Research paper
Computational DFTTheoretical| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Twist Angle | relative twist angle | 0deg | — | |||
| Twist Angle | relative twist angle | 10.89deg | — | |||
| Substrate Strain | biaxial strain in graphene | -2.6% | — | |||
| Substrate Strain | biaxial strain in graphene | 6.27% | — | |||
| Supercell Lattice Constant | asc | 11.99angstrom | — | |||
| Supercell Lattice Constant | asc | 6.92angstrom | — | |||
| Interlayer Spacing | d | 3.4901angstrom | — | |||
| Interlayer Spacing | d | 3.4829angstrom | — | |||
| Supercell Atom Count | N | 74 | — | |||
| Supercell Atom Count | N | 22 | — | |||
| Ground State | CrI₃ ground state | FM | — | |||
| Ground State | CrI₃ ground state | FM | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Twist Angle | relative twist angle | 0deg | — | |||
| Twist Angle | relative twist angle | 10.89deg | — | |||
| Substrate Strain | biaxial strain in graphene | -2.6% | — | |||
| Substrate Strain | biaxial strain in graphene | 6.27% | — | |||
| Supercell Lattice Constant | asc | 11.99angstrom | — | |||
| Supercell Lattice Constant | asc | 6.92angstrom | — | |||
| Interlayer Spacing | d | 3.4901angstrom | — | |||
| Interlayer Spacing | d | 3.4829angstrom | — | |||
| Supercell Atom Count | N | 74 | — | |||
| Supercell Atom Count | N | 22 | — | |||
| Ground State | CrI₃ ground state | FM | — | |||
| Ground State | CrI₃ ground state | FM | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Twist Angle | relative twist angle | 0deg | — | |||
| Twist Angle | relative twist angle | 10.89deg | — | |||
| Substrate Strain | biaxial strain in graphene | -2.6% | — | |||
| Substrate Strain | biaxial strain in graphene | 6.27% | — | |||
| Supercell Lattice Constant | asc | 11.99angstrom | — | |||
| Supercell Lattice Constant | asc | 6.92angstrom | — | |||
| Interlayer Spacing | d | 3.4901angstrom | — | |||
| Interlayer Spacing | d | 3.4829angstrom | — | |||
| Supercell Atom Count | N | 74 | — | |||
| Supercell Atom Count | N | 22 | — | |||
| Ground State | CrI₃ ground state | FM | — | |||
| Ground State | CrI₃ ground state | FM | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Twist Angle | relative twist angle | 0deg | — | |||
| Twist Angle | relative twist angle | 10.89deg | — | |||
| Substrate Strain | biaxial strain in graphene | -2.6% | — | |||
| Substrate Strain | biaxial strain in graphene | 6.27% | — | |||
| Supercell Lattice Constant | asc | 11.99angstrom | — | |||
| Supercell Lattice Constant | asc | 6.92angstrom | — | |||
| Interlayer Spacing | d | 3.4901angstrom | — | |||
| Interlayer Spacing | d | 3.4829angstrom | — | |||
| Supercell Atom Count | N | 74 | — | |||
| Supercell Atom Count | N | 22 | — | |||
| Ground State | CrI₃ ground state | FM | — | |||
| Ground State | CrI₃ ground state | FM | — |