Patent
US 9,153,742GaN |
oxygen concentration — first crystal region (claim 2 preferred) | ≤ 100000000000000000 atoms/cm3 | GaN |
carbon concentration — second crystal region (claim 2 preferred) | ≤ 20000000000000000 atoms/cm3 | GaN |
silicon concentration — second crystal region (claim 2 preferred) | ≤ 500000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 2 preferred) | 500000000000000000–2000000000000000000 atoms/cm3 | GaN |
carbon concentration — first crystal region (claim 3) | ≤ 50000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 3) | 500000000000000000–5000000000000000000 atoms/cm3 | GaN |
average dislocation density (preferred upper bound) | ≤ 3000000 cm⁻² | GaN |
radius of curvature of crystal plane (preferred) | ≥ 10 m | GaN |
Thickness | 1–1.5 mm | — |
GaN |
oxygen concentration — first crystal region (claim 2 preferred) | ≤ 100000000000000000 atoms/cm3 | GaN |
carbon concentration — second crystal region (claim 2 preferred) | ≤ 20000000000000000 atoms/cm3 | GaN |
silicon concentration — second crystal region (claim 2 preferred) | ≤ 500000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 2 preferred) | 500000000000000000–2000000000000000000 atoms/cm3 | GaN |
carbon concentration — first crystal region (claim 3) | ≤ 50000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 3) | 500000000000000000–5000000000000000000 atoms/cm3 | GaN |
average dislocation density (preferred upper bound) | ≤ 3000000 cm⁻² | GaN |
radius of curvature of crystal plane (preferred) | ≥ 10 m | GaN |
Thickness | 1–1.5 mm | — |
GaN |
oxygen concentration — first crystal region (claim 2 preferred) | ≤ 100000000000000000 atoms/cm3 | GaN |
carbon concentration — second crystal region (claim 2 preferred) | ≤ 20000000000000000 atoms/cm3 | GaN |
silicon concentration — second crystal region (claim 2 preferred) | ≤ 500000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 2 preferred) | 500000000000000000–2000000000000000000 atoms/cm3 | GaN |
carbon concentration — first crystal region (claim 3) | ≤ 50000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 3) | 500000000000000000–5000000000000000000 atoms/cm3 | GaN |
average dislocation density (preferred upper bound) | ≤ 3000000 cm⁻² | GaN |
radius of curvature of crystal plane (preferred) | ≥ 10 m | GaN |
Thickness | 1–1.5 mm | — |
GaN |
oxygen concentration — first crystal region (claim 2 preferred) | ≤ 100000000000000000 atoms/cm3 | GaN |
carbon concentration — second crystal region (claim 2 preferred) | ≤ 20000000000000000 atoms/cm3 | GaN |
silicon concentration — second crystal region (claim 2 preferred) | ≤ 500000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 2 preferred) | 500000000000000000–2000000000000000000 atoms/cm3 | GaN |
carbon concentration — first crystal region (claim 3) | ≤ 50000000000000000 atoms/cm3 | GaN |
oxygen concentration — second crystal region (claim 3) | 500000000000000000–5000000000000000000 atoms/cm3 | GaN |
average dislocation density (preferred upper bound) | ≤ 3000000 cm⁻² | GaN |
radius of curvature of crystal plane (preferred) | ≥ 10 m | GaN |
Thickness | 1–1.5 mm | — |