Research paper
Experimental GrowthExperimental CharacterizationComputational MDEach sample groups how it was prepared, characterized, and measured. Click a card to expand.
5 preparations4 characterizations21 properties2 figures
1 property
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | Pt substrate thickness | 1.2nm | — | |||
| Diffusion Activation Energy | H₂ diffusion in vdW gap | 0.47eV | — | |||
| Diffusion Activation Energy | CO diffusion in vdW gap | 0.43eV | — | |||
| Diffusion Activation Energy | O₂ diffusion in vdW gap | 0.7eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Peak Fwhm | C 1s | 1.06eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.1eV | — | |||
| Xps Peak Fwhm | C 1s | 1.1eV | — | |||
| Xps Binding Energy | C 1s | 286.4eV | — | |||
| Xps Peak Fwhm | C 1s | 1.87eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.2eV | — | |||
| Xps Peak Fwhm | C 1s | 2.05eV | — | |||
| Xps Binding Energy | O 1s | 532.08eV | — | |||
| Xps Peak Fwhm | O 1s | 3.47eV | — | |||
| Xps Binding Energy Shift | O 1s | 0.37eV | — | |||
| Xps Peak Fwhm | O 1s | 2.6eV | — | |||
| Xps Binding Energy | Pt 4p3/2 | 519.23eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 5.01eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.28eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.53eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.08eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.78eV | — |
Related documents with shared materials, methods, properties, or citations.
Sub-wavelength mid-infrared imaging of locally driven photocurrents using diamond campanile probes
Impact of Nitrogen Atom Clusters and Vacancy Defects on Graphene: A Molecular Dynamics Investigation
Copper Vapor Catalyzing Role in the Growth of Graphene
VERTICALLY ORIENTED GRAPHENE NANOSHEETS ON ALUMINUM ELECTRODES
Diffraction of helium and hydrogen atoms through single-layer graphene
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
5 preparations4 characterizations21 properties2 figures
1 property
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | Pt substrate thickness | 1.2nm | — | |||
| Diffusion Activation Energy | H₂ diffusion in vdW gap | 0.47eV | — | |||
| Diffusion Activation Energy | CO diffusion in vdW gap | 0.43eV | — | |||
| Diffusion Activation Energy | O₂ diffusion in vdW gap | 0.7eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Peak Fwhm | C 1s | 1.06eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.1eV | — | |||
| Xps Peak Fwhm | C 1s | 1.1eV | — | |||
| Xps Binding Energy | C 1s | 286.4eV | — | |||
| Xps Peak Fwhm | C 1s | 1.87eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.2eV | — | |||
| Xps Peak Fwhm | C 1s | 2.05eV | — | |||
| Xps Binding Energy | O 1s | 532.08eV | — | |||
| Xps Peak Fwhm | O 1s | 3.47eV | — | |||
| Xps Binding Energy Shift | O 1s | 0.37eV | — | |||
| Xps Peak Fwhm | O 1s | 2.6eV | — | |||
| Xps Binding Energy | Pt 4p3/2 | 519.23eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 5.01eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.28eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.53eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.08eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.78eV | — |
Related documents with shared materials, methods, properties, or citations.
Sub-wavelength mid-infrared imaging of locally driven photocurrents using diamond campanile probes
Impact of Nitrogen Atom Clusters and Vacancy Defects on Graphene: A Molecular Dynamics Investigation
Copper Vapor Catalyzing Role in the Growth of Graphene
VERTICALLY ORIENTED GRAPHENE NANOSHEETS ON ALUMINUM ELECTRODES
Diffraction of helium and hydrogen atoms through single-layer graphene
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
5 preparations4 characterizations21 properties2 figures
1 property
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | Pt substrate thickness | 1.2nm | — | |||
| Diffusion Activation Energy | H₂ diffusion in vdW gap | 0.47eV | — | |||
| Diffusion Activation Energy | CO diffusion in vdW gap | 0.43eV | — | |||
| Diffusion Activation Energy | O₂ diffusion in vdW gap | 0.7eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Peak Fwhm | C 1s | 1.06eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.1eV | — | |||
| Xps Peak Fwhm | C 1s | 1.1eV | — | |||
| Xps Binding Energy | C 1s | 286.4eV | — | |||
| Xps Peak Fwhm | C 1s | 1.87eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.2eV | — | |||
| Xps Peak Fwhm | C 1s | 2.05eV | — | |||
| Xps Binding Energy | O 1s | 532.08eV | — | |||
| Xps Peak Fwhm | O 1s | 3.47eV | — | |||
| Xps Binding Energy Shift | O 1s | 0.37eV | — | |||
| Xps Peak Fwhm | O 1s | 2.6eV | — | |||
| Xps Binding Energy | Pt 4p3/2 | 519.23eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 5.01eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.28eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.53eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.08eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.78eV | — |
Related documents with shared materials, methods, properties, or citations.
Sub-wavelength mid-infrared imaging of locally driven photocurrents using diamond campanile probes
Impact of Nitrogen Atom Clusters and Vacancy Defects on Graphene: A Molecular Dynamics Investigation
Copper Vapor Catalyzing Role in the Growth of Graphene
VERTICALLY ORIENTED GRAPHENE NANOSHEETS ON ALUMINUM ELECTRODES
Diffraction of helium and hydrogen atoms through single-layer graphene
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
5 preparations4 characterizations21 properties2 figures
1 property
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | Pt substrate thickness | 1.2nm | — | |||
| Diffusion Activation Energy | H₂ diffusion in vdW gap | 0.47eV | — | |||
| Diffusion Activation Energy | CO diffusion in vdW gap | 0.43eV | — | |||
| Diffusion Activation Energy | O₂ diffusion in vdW gap | 0.7eV | — | |||
| Xps Binding Energy | C 1s | 283.9eV | — | |||
| Xps Peak Fwhm | C 1s | 1.06eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.1eV | — | |||
| Xps Peak Fwhm | C 1s | 1.1eV | — | |||
| Xps Binding Energy | C 1s | 286.4eV | — | |||
| Xps Peak Fwhm | C 1s | 1.87eV | — | |||
| Xps Binding Energy Shift | C 1s | 0.2eV | — | |||
| Xps Peak Fwhm | C 1s | 2.05eV | — | |||
| Xps Binding Energy | O 1s | 532.08eV | — | |||
| Xps Peak Fwhm | O 1s | 3.47eV | — | |||
| Xps Binding Energy Shift | O 1s | 0.37eV | — | |||
| Xps Peak Fwhm | O 1s | 2.6eV | — | |||
| Xps Binding Energy | Pt 4p3/2 | 519.23eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 5.01eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.28eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.53eV | — | |||
| Xps Binding Energy Shift | Pt 4p3/2 | -0.08eV | — | |||
| Xps Peak Fwhm | Pt 4p3/2 | 4.78eV | — |
Related documents with shared materials, methods, properties, or citations.
Sub-wavelength mid-infrared imaging of locally driven photocurrents using diamond campanile probes
Impact of Nitrogen Atom Clusters and Vacancy Defects on Graphene: A Molecular Dynamics Investigation
Copper Vapor Catalyzing Role in the Growth of Graphene
VERTICALLY ORIENTED GRAPHENE NANOSHEETS ON ALUMINUM ELECTRODES
Diffraction of helium and hydrogen atoms through single-layer graphene
Kinetics micro-parameters not linked to a specific simulation record.
Kinetics micro-parameters not linked to a specific simulation record.
Kinetics micro-parameters not linked to a specific simulation record.
Kinetics micro-parameters not linked to a specific simulation record.