Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Single-layer AlScN films of 80-100 nm thickness grown on bulk n+GaN substrates with an n+GaN buffer layer; used to identify lattice-matched Sc composition and assess structural/surface quality across growth temperature and composition.
Twenty-period AlScN/GaN multilayer heterostructure grown on bulk semi-insulating GaN substrate to evaluate transport properties and polarization-induced mobile charge density.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Single-layer AlScN films of 80-100 nm thickness grown on bulk n+GaN substrates with an n+GaN buffer layer; used to identify lattice-matched Sc composition and assess structural/surface quality across growth temperature and composition.
Twenty-period AlScN/GaN multilayer heterostructure grown on bulk semi-insulating GaN substrate to evaluate transport properties and polarization-induced mobile charge density.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Single-layer AlScN films of 80-100 nm thickness grown on bulk n+GaN substrates with an n+GaN buffer layer; used to identify lattice-matched Sc composition and assess structural/surface quality across growth temperature and composition.
Twenty-period AlScN/GaN multilayer heterostructure grown on bulk semi-insulating GaN substrate to evaluate transport properties and polarization-induced mobile charge density.
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Single-layer AlScN films of 80-100 nm thickness grown on bulk n+GaN substrates with an n+GaN buffer layer; used to identify lattice-matched Sc composition and assess structural/surface quality across growth temperature and composition.
Twenty-period AlScN/GaN multilayer heterostructure grown on bulk semi-insulating GaN substrate to evaluate transport properties and polarization-induced mobile charge density.