Research paper
Experimental Characterization| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 0.8nm | — | |||
| PL Peak | A₀ exciton | 615nm | — | |||
| Pl Peak Shift | trion binding energy | 43meV | — | |||
| Pl Peak Shift | trion binding energy | 44.8meV | — | |||
| Raman Peak | A1g | 418cm⁻¹ | — | |||
| Raman Peak | E2g/2LA | 350cm⁻¹ | — | |||
| Raman Peak | Si substrate peak | 521cm⁻¹ | — | |||
| Raman Mode Separation | A1g - E2g separation | 68cm⁻¹ | — | |||
| Pl Intensity Ratio | exciton-weight tuning range | 0.4 | — | |||
| Power Law Exponent | neutral exciton intensity vs pressure | 2.38 | — |
Kinetics micro-parameters not linked to a specific simulation record.
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 0.8nm | — | |||
| PL Peak | A₀ exciton | 615nm | — | |||
| Pl Peak Shift | trion binding energy | 43meV | — | |||
| Pl Peak Shift | trion binding energy | 44.8meV | — | |||
| Raman Peak | A1g | 418cm⁻¹ | — | |||
| Raman Peak | E2g/2LA | 350cm⁻¹ | — | |||
| Raman Peak | Si substrate peak | 521cm⁻¹ | — | |||
| Raman Mode Separation | A1g - E2g separation | 68cm⁻¹ | — | |||
| Pl Intensity Ratio | exciton-weight tuning range | 0.4 | — | |||
| Power Law Exponent | neutral exciton intensity vs pressure | 2.38 | — |
Kinetics micro-parameters not linked to a specific simulation record.
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 0.8nm | — | |||
| PL Peak | A₀ exciton | 615nm | — | |||
| Pl Peak Shift | trion binding energy | 43meV | — | |||
| Pl Peak Shift | trion binding energy | 44.8meV | — | |||
| Raman Peak | A1g | 418cm⁻¹ | — | |||
| Raman Peak | E2g/2LA | 350cm⁻¹ | — | |||
| Raman Peak | Si substrate peak | 521cm⁻¹ | — | |||
| Raman Mode Separation | A1g - E2g separation | 68cm⁻¹ | — | |||
| Pl Intensity Ratio | exciton-weight tuning range | 0.4 | — | |||
| Power Law Exponent | neutral exciton intensity vs pressure | 2.38 | — |
Kinetics micro-parameters not linked to a specific simulation record.
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Thickness | flake thickness | 0.8nm | — | |||
| PL Peak | A₀ exciton | 615nm | — | |||
| Pl Peak Shift | trion binding energy | 43meV | — | |||
| Pl Peak Shift | trion binding energy | 44.8meV | — | |||
| Raman Peak | A1g | 418cm⁻¹ | — | |||
| Raman Peak | E2g/2LA | 350cm⁻¹ | — | |||
| Raman Peak | Si substrate peak | 521cm⁻¹ | — | |||
| Raman Mode Separation | A1g - E2g separation | 68cm⁻¹ | — | |||
| Pl Intensity Ratio | exciton-weight tuning range | 0.4 | — | |||
| Power Law Exponent | neutral exciton intensity vs pressure | 2.38 | — |
Kinetics micro-parameters not linked to a specific simulation record.