Patent
US 10,877,194exemplary filter (1.2 µm period, 150 nm SiO2, degenerately doped Si substrate)
magnesium oxide
MgO
lead zirconium titanate
PZT
alumina
Al₂O₃
FIG. 2 is a graph of characteristic transport curves obtained from two devices during application of variable bias (VG) a cross the Hf O 2 dielectric with a …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 4(e) is a graph of the measured and simulated differential reflectance between V G _ 1.75 V and -6 V and 0.4 and 0.7 eV respectively for the first filter …
C |
Thickness | 1000–1100 cm | — |
— | 0.4–0.8 eV | — |
— | 0–0.9 eV | — |
Thickness | 1–60 µm | — |
Thickness | 6–18 µm | — |
Thickness | 1053-1 cm | — |
Thickness | 1–50 µm | — |
exemplary filter (1.2 µm period, 150 nm SiO2, degenerately doped Si substrate)
magnesium oxide
MgO
lead zirconium titanate
PZT
alumina
Al₂O₃
FIG. 2 is a graph of characteristic transport curves obtained from two devices during application of variable bias (VG) a cross the Hf O 2 dielectric with a …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 4(e) is a graph of the measured and simulated differential reflectance between V G _ 1.75 V and -6 V and 0.4 and 0.7 eV respectively for the first filter …
C |
Thickness | 1000–1100 cm | — |
— | 0.4–0.8 eV | — |
— | 0–0.9 eV | — |
Thickness | 1–60 µm | — |
Thickness | 6–18 µm | — |
Thickness | 1053-1 cm | — |
Thickness | 1–50 µm | — |
exemplary filter (1.2 µm period, 150 nm SiO2, degenerately doped Si substrate)
magnesium oxide
MgO
lead zirconium titanate
PZT
alumina
Al₂O₃
FIG. 2 is a graph of characteristic transport curves obtained from two devices during application of variable bias (VG) a cross the Hf O 2 dielectric with a …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 4(e) is a graph of the measured and simulated differential reflectance between V G _ 1.75 V and -6 V and 0.4 and 0.7 eV respectively for the first filter …
C |
Thickness | 1000–1100 cm | — |
— | 0.4–0.8 eV | — |
— | 0–0.9 eV | — |
Thickness | 1–60 µm | — |
Thickness | 6–18 µm | — |
Thickness | 1053-1 cm | — |
Thickness | 1–50 µm | — |
exemplary filter (1.2 µm period, 150 nm SiO2, degenerately doped Si substrate)
magnesium oxide
MgO
lead zirconium titanate
PZT
alumina
Al₂O₃
FIG. 2 is a graph of characteristic transport curves obtained from two devices during application of variable bias (VG) a cross the Hf O 2 dielectric with a …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 3(a) is a graph of simulated reflectance demonstrating the effects of each additional element. The graph labeled "Grating" shows the reflectance of the …
FIG. 4(e) is a graph of the measured and simulated differential reflectance between V G _ 1.75 V and -6 V and 0.4 and 0.7 eV respectively for the first filter …
C |
Thickness | 1000–1100 cm | — |
— | 0.4–0.8 eV | — |
— | 0–0.9 eV | — |
Thickness | 1–60 µm | — |
Thickness | 6–18 µm | — |
Thickness | 1053-1 cm | — |
Thickness | 1–50 µm | — |