GaN LEDs with Improved Area and Method for Making the Same | Matter42 Literature
Patent
Atlas literature
Patent
US 9,018,643
GaN LEDs with Improved Area and Method for Making the Same
Long Yang
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
5 independent · 9 dependent
1
Independentlight emitting device (LED)
1. A device comprising: an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; a mirror layer in contact with a surface of said second semiconductor layer that is not in contact with said active layer, said mirror having a surface area substantially equal to that of said active layer; and a base member having a first surface in contact with said mirror layer and having an area substantially equal to that of said mirror layer, said base member having a cross-sectional area at locations distal from said first surface, said cross-section area being less than said area of said first surface.
The device of Claim 1 wherein said mirror is in contact with a layer of eutectic metal.
2
IndependentGaNlight emitting device (LED)
The device of Claim I wherein said f irst layer comprises an n-GaN layer with a surface that includes scattering features having dimensions greater than said predetermined wavelength.
3
Independentlight emitting device (LED)
The device of Claim I wherein said base member has a thickness greater than 100 pm.
The device of Claim 3 wherein said base member comprises a metal. SUBSTITUTE SPECIFICATION-CLEAN D ocket No. 5501 8 2
4
Independentlight emitting device (LED)
The device of Claim I wherein said base member comprises an electrical conductor.
5
Dependent← claim 4Silight emitting device (LED)
The device of Claim 4 wherein said electrical conductor is crystalline silicon.
9
Independent
A method for fab r icating a light emitting device, said method comprising: epitaxially growing a light emitting layer on a first substrate, said light emitting layer comprising an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; depositing a reflective layer on a surface of said first semiconductor layer; bonding said reflective layer to a first surface of a conducting substrate; removing first substrate to form a structure bonded to said conducting substrate; processing a surface of said second semiconductor layer to provide a first trench extending from said surface of said second semiconductor layer through said structure: and processing a second surface of said conducting substrate to provide a second trench that extends from that surface to said trench.
10
Dependent← claim 9
The method of Claim 9 wherein said first trench has a width of less than 10 pim.
11
Dependent← claim 9
1 1. The method of Claim 9 wherein said second trench is wider than said first trench.
12
Dependent← claim 9
The method of Claim 9 further comprising depositing a patte rn ed metal layer on said reflective layer, said patterned metal layer having openings positioned under said first trench, said openings providing said second trench. SUBSTITUTE SPECIFICATION-CLEAN D ocke t No. 5501 8 3
13
Dependent← claim 9eutectic metal
The method of Claim 9 wherein bonding said comprises d epositing a patterned eutectic metal bonding to a surface of said conducting substrate, openings under said first trench.
14
Dependent← claim 9
The method of Claim 9 wherein said first
15
Dependent← claim 9
The method of Claim 9 wherein processing said further comprises introducing scattering features greater than said predetermined wavelength. reflective layer to said conducting substrate layer on said reflective layer, said eut ectic metal said patterned eutectic layer comprising substrate is a silicon wafer. surface of said second semiconductor layer in said surface, said features having dimensions
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
light emitting device (LED)
GaNfirst semiconductor layer n-type
activelayeractive layer
GaNsecond semiconductor layer p-type
mirrorlayermirror layer
basememberbase member
Materials
Materials described outside the worked examples.
n-GaN
GaN
First Semiconductor Layer
Second Semiconductor Layer
crystalline silicon
Si
Process steps
Additional fabrication and treatment steps described in the patent.
1
Epitaxial Growth
Step 1
Process details
substrate:first substrate
layers grown:active layer sandwiched between first and second semiconductor layers of opposite types
Materials:GaNGaN
Why these are connected
Related documents with shared materials, methods, properties, or citations.
GaN LEDs with Improved Area and Method for Making the Same
Long Yang
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
5 independent · 9 dependent
1
Independentlight emitting device (LED)
1. A device comprising: an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; a mirror layer in contact with a surface of said second semiconductor layer that is not in contact with said active layer, said mirror having a surface area substantially equal to that of said active layer; and a base member having a first surface in contact with said mirror layer and having an area substantially equal to that of said mirror layer, said base member having a cross-sectional area at locations distal from said first surface, said cross-section area being less than said area of said first surface.
The device of Claim 1 wherein said mirror is in contact with a layer of eutectic metal.
2
IndependentGaNlight emitting device (LED)
The device of Claim I wherein said f irst layer comprises an n-GaN layer with a surface that includes scattering features having dimensions greater than said predetermined wavelength.
3
Independentlight emitting device (LED)
The device of Claim I wherein said base member has a thickness greater than 100 pm.
The device of Claim 3 wherein said base member comprises a metal. SUBSTITUTE SPECIFICATION-CLEAN D ocket No. 5501 8 2
4
Independentlight emitting device (LED)
The device of Claim I wherein said base member comprises an electrical conductor.
