Research paper
Experimental CharacterizationComputational DFTComputed RamanTheoretical| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Channel Width | channel width | 1.15um | — | |||
| Device Constriction Width | constriction width | 1um | — | |||
| Current | I₀ | 4.5uA | — | |||
| Current Density Ratio | channel concentration enhancement | 30% | — | |||
| Scattering Length | electron-electron scattering length | 50nm | — | |||
| Scattering Length | momentum-relaxation length | 600nm | — | |||
| Scattering Length | electron-electron scattering length | 161nm | — | |||
| Scattering Length | momentum-relaxation length | 100000nm | — | |||
| Scattering Length | electron-electron scattering length | 4200nm | — | |||
| Scattering Length | momentum-relaxation length | 18200nm | — | |||
| Scattering Length | electron-electron scattering length | 29nm | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Channel Width | channel width | 1.15um | — | |||
| Device Constriction Width | constriction width | 1um | — | |||
| Current | I₀ | 4.5uA | — | |||
| Current Density Ratio | channel concentration enhancement | 30% | — | |||
| Scattering Length | electron-electron scattering length | 50nm | — | |||
| Scattering Length | momentum-relaxation length | 600nm | — | |||
| Scattering Length | electron-electron scattering length | 161nm | — | |||
| Scattering Length | momentum-relaxation length | 100000nm | — | |||
| Scattering Length | electron-electron scattering length | 4200nm | — | |||
| Scattering Length | momentum-relaxation length | 18200nm | — | |||
| Scattering Length | electron-electron scattering length | 29nm | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Channel Width | channel width | 1.15um | — | |||
| Device Constriction Width | constriction width | 1um | — | |||
| Current | I₀ | 4.5uA | — | |||
| Current Density Ratio | channel concentration enhancement | 30% | — | |||
| Scattering Length | electron-electron scattering length | 50nm | — | |||
| Scattering Length | momentum-relaxation length | 600nm | — | |||
| Scattering Length | electron-electron scattering length | 161nm | — | |||
| Scattering Length | momentum-relaxation length | 100000nm | — | |||
| Scattering Length | electron-electron scattering length | 4200nm | — | |||
| Scattering Length | momentum-relaxation length | 18200nm | — | |||
| Scattering Length | electron-electron scattering length | 29nm | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Device Channel Width | channel width | 1.15um | — | |||
| Device Constriction Width | constriction width | 1um | — | |||
| Current | I₀ | 4.5uA | — | |||
| Current Density Ratio | channel concentration enhancement | 30% | — | |||
| Scattering Length | electron-electron scattering length | 50nm | — | |||
| Scattering Length | momentum-relaxation length | 600nm | — | |||
| Scattering Length | electron-electron scattering length | 161nm | — | |||
| Scattering Length | momentum-relaxation length | 100000nm | — | |||
| Scattering Length | electron-electron scattering length | 4200nm | — | |||
| Scattering Length | momentum-relaxation length | 18200nm | — | |||
| Scattering Length | electron-electron scattering length | 29nm | — |