Abstract

This review provides a comprehensive examination of the role of Spectroscopic Ellipsometry (SE) in elucidating the optical properties of two-dimensional (2D) materials, including graphene, monolayer and multilayer transition-metal dichalcogenides (TMDs), and related organic thin films. By synthesizing experimental methodologies, fundamental ellipsometric principles, optical modeling strategies, and advanced analytical approaches, this work highlights the exceptional capability of SE to resolve dielectric functions, excitonic resonances, optical anisotropy, interlayer interactions, and substrate-induced effects. Recent studies demonstrate SE’s effectiveness in revealing key phenomena such as environment- and synthesis-dependent excitonic shifts, redshifted π→π* transitions in graphene on nickel, high refractive indices in multilayer TMDs, and naturally occurring hyperbolic dispersion in metallic TMDs. Despite its strengths, SE remains constrained by model dependency, limited spatial resolution, and the challenges posed by non-ideal or structurally complex samples.

Abstract

This review provides a comprehensive examination of the role of Spectroscopic Ellipsometry (SE) in elucidating the optical properties of two-dimensional (2D) materials, including graphene, monolayer and multilayer transition-metal dichalcogenides (TMDs), and related organic thin films. By synthesizing experimental methodologies, fundamental ellipsometric principles, optical modeling strategies, and advanced analytical approaches, this work highlights the exceptional capability of SE to resolve dielectric functions, excitonic resonances, optical anisotropy, interlayer interactions, and substrate-induced effects. Recent studies demonstrate SE’s effectiveness in revealing key phenomena such as environment- and synthesis-dependent excitonic shifts, redshifted π→π* transitions in graphene on nickel, high refractive indices in multilayer TMDs, and naturally occurring hyperbolic dispersion in metallic TMDs. Despite its strengths, SE remains constrained by model dependency, limited spatial resolution, and the challenges posed by non-ideal or structurally complex samples.

Abstract

This review provides a comprehensive examination of the role of Spectroscopic Ellipsometry (SE) in elucidating the optical properties of two-dimensional (2D) materials, including graphene, monolayer and multilayer transition-metal dichalcogenides (TMDs), and related organic thin films. By synthesizing experimental methodologies, fundamental ellipsometric principles, optical modeling strategies, and advanced analytical approaches, this work highlights the exceptional capability of SE to resolve dielectric functions, excitonic resonances, optical anisotropy, interlayer interactions, and substrate-induced effects. Recent studies demonstrate SE’s effectiveness in revealing key phenomena such as environment- and synthesis-dependent excitonic shifts, redshifted π→π* transitions in graphene on nickel, high refractive indices in multilayer TMDs, and naturally occurring hyperbolic dispersion in metallic TMDs. Despite its strengths, SE remains constrained by model dependency, limited spatial resolution, and the challenges posed by non-ideal or structurally complex samples.

Abstract

This review provides a comprehensive examination of the role of Spectroscopic Ellipsometry (SE) in elucidating the optical properties of two-dimensional (2D) materials, including graphene, monolayer and multilayer transition-metal dichalcogenides (TMDs), and related organic thin films. By synthesizing experimental methodologies, fundamental ellipsometric principles, optical modeling strategies, and advanced analytical approaches, this work highlights the exceptional capability of SE to resolve dielectric functions, excitonic resonances, optical anisotropy, interlayer interactions, and substrate-induced effects. Recent studies demonstrate SE’s effectiveness in revealing key phenomena such as environment- and synthesis-dependent excitonic shifts, redshifted π→π* transitions in graphene on nickel, high refractive indices in multilayer TMDs, and naturally occurring hyperbolic dispersion in metallic TMDs. Despite its strengths, SE remains constrained by model dependency, limited spatial resolution, and the challenges posed by non-ideal or structurally complex samples.