Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Model of an elliptical graphene quantum dot on h-BN/SiO₂/doped-Si with a local tip-induced perturbation used to study variational scarring and STM observability.
No measurements recorded
SimulatedCStudied Materialh-BNSubstrate / DielectricSiO₂Substrate / DielectricSiSubstrate / DielectricnanotipCapping Or Contact
Why these are connected
Related documents with shared materials, methods, properties, or citations.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Model of an elliptical graphene quantum dot on h-BN/SiO₂/doped-Si with a local tip-induced perturbation used to study variational scarring and STM observability.
No measurements recorded
SimulatedCStudied Materialh-BNSubstrate / DielectricSiO₂Substrate / DielectricSiSubstrate / DielectricnanotipCapping Or Contact
Why these are connected
Related documents with shared materials, methods, properties, or citations.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Model of an elliptical graphene quantum dot on h-BN/SiO₂/doped-Si with a local tip-induced perturbation used to study variational scarring and STM observability.
No measurements recorded
SimulatedCStudied Materialh-BNSubstrate / DielectricSiO₂Substrate / DielectricSiSubstrate / DielectricnanotipCapping Or Contact
Why these are connected
Related documents with shared materials, methods, properties, or citations.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Model of an elliptical graphene quantum dot on h-BN/SiO₂/doped-Si with a local tip-induced perturbation used to study variational scarring and STM observability.
No measurements recorded
SimulatedCStudied Materialh-BNSubstrate / DielectricSiO₂Substrate / DielectricSiSubstrate / DielectricnanotipCapping Or Contact
Why these are connected
Related documents with shared materials, methods, properties, or citations.