Patent
US 8,753,918Pd/Ge/Ti/Pd/Ag/Au metal contact stack
InGa(Al)P top subcell
InGaAs bottom subcell
InGaAlAs graded interlayer
(InxGa₁-x)yAl₁-yAs graded interlayer
III-V compound semiconductor
FIG. 1 is a graph representing the bandgap of certain binary materials and their lattice constants; [027]
FIG. 14B a ft er the next process step in a third embodiment of the present invention; [045] FIG 16 is a graph of the doping profile in a base layer in the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
| 0.000005 ohms-cm2 |
GaAsGePd |
specific contact resistance (claim 82 target) | 0.0002 ohms-cm2 | GaAsGePd |
— | 1.8–2.1 eV | — |
— | 1.2–1.8 eV | — |
— | 0.7–1.2 eV | — |
— | 1.8–1.9 eV | — |
Pd/Ge/Ti/Pd/Ag/Au metal contact stack
InGa(Al)P top subcell
InGaAs bottom subcell
InGaAlAs graded interlayer
(InxGa₁-x)yAl₁-yAs graded interlayer
III-V compound semiconductor
FIG. 1 is a graph representing the bandgap of certain binary materials and their lattice constants; [027]
FIG. 14B a ft er the next process step in a third embodiment of the present invention; [045] FIG 16 is a graph of the doping profile in a base layer in the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
| 0.000005 ohms-cm2 |
GaAsGePd |
specific contact resistance (claim 82 target) | 0.0002 ohms-cm2 | GaAsGePd |
— | 1.8–2.1 eV | — |
— | 1.2–1.8 eV | — |
— | 0.7–1.2 eV | — |
— | 1.8–1.9 eV | — |
Pd/Ge/Ti/Pd/Ag/Au metal contact stack
InGa(Al)P top subcell
InGaAs bottom subcell
InGaAlAs graded interlayer
(InxGa₁-x)yAl₁-yAs graded interlayer
III-V compound semiconductor
FIG. 1 is a graph representing the bandgap of certain binary materials and their lattice constants; [027]
FIG. 14B a ft er the next process step in a third embodiment of the present invention; [045] FIG 16 is a graph of the doping profile in a base layer in the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
| 0.000005 ohms-cm2 |
GaAsGePd |
specific contact resistance (claim 82 target) | 0.0002 ohms-cm2 | GaAsGePd |
— | 1.8–2.1 eV | — |
— | 1.2–1.8 eV | — |
— | 0.7–1.2 eV | — |
— | 1.8–1.9 eV | — |
Pd/Ge/Ti/Pd/Ag/Au metal contact stack
InGa(Al)P top subcell
InGaAs bottom subcell
InGaAlAs graded interlayer
(InxGa₁-x)yAl₁-yAs graded interlayer
III-V compound semiconductor
FIG. 1 is a graph representing the bandgap of certain binary materials and their lattice constants; [027]
FIG. 14B a ft er the next process step in a third embodiment of the present invention; [045] FIG 16 is a graph of the doping profile in a base layer in the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
FIG. 16 is a graph of a doping profile in the emitter and base layers in one or more subcells of the inverted metamo rph ic multijunction solar cell of the …
| 0.000005 ohms-cm2 |
GaAsGePd |
specific contact resistance (claim 82 target) | 0.0002 ohms-cm2 | GaAsGePd |
— | 1.8–2.1 eV | — |
— | 1.2–1.8 eV | — |
— | 0.7–1.2 eV | — |
— | 1.8–1.9 eV | — |