Abstract

A monolithically integrated wavelength meter in InP based on multiple ring resonators is presented and experimentally tested with a tunable laser. The device uses phase-shifted microring resonators with different lengths to extend the measurable wavelength range, and a calibration procedure is used to map resonant voltages to wavelength. The designed circuit is theoretically capable of 1.6 pm resolution, 500 ps measurement speed, and 100 nm measurement bandwidth.

Abstract

A monolithically integrated wavelength meter in InP based on multiple ring resonators is presented and experimentally tested with a tunable laser. The device uses phase-shifted microring resonators with different lengths to extend the measurable wavelength range, and a calibration procedure is used to map resonant voltages to wavelength. The designed circuit is theoretically capable of 1.6 pm resolution, 500 ps measurement speed, and 100 nm measurement bandwidth.

Abstract

A monolithically integrated wavelength meter in InP based on multiple ring resonators is presented and experimentally tested with a tunable laser. The device uses phase-shifted microring resonators with different lengths to extend the measurable wavelength range, and a calibration procedure is used to map resonant voltages to wavelength. The designed circuit is theoretically capable of 1.6 pm resolution, 500 ps measurement speed, and 100 nm measurement bandwidth.

Abstract

A monolithically integrated wavelength meter in InP based on multiple ring resonators is presented and experimentally tested with a tunable laser. The device uses phase-shifted microring resonators with different lengths to extend the measurable wavelength range, and a calibration procedure is used to map resonant voltages to wavelength. The designed circuit is theoretically capable of 1.6 pm resolution, 500 ps measurement speed, and 100 nm measurement bandwidth.