Research paperExperimental CharacterizationComputed RamanRetrieving optical parameters of emerging van der Waals flakesMitradeep Sarkar, Michael T. Enders, Mehrdad Shokooh-Saremi, Kenji Watanabe et al.arXiv·2023·10.1117/12.789843·arXiv:2305.13994AbstractA method is presented to retrieve the in-plane complex dielectric permittivity of microscopic van der Waals flakes from FTIR reflectance measurements by identifying reflectance minima associated with Fabry-Perot resonances. The approach is demonstrated on exfoliated hexagonal boron nitride and α-MoO₃ flakes, using AFM thickness measurements and analytical reflectance calculations, and is shown to be more robust than fitting full reflectance spectra for small-area samples.Read more
Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.2 characterizations4 properties2 figuresExperimentalhBNStudied MaterialExpand
Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.1 characterization2 figuresExperimentalMoO₃Studied MaterialExpand
Research paperExperimental CharacterizationComputed RamanRetrieving optical parameters of emerging van der Waals flakesMitradeep Sarkar, Michael T. Enders, Mehrdad Shokooh-Saremi, Kenji Watanabe et al.arXiv·2023·10.1117/12.789843·arXiv:2305.13994AbstractA method is presented to retrieve the in-plane complex dielectric permittivity of microscopic van der Waals flakes from FTIR reflectance measurements by identifying reflectance minima associated with Fabry-Perot resonances. The approach is demonstrated on exfoliated hexagonal boron nitride and α-MoO₃ flakes, using AFM thickness measurements and analytical reflectance calculations, and is shown to be more robust than fitting full reflectance spectra for small-area samples.Read more
Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.2 characterizations4 properties2 figuresExperimentalhBNStudied MaterialExpand
Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.1 characterization2 figuresExperimentalMoO₃Studied MaterialExpand
Research paperExperimental CharacterizationComputed RamanRetrieving optical parameters of emerging van der Waals flakesMitradeep Sarkar, Michael T. Enders, Mehrdad Shokooh-Saremi, Kenji Watanabe et al.arXiv·2023·10.1117/12.789843·arXiv:2305.13994AbstractA method is presented to retrieve the in-plane complex dielectric permittivity of microscopic van der Waals flakes from FTIR reflectance measurements by identifying reflectance minima associated with Fabry-Perot resonances. The approach is demonstrated on exfoliated hexagonal boron nitride and α-MoO₃ flakes, using AFM thickness measurements and analytical reflectance calculations, and is shown to be more robust than fitting full reflectance spectra for small-area samples.Read more
Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.2 characterizations4 properties2 figuresExperimentalhBNStudied MaterialExpand
Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.1 characterization2 figuresExperimentalMoO₃Studied MaterialExpand
Research paperExperimental CharacterizationComputed RamanRetrieving optical parameters of emerging van der Waals flakesMitradeep Sarkar, Michael T. Enders, Mehrdad Shokooh-Saremi, Kenji Watanabe et al.arXiv·2023·10.1117/12.789843·arXiv:2305.13994AbstractA method is presented to retrieve the in-plane complex dielectric permittivity of microscopic van der Waals flakes from FTIR reflectance measurements by identifying reflectance minima associated with Fabry-Perot resonances. The approach is demonstrated on exfoliated hexagonal boron nitride and α-MoO₃ flakes, using AFM thickness measurements and analytical reflectance calculations, and is shown to be more robust than fitting full reflectance spectra for small-area samples.Read more
Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.2 characterizations4 properties2 figuresExperimentalhBNStudied MaterialExpand
Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.1 characterization2 figuresExperimentalMoO₃Studied MaterialExpand