5
Dependent← claim 4Silight emitting device (LED)
The device of Claim 4 wherein said electrical conductor is crystalline silicon.
9
Independent
A method for fab r icating a light emitting device, said method comprising: epitaxially growing a light emitting layer on a first substrate, said light emitting layer comprising an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; depositing a reflective layer on a surface of said first semiconductor layer; bonding said reflective layer to a first surface of a conducting substrate; removing first substrate to form a structure bonded to said conducting substrate; processing a surface of said second semiconductor layer to provide a first trench extending from said surface of said second semiconductor layer through said structure: and processing a second surface of said conducting substrate to provide a second trench that extends from that surface to said trench.
10
Dependent← claim 9
The method of Claim 9 wherein said first trench has a width of less than 10 pim.
11
Dependent← claim 9
1 1. The method of Claim 9 wherein said second trench is wider than said first trench.
12
Dependent← claim 9
The method of Claim 9 further comprising depositing a patte rn ed metal layer on said reflective layer, said patterned metal layer having openings positioned under said first trench, said openings providing said second trench. SUBSTITUTE SPECIFICATION-CLEAN D ocke t No. 5501 8 3
13
Dependent← claim 9eutectic metal
The method of Claim 9 wherein bonding said comprises d epositing a patterned eutectic metal bonding to a surface of said conducting substrate, openings under said first trench.
14
Dependent← claim 9
The method of Claim 9 wherein said first
15
Dependent← claim 9
The method of Claim 9 wherein processing said further comprises introducing scattering features greater than said predetermined wavelength. reflective layer to said conducting substrate layer on said reflective layer, said eut ectic metal said patterned eutectic layer comprising substrate is a silicon wafer. surface of said second semiconductor layer in said surface, said features having dimensions
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
light emitting device (LED)
GaNfirst semiconductor layer n-type
activelayeractive layer
GaNsecond semiconductor layer p-type
mirrorlayermirror layer
basememberbase member
Materials
Materials described outside the worked examples.
n-GaN
GaN
First Semiconductor Layer
Second Semiconductor Layer
crystalline silicon
Si
Process steps
Additional fabrication and treatment steps described in the patent.
1
Epitaxial Growth
Step 1
Process details
substrate:first substrate
layers grown:active layer sandwiched between first and second semiconductor layers of opposite types
Materials:GaNGaN
Why these are connected
Related documents with shared materials, methods, properties, or citations.
GaN LEDs with Improved Area and Method for Making the Same
Long Yang
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
5 independent · 9 dependent
1
Independentlight emitting device (LED)
1. A device comprising: an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; a mirror layer in contact with a surface of said second semiconductor layer that is not in contact with said active layer, said mirror having a surface area substantially equal to that of said active layer; and a base member having a first surface in contact with said mirror layer and having an area substantially equal to that of said mirror layer, said base member having a cross-sectional area at locations distal from said first surface, said cross-section area being less than said area of said first surface.
The device of Claim 1 wherein said mirror is in contact with a layer of eutectic metal.
2
IndependentGaNlight emitting device (LED)
The device of Claim I wherein said f irst layer comprises an n-GaN layer with a surface that includes scattering features having dimensions greater than said predetermined wavelength.
3
Independentlight emitting device (LED)
The device of Claim I wherein said base member has a thickness greater than 100 pm.
The device of Claim 3 wherein said base member comprises a metal. SUBSTITUTE SPECIFICATION-CLEAN D ocket No. 5501 8 2
4
Independentlight emitting device (LED)
The device of Claim I wherein said base member comprises an electrical conductor.
5
Dependent← claim 4Silight emitting device (LED)
The device of Claim 4 wherein said electrical conductor is crystalline silicon.
9
Independent
A method for fab r icating a light emitting device, said method comprising: epitaxially growing a light emitting layer on a first substrate, said light emitting layer comprising an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; depositing a reflective layer on a surface of said first semiconductor layer; bonding said reflective layer to a first surface of a conducting substrate; removing first substrate to form a structure bonded to said conducting substrate; processing a surface of said second semiconductor layer to provide a first trench extending from said surface of said second semiconductor layer through said structure: and processing a second surface of said conducting substrate to provide a second trench that extends from that surface to said trench.
10
Dependent← claim 9
The method of Claim 9 wherein said first trench has a width of less than 10 pim.
11
Dependent← claim 9
1 1. The method of Claim 9 wherein said second trench is wider than said first trench.
12
Dependent← claim 9
The method of Claim 9 further comprising depositing a patte rn ed metal layer on said reflective layer, said patterned metal layer having openings positioned under said first trench, said openings providing said second trench. SUBSTITUTE SPECIFICATION-CLEAN D ocke t No. 5501 8 3
13
Dependent← claim 9eutectic metal
The method of Claim 9 wherein bonding said comprises d epositing a patterned eutectic metal bonding to a surface of said conducting substrate, openings under said first trench.
