Patent
US 11,239,348GaN
SiC substrate
SiC
Si substrate
Si
sapphire substrate
Al₂O₃
diamond substrate
C
InAlN interfacial layer
InAlN
InGaN interfacial layer
InGaN
InN interfacial layer
InN
| ≤ 0.1 eV |
GaAsGaN |
Temperature | ≤ 300 °C | — |
— | ≤ 0.15 eV | — |
GaN
SiC substrate
SiC
Si substrate
Si
sapphire substrate
Al₂O₃
diamond substrate
C
InAlN interfacial layer
InAlN
InGaN interfacial layer
InGaN
InN interfacial layer
InN
| ≤ 0.1 eV |
GaAsGaN |
Temperature | ≤ 300 °C | — |
— | ≤ 0.15 eV | — |
GaN
SiC substrate
SiC
Si substrate
Si
sapphire substrate
Al₂O₃
diamond substrate
C
InAlN interfacial layer
InAlN
InGaN interfacial layer
InGaN
InN interfacial layer
InN
| ≤ 0.1 eV |
GaAsGaN |
Temperature | ≤ 300 °C | — |
— | ≤ 0.15 eV | — |
GaN
SiC substrate
SiC
Si substrate
Si
sapphire substrate
Al₂O₃
diamond substrate
C
InAlN interfacial layer
InAlN
InGaN interfacial layer
InGaN
InN interfacial layer
InN
| ≤ 0.1 eV |
GaAsGaN |
Temperature | ≤ 300 °C | — |
— | ≤ 0.15 eV | — |