Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Ultralow-disorder GaAs quantum well sample with well width 30 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 40 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 50 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 70 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Ultralow-disorder GaAs quantum well sample with well width 30 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 40 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 50 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 70 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Ultralow-disorder GaAs quantum well sample with well width 30 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 40 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 50 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 70 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Ultralow-disorder GaAs quantum well sample with well width 30 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 40 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 50 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.
Ultralow-disorder GaAs quantum well sample with well width 70 nm and 280-nm-thick Al0.12Ga0.88As barriers on each side; used in rf conductivity measurements.