Patent
US 11,127,509methane precursor gas
CH₄
FIG. 4 is a characterization of Cu/graphene layer/Cu interface by atomic force microscopy according to an example. [0008]
FIG. 5 A shows a band structure and Fig. 5 B shows the density states for the dop ed AB- bila y er gra p hene according to an exam p le. [0009]
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 7 shows in-plane XRD patterns and cross-section optical images of single foils of pristine Cu, annealed Cu, and Gr/Cu according to an example. [0011]
FIG. 8 shows in-plane XRD patterns and cross-section optical images of hot- pressed multilayers of: pristine Cu, annealed Cu, and Gr/Cu according to an …
FIG. 9 is a schematic representation of the electrical conductivity measurement with the four-probe conductivity meter according to an example. [0013]
FIG. 10 shows XPS data for the annealed Cu single foil, and Cu single layer foil with chemically deposited graphene according to an example. [0014]
FIG. 12B shows electrical conductivity values of the samples of I, II and III. The sample II shows an electrical conductivity higher than that calculated from …
FIG. 13 is a schematic representation of the electrical properties measurement on the interface layers using the contact-current mode of a customized scanning …
| — |
CuCC |
graphene electron mobility in suspended monolayer | — | C |
Thickness | ≥ 200000 cm | — |
methane precursor gas
CH₄
FIG. 4 is a characterization of Cu/graphene layer/Cu interface by atomic force microscopy according to an example. [0008]
FIG. 5 A shows a band structure and Fig. 5 B shows the density states for the dop ed AB- bila y er gra p hene according to an exam p le. [0009]
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 7 shows in-plane XRD patterns and cross-section optical images of single foils of pristine Cu, annealed Cu, and Gr/Cu according to an example. [0011]
FIG. 8 shows in-plane XRD patterns and cross-section optical images of hot- pressed multilayers of: pristine Cu, annealed Cu, and Gr/Cu according to an …
FIG. 9 is a schematic representation of the electrical conductivity measurement with the four-probe conductivity meter according to an example. [0013]
FIG. 10 shows XPS data for the annealed Cu single foil, and Cu single layer foil with chemically deposited graphene according to an example. [0014]
FIG. 12B shows electrical conductivity values of the samples of I, II and III. The sample II shows an electrical conductivity higher than that calculated from …
FIG. 13 is a schematic representation of the electrical properties measurement on the interface layers using the contact-current mode of a customized scanning …
| — |
CuCC |
graphene electron mobility in suspended monolayer | — | C |
Thickness | ≥ 200000 cm | — |
methane precursor gas
CH₄
FIG. 4 is a characterization of Cu/graphene layer/Cu interface by atomic force microscopy according to an example. [0008]
FIG. 5 A shows a band structure and Fig. 5 B shows the density states for the dop ed AB- bila y er gra p hene according to an exam p le. [0009]
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 7 shows in-plane XRD patterns and cross-section optical images of single foils of pristine Cu, annealed Cu, and Gr/Cu according to an example. [0011]
FIG. 8 shows in-plane XRD patterns and cross-section optical images of hot- pressed multilayers of: pristine Cu, annealed Cu, and Gr/Cu according to an …
FIG. 9 is a schematic representation of the electrical conductivity measurement with the four-probe conductivity meter according to an example. [0013]
FIG. 10 shows XPS data for the annealed Cu single foil, and Cu single layer foil with chemically deposited graphene according to an example. [0014]
FIG. 12B shows electrical conductivity values of the samples of I, II and III. The sample II shows an electrical conductivity higher than that calculated from …
FIG. 13 is a schematic representation of the electrical properties measurement on the interface layers using the contact-current mode of a customized scanning …
| — |
CuCC |
graphene electron mobility in suspended monolayer | — | C |
Thickness | ≥ 200000 cm | — |
methane precursor gas
CH₄
FIG. 4 is a characterization of Cu/graphene layer/Cu interface by atomic force microscopy according to an example. [0008]
FIG. 5 A shows a band structure and Fig. 5 B shows the density states for the dop ed AB- bila y er gra p hene according to an exam p le. [0009]
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 6B shows a SEM image of graphene crystals on Cu foil prepared by chemical vapor deposition; and
FIG. 7 shows in-plane XRD patterns and cross-section optical images of single foils of pristine Cu, annealed Cu, and Gr/Cu according to an example. [0011]
FIG. 8 shows in-plane XRD patterns and cross-section optical images of hot- pressed multilayers of: pristine Cu, annealed Cu, and Gr/Cu according to an …
FIG. 9 is a schematic representation of the electrical conductivity measurement with the four-probe conductivity meter according to an example. [0013]
FIG. 10 shows XPS data for the annealed Cu single foil, and Cu single layer foil with chemically deposited graphene according to an example. [0014]
FIG. 12B shows electrical conductivity values of the samples of I, II and III. The sample II shows an electrical conductivity higher than that calculated from …
FIG. 13 is a schematic representation of the electrical properties measurement on the interface layers using the contact-current mode of a customized scanning …
| — |
CuCC |
graphene electron mobility in suspended monolayer | — | C |
Thickness | ≥ 200000 cm | — |