Research paperExperimental CharacterizationElectronic Spectroscopy of Atomic Defects in Molybdenum Disulfide under Ambient ConditionsJoshua R. Evans, Diego A. Garibay, Aiden N. Kuhls, Mehmet Z. Baykara2026·arXiv:2604.23391AbstractElectronic spectroscopy experiments on individual defects in molybdenum disulfide (MoS₂) under ambient conditions using conductive atomic force microscopy (C-AFM), with discrete I-V spectroscopy to categorize defect types and relate them to likely chemical identities.Read more
Mechanically exfoliated bulk, flux-grown MoS₂ flakes on conductive gold-coated silicon wafers for ambient C-AFM imaging and discrete I-V spectroscopy.1 preparation1 characterization2 properties2 figuresExperimentalMoS₂Studied MaterialAuCapping Or ContactSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationElectronic Spectroscopy of Atomic Defects in Molybdenum Disulfide under Ambient ConditionsJoshua R. Evans, Diego A. Garibay, Aiden N. Kuhls, Mehmet Z. Baykara2026·arXiv:2604.23391AbstractElectronic spectroscopy experiments on individual defects in molybdenum disulfide (MoS₂) under ambient conditions using conductive atomic force microscopy (C-AFM), with discrete I-V spectroscopy to categorize defect types and relate them to likely chemical identities.Read more
Mechanically exfoliated bulk, flux-grown MoS₂ flakes on conductive gold-coated silicon wafers for ambient C-AFM imaging and discrete I-V spectroscopy.1 preparation1 characterization2 properties2 figuresExperimentalMoS₂Studied MaterialAuCapping Or ContactSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationElectronic Spectroscopy of Atomic Defects in Molybdenum Disulfide under Ambient ConditionsJoshua R. Evans, Diego A. Garibay, Aiden N. Kuhls, Mehmet Z. Baykara2026·arXiv:2604.23391AbstractElectronic spectroscopy experiments on individual defects in molybdenum disulfide (MoS₂) under ambient conditions using conductive atomic force microscopy (C-AFM), with discrete I-V spectroscopy to categorize defect types and relate them to likely chemical identities.Read more
Mechanically exfoliated bulk, flux-grown MoS₂ flakes on conductive gold-coated silicon wafers for ambient C-AFM imaging and discrete I-V spectroscopy.1 preparation1 characterization2 properties2 figuresExperimentalMoS₂Studied MaterialAuCapping Or ContactSiSubstrate / DielectricExpand
Research paperExperimental CharacterizationElectronic Spectroscopy of Atomic Defects in Molybdenum Disulfide under Ambient ConditionsJoshua R. Evans, Diego A. Garibay, Aiden N. Kuhls, Mehmet Z. Baykara2026·arXiv:2604.23391AbstractElectronic spectroscopy experiments on individual defects in molybdenum disulfide (MoS₂) under ambient conditions using conductive atomic force microscopy (C-AFM), with discrete I-V spectroscopy to categorize defect types and relate them to likely chemical identities.Read more
Mechanically exfoliated bulk, flux-grown MoS₂ flakes on conductive gold-coated silicon wafers for ambient C-AFM imaging and discrete I-V spectroscopy.1 preparation1 characterization2 properties2 figuresExperimentalMoS₂Studied MaterialAuCapping Or ContactSiSubstrate / DielectricExpand