Retrieving optical parameters of emerging van der Waals flakes

Mitradeep Sarkar; Michael T. Enders; Mehrdad Shokooh-Saremi; Kenji Watanabe; Takashi Taniguchi; Hanan Herzig Sheinfux; Frank H.L. Koppens; Georgia Theano Papadakis

doi:10.1117/12.789843

Paper details

Research paper

Experimental CharacterizationComputed Raman

Retrieving optical parameters of emerging van der Waals flakes

Mitradeep Sarkar, Michael T. Enders, Mehrdad Shokooh-Saremi, Kenji Watanabe et al.

arXiv·2023·10.1117/12.789843·arXiv:2305.13994

Samples

Each sample groups how it was prepared, characterized, and measured. Click a card to expand.

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

2 characterizations4 properties2 figures

ExperimentalhBNStudied Material

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

1 characterization2 figures

ExperimentalMoO₃Studied Material

Materials

hexagonal boron nitride

hBN

Studied Material

Also known as

hBN

studied material

alpha-MoO₃

MoO₃

Studied Material

Also known as

Why these are connected

Related documents with shared materials, methods, properties, or citations.

Retrieving optical parameters of emerging van der Waals flakes | Matter42 Literature

Properties

Type	Label	Value	Material	Sample	Condition	Source
Substrate Thickness	local flake thickness	95nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Substrate Thickness	local flake thickness	275nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Minimum Separation	\|Δωd\| between two measured minima	2cm⁻¹	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Difference	\|ΔR\| maximum difference	0.2	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Ir Band Position	IR band	888.5cm⁻¹	—	—	—	—
Ir Band Position	IR band	600cm⁻¹	—	—	—	—
Ir Band Position	IR band	813.3cm⁻¹	—	—	—	—

Properties

Type	Label	Value	Material	Sample	Condition	Source
Substrate Thickness	local flake thickness	95nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Substrate Thickness	local flake thickness	275nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Minimum Separation	\|Δωd\| between two measured minima	2cm⁻¹	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Difference	\|ΔR\| maximum difference	0.2	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Ir Band Position	IR band	888.5cm⁻¹	—	—	—	—
Ir Band Position	IR band	600cm⁻¹	—	—	—	—
Ir Band Position	IR band	813.3cm⁻¹	—	—	—	—

Properties

Type	Label	Value	Material	Sample	Condition	Source
Substrate Thickness	local flake thickness	95nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Substrate Thickness	local flake thickness	275nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Minimum Separation	\|Δωd\| between two measured minima	2cm⁻¹	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Difference	\|ΔR\| maximum difference	0.2	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Ir Band Position	IR band	888.5cm⁻¹	—	—	—	—
Ir Band Position	IR band	600cm⁻¹	—	—	—	—
Ir Band Position	IR band	813.3cm⁻¹	—	—	—	—

Properties

Type	Label	Value	Material	Sample	Condition	Source
Substrate Thickness	local flake thickness	95nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Substrate Thickness	local flake thickness	275nm	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Minimum Separation	\|Δωd\| between two measured minima	2cm⁻¹	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Reflectance Difference	\|ΔR\| maximum difference	0.2	hBN	Exfoliated hBN flake measured on a gold substrate; AFM revea		—
Ir Band Position	IR band	888.5cm⁻¹	—	—	—	—
Ir Band Position	IR band	600cm⁻¹	—	—	—	—
Ir Band Position	IR band	813.3cm⁻¹	—	—	—	—

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Retrieving optical parameters of emerging van der Waals flakes

Samples

Exfoliated hBN flake measured on a gold substrate; AFM reveals non-uniform thickness with two observed regions around 95 nm and 275 nm.

Exfoliated α-MoO₃ flake measured by FTIR microspectrometry on a gold substrate for dielectric-permittivity retrieval.

Materials

Why these are connected

Characterization

Properties

Simulations

Characterization

Properties

Simulations

Characterization

Properties

Simulations

Characterization

Properties

Simulations