Research paperExperimental CharacterizationFull Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency MicroscopyNiclas S. Mueller, Alexander P. Fellows, Ben John, Andrew E. Naclerio et al.2025·10.1002/adma.202510124·arXiv:2504.15939AbstractPhase-resolved sum-frequency microscopy is introduced for imaging monolayers of hexagonal boron nitride (hBN) grown by chemical vapor deposition and transferred to fused silica. Using a resonant mid-infrared excitation of the transverse optical phonon, the method yields strong enhancement of the sum-frequency signal, enabling fast wide-field imaging and full crystallographic information on monolayer hBN, including crystal orientation and edge termination.Read more
CVD-grown hBN monolayer flakes transferred to a fused silica substrate and imaged by phase-resolved sum-frequency microscopy.3 characterizations7 properties2 figuresExperimentalhBNStudied MaterialSiO₂Substrate / DielectricExpand
z-cut alpha quartz reference substrate used for phase and amplitude referencing in the sum-frequency measurements.1 characterization2 properties1 figureReferenceSiO₂Reference MaterialExpand
Research paperExperimental CharacterizationFull Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency MicroscopyNiclas S. Mueller, Alexander P. Fellows, Ben John, Andrew E. Naclerio et al.2025·10.1002/adma.202510124·arXiv:2504.15939AbstractPhase-resolved sum-frequency microscopy is introduced for imaging monolayers of hexagonal boron nitride (hBN) grown by chemical vapor deposition and transferred to fused silica. Using a resonant mid-infrared excitation of the transverse optical phonon, the method yields strong enhancement of the sum-frequency signal, enabling fast wide-field imaging and full crystallographic information on monolayer hBN, including crystal orientation and edge termination.Read more
CVD-grown hBN monolayer flakes transferred to a fused silica substrate and imaged by phase-resolved sum-frequency microscopy.3 characterizations7 properties2 figuresExperimentalhBNStudied MaterialSiO₂Substrate / DielectricExpand
z-cut alpha quartz reference substrate used for phase and amplitude referencing in the sum-frequency measurements.1 characterization2 properties1 figureReferenceSiO₂Reference MaterialExpand
Research paperExperimental CharacterizationFull Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency MicroscopyNiclas S. Mueller, Alexander P. Fellows, Ben John, Andrew E. Naclerio et al.2025·10.1002/adma.202510124·arXiv:2504.15939AbstractPhase-resolved sum-frequency microscopy is introduced for imaging monolayers of hexagonal boron nitride (hBN) grown by chemical vapor deposition and transferred to fused silica. Using a resonant mid-infrared excitation of the transverse optical phonon, the method yields strong enhancement of the sum-frequency signal, enabling fast wide-field imaging and full crystallographic information on monolayer hBN, including crystal orientation and edge termination.Read more
CVD-grown hBN monolayer flakes transferred to a fused silica substrate and imaged by phase-resolved sum-frequency microscopy.3 characterizations7 properties2 figuresExperimentalhBNStudied MaterialSiO₂Substrate / DielectricExpand
z-cut alpha quartz reference substrate used for phase and amplitude referencing in the sum-frequency measurements.1 characterization2 properties1 figureReferenceSiO₂Reference MaterialExpand
Research paperExperimental CharacterizationFull Crystallographic Imaging of Hexagonal Boron Nitride Monolayers with Phonon-Enhanced Sum-Frequency MicroscopyNiclas S. Mueller, Alexander P. Fellows, Ben John, Andrew E. Naclerio et al.2025·10.1002/adma.202510124·arXiv:2504.15939AbstractPhase-resolved sum-frequency microscopy is introduced for imaging monolayers of hexagonal boron nitride (hBN) grown by chemical vapor deposition and transferred to fused silica. Using a resonant mid-infrared excitation of the transverse optical phonon, the method yields strong enhancement of the sum-frequency signal, enabling fast wide-field imaging and full crystallographic information on monolayer hBN, including crystal orientation and edge termination.Read more
CVD-grown hBN monolayer flakes transferred to a fused silica substrate and imaged by phase-resolved sum-frequency microscopy.3 characterizations7 properties2 figuresExperimentalhBNStudied MaterialSiO₂Substrate / DielectricExpand
z-cut alpha quartz reference substrate used for phase and amplitude referencing in the sum-frequency measurements.1 characterization2 properties1 figureReferenceSiO₂Reference MaterialExpand