SUBSTRATE HAVING THIN FILM OF GAN JOINED THEREON AND METHOD OF FABRICATING THE SAME, AND A GAN-BASED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | Matter42 Literature
Patent
Atlas literature
Patent
US 8,143,140
SUBSTRATE HAVING THIN FILM OF GAN JOINED THEREON AND METHOD OF FABRICATING THE SAME, AND A GAN-BASED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
8 independent · 4 dependent
1
IndependentGaNsubstrate different in type from GaNthin GaN film-joined substrate
A method of producing a thin GaN film-joined substrate, the method comprising the steps of: joining on a GaN bulk crystalline body a substrate different in type, different in chemical composition from GaN; and dividing said GaN bulk crystalline body at a plane having a distance of at least 0.1 pm and at most 100 p m from an interface thereof with said substrate different in type, to provide a thin film of GaN on said substrate different in type, wherein said GaN bulk crystalline body had a surface joined to said substrate different in type, that has a maximum surface roughness Rmax of at most 20 m and an off-angle formed by said surface of said GaN bulk crystalline body to be joined and a (0001) plane of said GaN bulk crystalline body is at least 0.03 0 and at most 20 °.
2
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, further comprising the step of implanting a type of ions selected from the group consisting of hydrogen ions, helium ions and nitrogen ions into said GaN bulk crystalline body at said plane located at a depth of at least 0.1 p m and at most 100 p m from said surface of said GaN bulk crystalline body that is to be joined, before the step of joining said substrate different in type on said GaN bulk crystalline body, wherein the step of dividing said GaN bulk crystalline body includes subjecting said GaN bulk crystalline body to a heat treatment.
3
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, wherein the step of dividing said GaN bulk crystalline body includes cutting said GaN bulk crystalline body at said plane having said distance of at least 0.1 p m and at most 100 p m from said interface thereof with said substrate different in type.
A method of fabricating a first GaN-based semiconductor device with a thin GaN film-joined substrate obtained in the method of claim 1, comprising the step of growing at least one GaN-based semiconductor layer on the thin film of GaN of the thin GaN film-joined substrate.
5
IndependentGaNsubstrate different in type from GaNGaN-based semiconductor layerradiating and electrically conductive substratefirst GaN-based semiconductor devicesecond GaN-based semiconductor device
A method of fabricating a second GaN-based semiconductor device utilizing the first GaN-based semiconductor device obtained in the method of radiating and electrically conductive substrate on semiconductor layer of said first GaN-based GaN and the substrate different in type from each
6
Independent
Claims 6-12 canceled
7
Independent
canceled
8
Independent
canceled
9
Independent
canceled
10
Independent
canceled
11
Independent
canceled
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
thin GaN film-joined substrate
GaNthin film
substrate different in type from GaNsupport substrate
SUBSTRATE HAVING THIN FILM OF GAN JOINED THEREON AND METHOD OF FABRICATING THE SAME, AND A GAN-BASED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
8 independent · 4 dependent
1
IndependentGaNsubstrate different in type from GaNthin GaN film-joined substrate
A method of producing a thin GaN film-joined substrate, the method comprising the steps of: joining on a GaN bulk crystalline body a substrate different in type, different in chemical composition from GaN; and dividing said GaN bulk crystalline body at a plane having a distance of at least 0.1 pm and at most 100 p m from an interface thereof with said substrate different in type, to provide a thin film of GaN on said substrate different in type, wherein said GaN bulk crystalline body had a surface joined to said substrate different in type, that has a maximum surface roughness Rmax of at most 20 m and an off-angle formed by said surface of said GaN bulk crystalline body to be joined and a (0001) plane of said GaN bulk crystalline body is at least 0.03 0 and at most 20 °.
2
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, further comprising the step of implanting a type of ions selected from the group consisting of hydrogen ions, helium ions and nitrogen ions into said GaN bulk crystalline body at said plane located at a depth of at least 0.1 p m and at most 100 p m from said surface of said GaN bulk crystalline body that is to be joined, before the step of joining said substrate different in type on said GaN bulk crystalline body, wherein the step of dividing said GaN bulk crystalline body includes subjecting said GaN bulk crystalline body to a heat treatment.
3
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, wherein the step of dividing said GaN bulk crystalline body includes cutting said GaN bulk crystalline body at said plane having said distance of at least 0.1 p m and at most 100 p m from said interface thereof with said substrate different in type.
A method of fabricating a first GaN-based semiconductor device with a thin GaN film-joined substrate obtained in the method of claim 1, comprising the step of growing at least one GaN-based semiconductor layer on the thin film of GaN of the thin GaN film-joined substrate.
