mqw count9
validation{"quantities":["forward voltage","turn-on voltage","current below turn-on"],"references":["Ref. [8]"],"techniques":["J-V"],"sourcetype":"literatureexperimentaldata"}
device typered InGaN MQW LED
ieq definitionintegrated recombination in QWs divided by total injected current
carrier overflowfalse
included physicsPoisson, drift-diffusion, localization_landscape_theory, Schrodinger_solver, random_alloy_fluctuations, tail_states, polarization_charge, radiative_recombination, Auger_Meitner_recombination, nonradiative_recombination
random alloy methodrandom number generator with Gaussian weighting over lattice sites
td center radius nm30
tail state distributionGaussian
current density A per cm220
v defect sidewall qb thickness nm3.62
v defect sidewall qw thickness nm0.67