14
Dependent← claim 9
The method of Claim 9 wherein said first
15
Dependent← claim 9
The method of Claim 9 wherein processing said further comprises introducing scattering features greater than said predetermined wavelength. reflective layer to said conducting substrate layer on said reflective layer, said eut ectic metal said patterned eutectic layer comprising substrate is a silicon wafer. surface of said second semiconductor layer in said surface, said features having dimensions
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
light emitting device (LED)
GaNfirst semiconductor layer n-type
activelayeractive layer
GaNsecond semiconductor layer p-type
mirrorlayermirror layer
basememberbase member
Materials
Materials described outside the worked examples.
n-GaN
GaN
First Semiconductor Layer
Second Semiconductor Layer
crystalline silicon
Si
Process steps
Additional fabrication and treatment steps described in the patent.
1
Epitaxial Growth
Step 1
Process details
substrate:first substrate
layers grown:active layer sandwiched between first and second semiconductor layers of opposite types
Materials:GaNGaN
Why these are connected
Related documents with shared materials, methods, properties, or citations.
GaN LEDs with Improved Area and Method for Making the Same
Long Yang
US
Claims
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
5 independent · 9 dependent
1
Independentlight emitting device (LED)
1. A device comprising: an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; a mirror layer in contact with a surface of said second semiconductor layer that is not in contact with said active layer, said mirror having a surface area substantially equal to that of said active layer; and a base member having a first surface in contact with said mirror layer and having an area substantially equal to that of said mirror layer, said base member having a cross-sectional area at locations distal from said first surface, said cross-section area being less than said area of said first surface.
The device of Claim 1 wherein said mirror is in contact with a layer of eutectic metal.
2
IndependentGaNlight emitting device (LED)
The device of Claim I wherein said f irst layer comprises an n-GaN layer with a surface that includes scattering features having dimensions greater than said predetermined wavelength.
3
Independentlight emitting device (LED)
The device of Claim I wherein said base member has a thickness greater than 100 pm.
The device of Claim 3 wherein said base member comprises a metal. SUBSTITUTE SPECIFICATION-CLEAN D ocket No. 5501 8 2
4
Independentlight emitting device (LED)
The device of Claim I wherein said base member comprises an electrical conductor.
5
Dependent← claim 4Silight emitting device (LED)
The device of Claim 4 wherein said electrical conductor is crystalline silicon.
9
Independent
A method for fab r icating a light emitting device, said method comprising: epitaxially growing a light emitting layer on a first substrate, said light emitting layer comprising an active layer sandwiched between first and second semiconductor layers of opposite types, said active layer emitting light of a predetermined wavelength when holes and electrons combine therein; depositing a reflective layer on a surface of said first semiconductor layer; bonding said reflective layer to a first surface of a conducting substrate; removing first substrate to form a structure bonded to said conducting substrate; processing a surface of said second semiconductor layer to provide a first trench extending from said surface of said second semiconductor layer through said structure: and processing a second surface of said conducting substrate to provide a second trench that extends from that surface to said trench.
10
Dependent← claim 9
The method of Claim 9 wherein said first trench has a width of less than 10 pim.
11
Dependent← claim 9
1 1. The method of Claim 9 wherein said second trench is wider than said first trench.
12
Dependent← claim 9
The method of Claim 9 further comprising depositing a patte rn ed metal layer on said reflective layer, said patterned metal layer having openings positioned under said first trench, said openings providing said second trench. SUBSTITUTE SPECIFICATION-CLEAN D ocke t No. 5501 8 3
13
Dependent← claim 9eutectic metal
The method of Claim 9 wherein bonding said comprises d epositing a patterned eutectic metal bonding to a surface of said conducting substrate, openings under said first trench.
14
Dependent← claim 9
The method of Claim 9 wherein said first
15
Dependent← claim 9
The method of Claim 9 wherein processing said further comprises introducing scattering features greater than said predetermined wavelength. reflective layer to said conducting substrate layer on said reflective layer, said eut ectic metal said patterned eutectic layer comprising substrate is a silicon wafer. surface of said second semiconductor layer in said surface, said features having dimensions
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
light emitting device (LED)
GaNfirst semiconductor layer n-type
activelayeractive layer
GaNsecond semiconductor layer p-type
mirrorlayermirror layer
basememberbase member
Materials
Materials described outside the worked examples.
n-GaN
GaN
First Semiconductor Layer
Second Semiconductor Layer
crystalline silicon
Si
Process steps
Additional fabrication and treatment steps described in the patent.
1
Epitaxial Growth
Step 1
Process details
substrate:first substrate
layers grown:active layer sandwiched between first and second semiconductor layers of opposite types
Materials:GaNGaN
Why these are connected
Related documents with shared materials, methods, properties, or citations.