Patent
US 10,145,005glass substrate
acetylene
C₂H₂
hydrogen
H₂
silicon oxide
SiO₂
helium ions
He
| — |
— | 40–150 W | — |
Thickness | 50–500 nm | — |
Thickness | 100–300 nm | — |
Thickness | 10–300 nm | — |
Thickness | 50–150 nm | — |
— | 250–750 W | — |
— | 4–5 eV | — |
Duration | 1–5 minutes | — |
Thickness | 200–300 nm | — |
Duration | ≤ 10 minutes | — |
Duration | ≥ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≥ 5 minutes | — |
glass substrate
acetylene
C₂H₂
hydrogen
H₂
silicon oxide
SiO₂
helium ions
He
| — |
— | 40–150 W | — |
Thickness | 50–500 nm | — |
Thickness | 100–300 nm | — |
Thickness | 10–300 nm | — |
Thickness | 50–150 nm | — |
— | 250–750 W | — |
— | 4–5 eV | — |
Duration | 1–5 minutes | — |
Thickness | 200–300 nm | — |
Duration | ≤ 10 minutes | — |
Duration | ≥ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≥ 5 minutes | — |
glass substrate
acetylene
C₂H₂
hydrogen
H₂
silicon oxide
SiO₂
helium ions
He
| — |
— | 40–150 W | — |
Thickness | 50–500 nm | — |
Thickness | 100–300 nm | — |
Thickness | 10–300 nm | — |
Thickness | 50–150 nm | — |
— | 250–750 W | — |
— | 4–5 eV | — |
Duration | 1–5 minutes | — |
Thickness | 200–300 nm | — |
Duration | ≤ 10 minutes | — |
Duration | ≥ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≥ 5 minutes | — |
glass substrate
acetylene
C₂H₂
hydrogen
H₂
silicon oxide
SiO₂
helium ions
He
| — |
— | 40–150 W | — |
Thickness | 50–500 nm | — |
Thickness | 100–300 nm | — |
Thickness | 10–300 nm | — |
Thickness | 50–150 nm | — |
— | 250–750 W | — |
— | 4–5 eV | — |
Duration | 1–5 minutes | — |
Thickness | 200–300 nm | — |
Duration | ≤ 10 minutes | — |
Duration | ≥ 10 minutes | — |
Duration | ≤ 5 minutes | — |
Duration | ≥ 5 minutes | — |