Patent
US 10,665,678FinFET
No layer stack recorded.
gate all around (GAA) transistor
No layer stack recorded.
graphene
fluorographene
silicon boron carbon nitride (SiBCN)
SiBCN
| 5 |
SiBCN |
minimum fluorocarbon spacer thickness | 0.3 nm | fluorocarbon spacer |
Thickness | 1–2 nm | — |
Thickness | ≤ 9 nm | — |
Thickness | ≤ 4.5 nm | — |
Thickness | ≥ 0.3 nm | — |
FinFET
No layer stack recorded.
gate all around (GAA) transistor
No layer stack recorded.
graphene
fluorographene
silicon boron carbon nitride (SiBCN)
SiBCN
| 5 |
SiBCN |
minimum fluorocarbon spacer thickness | 0.3 nm | fluorocarbon spacer |
Thickness | 1–2 nm | — |
Thickness | ≤ 9 nm | — |
Thickness | ≤ 4.5 nm | — |
Thickness | ≥ 0.3 nm | — |
FinFET
No layer stack recorded.
gate all around (GAA) transistor
No layer stack recorded.
graphene
fluorographene
silicon boron carbon nitride (SiBCN)
SiBCN
| 5 |
SiBCN |
minimum fluorocarbon spacer thickness | 0.3 nm | fluorocarbon spacer |
Thickness | 1–2 nm | — |
Thickness | ≤ 9 nm | — |
Thickness | ≤ 4.5 nm | — |
Thickness | ≥ 0.3 nm | — |
FinFET
No layer stack recorded.
gate all around (GAA) transistor
No layer stack recorded.
graphene
fluorographene
silicon boron carbon nitride (SiBCN)
SiBCN
| 5 |
SiBCN |
minimum fluorocarbon spacer thickness | 0.3 nm | fluorocarbon spacer |
Thickness | 1–2 nm | — |
Thickness | ≤ 9 nm | — |
Thickness | ≤ 4.5 nm | — |
Thickness | ≥ 0.3 nm | — |