5
IndependentGaNsubstrate different in type from GaNGaN-based semiconductor layerradiating and electrically conductive substratefirst GaN-based semiconductor devicesecond GaN-based semiconductor device
A method of fabricating a second GaN-based semiconductor device utilizing the first GaN-based semiconductor device obtained in the method of radiating and electrically conductive substrate on semiconductor layer of said first GaN-based GaN and the substrate different in type from each
6
Independent
Claims 6-12 canceled
7
Independent
canceled
8
Independent
canceled
9
Independent
canceled
10
Independent
canceled
11
Independent
canceled
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
thin GaN film-joined substrate
GaNthin film
substrate different in type from GaNsupport substrate
SUBSTRATE HAVING THIN FILM OF GAN JOINED THEREON AND METHOD OF FABRICATING THE SAME, AND A GAN-BASED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
8 independent · 4 dependent
1
IndependentGaNsubstrate different in type from GaNthin GaN film-joined substrate
A method of producing a thin GaN film-joined substrate, the method comprising the steps of: joining on a GaN bulk crystalline body a substrate different in type, different in chemical composition from GaN; and dividing said GaN bulk crystalline body at a plane having a distance of at least 0.1 pm and at most 100 p m from an interface thereof with said substrate different in type, to provide a thin film of GaN on said substrate different in type, wherein said GaN bulk crystalline body had a surface joined to said substrate different in type, that has a maximum surface roughness Rmax of at most 20 m and an off-angle formed by said surface of said GaN bulk crystalline body to be joined and a (0001) plane of said GaN bulk crystalline body is at least 0.03 0 and at most 20 °.
2
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, further comprising the step of implanting a type of ions selected from the group consisting of hydrogen ions, helium ions and nitrogen ions into said GaN bulk crystalline body at said plane located at a depth of at least 0.1 p m and at most 100 p m from said surface of said GaN bulk crystalline body that is to be joined, before the step of joining said substrate different in type on said GaN bulk crystalline body, wherein the step of dividing said GaN bulk crystalline body includes subjecting said GaN bulk crystalline body to a heat treatment.
3
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, wherein the step of dividing said GaN bulk crystalline body includes cutting said GaN bulk crystalline body at said plane having said distance of at least 0.1 p m and at most 100 p m from said interface thereof with said substrate different in type.
A method of fabricating a first GaN-based semiconductor device with a thin GaN film-joined substrate obtained in the method of claim 1, comprising the step of growing at least one GaN-based semiconductor layer on the thin film of GaN of the thin GaN film-joined substrate.
5
IndependentGaNsubstrate different in type from GaNGaN-based semiconductor layerradiating and electrically conductive substratefirst GaN-based semiconductor devicesecond GaN-based semiconductor device
A method of fabricating a second GaN-based semiconductor device utilizing the first GaN-based semiconductor device obtained in the method of radiating and electrically conductive substrate on semiconductor layer of said first GaN-based GaN and the substrate different in type from each
6
Independent
Claims 6-12 canceled
7
Independent
canceled
8
Independent
canceled
9
Independent
canceled
10
Independent
canceled
11
Independent
canceled
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
thin GaN film-joined substrate
GaNthin film
substrate different in type from GaNsupport substrate
SUBSTRATE HAVING THIN FILM OF GAN JOINED THEREON AND METHOD OF FABRICATING THE SAME, AND A GAN-BASED SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
8 independent · 4 dependent
1
IndependentGaNsubstrate different in type from GaNthin GaN film-joined substrate
A method of producing a thin GaN film-joined substrate, the method comprising the steps of: joining on a GaN bulk crystalline body a substrate different in type, different in chemical composition from GaN; and dividing said GaN bulk crystalline body at a plane having a distance of at least 0.1 pm and at most 100 p m from an interface thereof with said substrate different in type, to provide a thin film of GaN on said substrate different in type, wherein said GaN bulk crystalline body had a surface joined to said substrate different in type, that has a maximum surface roughness Rmax of at most 20 m and an off-angle formed by said surface of said GaN bulk crystalline body to be joined and a (0001) plane of said GaN bulk crystalline body is at least 0.03 0 and at most 20 °.
2
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, further comprising the step of implanting a type of ions selected from the group consisting of hydrogen ions, helium ions and nitrogen ions into said GaN bulk crystalline body at said plane located at a depth of at least 0.1 p m and at most 100 p m from said surface of said GaN bulk crystalline body that is to be joined, before the step of joining said substrate different in type on said GaN bulk crystalline body, wherein the step of dividing said GaN bulk crystalline body includes subjecting said GaN bulk crystalline body to a heat treatment.
3
Dependent← claim 1GaN
The method of producing said thin GaN film-joined substrate according to claim 1, wherein the step of dividing said GaN bulk crystalline body includes cutting said GaN bulk crystalline body at said plane having said distance of at least 0.1 p m and at most 100 p m from said interface thereof with said substrate different in type.
A method of fabricating a first GaN-based semiconductor device with a thin GaN film-joined substrate obtained in the method of claim 1, comprising the step of growing at least one GaN-based semiconductor layer on the thin film of GaN of the thin GaN film-joined substrate.
5
IndependentGaNsubstrate different in type from GaNGaN-based semiconductor layerradiating and electrically conductive substratefirst GaN-based semiconductor devicesecond GaN-based semiconductor device
A method of fabricating a second GaN-based semiconductor device utilizing the first GaN-based semiconductor device obtained in the method of radiating and electrically conductive substrate on semiconductor layer of said first GaN-based GaN and the substrate different in type from each
6
Independent
Claims 6-12 canceled
7
Independent
canceled
8
Independent
canceled
9
Independent
canceled
10
Independent
canceled
11
Independent
canceled
Device structures
Layer stacks claimed or described, ordered top of device to substrate.
thin GaN film-joined substrate
GaNthin film
substrate different in type from GaNsupport substrate