Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | quantum dot thickness | 5nm | — | |||
| Substrate Thickness | quantum dot diameter | 20nm | — | |||
| Fet On Off Ratio | g(2)(0) | 0.078 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.03 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.21 | — | |||
| PL Peak | regex-detected PL peak | 790nm | — | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | quantum dot thickness | 5nm | — | |||
| Substrate Thickness | quantum dot diameter | 20nm | — | |||
| Fet On Off Ratio | g(2)(0) | 0.078 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.03 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.21 | — | |||
| PL Peak | regex-detected PL peak | 790nm | — | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | quantum dot thickness | 5nm | — | |||
| Substrate Thickness | quantum dot diameter | 20nm | — | |||
| Fet On Off Ratio | g(2)(0) | 0.078 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.03 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.21 | — | |||
| PL Peak | regex-detected PL peak | 790nm | — | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | quantum dot thickness | 5nm | — | |||
| Substrate Thickness | quantum dot diameter | 20nm | — | |||
| Fet On Off Ratio | g(2)(0) | 0.078 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.03 | — | |||
| Fet On Off Ratio | g(2)(0) | 0.21 | — | |||
| PL Peak | regex-detected PL peak | 790nm | — | — | — | — |