |||
| Xps Binding Energy Shift | — | 1.1eV | — | |||
| Xps Binding Energy Shift | — | 0.65eV | — | |||
| Xps Binding Energy Shift | — | 0.4eV | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Stm Apparent Height | intercalated BL island height | 32.1pm | — | |||
| Stm Rms Roughness | intercalated island roughness | 10.1pm | — | |||
| Stm Rms Roughness | buffer-layer roughness | 17.9pm | — | |||
| Stm Apparent Height | L₁ height | 77.6pm | — | |||
| Stm Apparent Height | L₂ height | 323.8pm | — | |||
| Stm Apparent Height Difference | L₂ minus L₁ | 244.8pm | — | |||
| Surface Periodicity | Pt-induced moiré periodicity | 2.92nm | — | |||
| Surface Periodicity | graphene superstructure repeat | 12monolayerfraction | — | |||
| Surface Lattice Constant | Pt-Pt distance in intercalated hexagonal layer | 0.266nm | — | |||
| Arpes Dirac Point | Dirac point relative to EF | -0.48eV | — | |||
| Arpes State Energy | non-dispersive BL state | 0.4eV | — | |||
| Arpes State Energy | non-dispersive BL state | 1.2eV | — | |||
| Arpes Dirac Point Shift | Dirac point shift after complete intercalation | towards EF | — | |||
| Intercalated Island Size | maximum lateral size of intercalated islands in MLG far from step edges | 20nm | — | |||
| Xps Binding Energy | C 1s | 284.95eV | — | |||
| Xps Binding Energy | C 1s | 285.6eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Binding Energy | C 1s | 284.5eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 101.64eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 71.4eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.4eV | — | |||
| Xps Binding Energy | Pt 4f7/2 | 72.3eV | — | |||
| Xps Binding Energy | C 1s | 284.52eV | — | |||
| Xps Binding Energy | C 1s | 282.83eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.57eV | — | |||
| Xps Binding Energy | C 1s | 284.59eV | — | |||
| Xps Binding Energy | C 1s | 283.25eV | — | |||
| Xps Binding Energy | Si 2p3/2 | 100.98eV | — | |||
| Xps Binding Energy Shift | — | 1.1eV | — | |||
| Xps Binding Energy Shift | — | 0.65eV | — | |||
| Xps Binding Energy Shift | — | 0.4eV | — |