Research paper
Experimental GrowthExperimental CharacterizationComputational DFT| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 0.85eV | — | |||
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 1.1eV | — | |||
| Lattice Constant | MoSe₂ lattice constant | 0.33nm | — | |||
| Built In Potential | lateral heterojunction built-in potential | 0.83eV | — | |||
| Band Gap Change | MoSe₂ band gap increase | 0.26eV | — | |||
| Interlayer Distance Change | average interlayer distance increase upon Se intercalation | 1.9angstrom | — | |||
| Optical Band Gap | band gap | 0.26eV | — | — | — | — |
| Optical Band Gap | band gap | 1.94eV | — | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 0.85eV | — | |||
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 1.1eV | — | |||
| Lattice Constant | MoSe₂ lattice constant | 0.33nm | — | |||
| Built In Potential | lateral heterojunction built-in potential | 0.83eV | — | |||
| Band Gap Change | MoSe₂ band gap increase | 0.26eV | — | |||
| Interlayer Distance Change | average interlayer distance increase upon Se intercalation | 1.9angstrom | — | |||
| Optical Band Gap | band gap | 0.26eV | — | — | — | — |
| Optical Band Gap | band gap | 1.94eV | — | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 0.85eV | — | |||
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 1.1eV | — | |||
| Lattice Constant | MoSe₂ lattice constant | 0.33nm | — | |||
| Built In Potential | lateral heterojunction built-in potential | 0.83eV | — | |||
| Band Gap Change | MoSe₂ band gap increase | 0.26eV | — | |||
| Interlayer Distance Change | average interlayer distance increase upon Se intercalation | 1.9angstrom | — | |||
| Optical Band Gap | band gap | 0.26eV | — | — | — | — |
| Optical Band Gap | band gap | 1.94eV | — | — | — | — |
| Type | Label | Value | Material | Sample | Condition | Source |
|---|---|---|---|---|---|---|
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 0.85eV | — | |||
| Substrate Work Function Change | hBN/Ru work function increase after Se intercalation | 1.1eV | — | |||
| Lattice Constant | MoSe₂ lattice constant | 0.33nm | — | |||
| Built In Potential | lateral heterojunction built-in potential | 0.83eV | — | |||
| Band Gap Change | MoSe₂ band gap increase | 0.26eV | — | |||
| Interlayer Distance Change | average interlayer distance increase upon Se intercalation | 1.9angstrom | — | |||
| Optical Band Gap | band gap | 0.26eV | — | — | — | — |
| Optical Band Gap | band gap | 1.94eV | — | — | — | — |