Research paperExperimental GrowthExperimental CharacterizationComputational DFTImpact of Pauli-blocking effect on optical limiting properties of WSe₂ thin filmsKm. Surbhi, Sourav Bhakta, Anupa Kumari, Utkalika P. Sahoo et al.arXiv·2022·10.1016/j.optmat.2022.112479·arXiv:2204.10995AbstractWe present a detailed investigation on thickness-dependent third-order (χ(3)) nonlinear optical properties of RF-sputtered WSe₂ thin-films using ultrashort pulses centered at different excitation wavelengths. The single-beam Z-scan based investigation in the visible spectrum reveals the prominent role of Pauli-blocking towards inducing saturable absorption or optical limiting in WSe₂ thin-films of various thicknesses. The study also explores the dispersion in third-order nonlinear susceptibility (χ(3)) in WSe₂ thin films. Interestingly, WSe₂ thin-films of any thickness exhibit a self-focusing effect depicting a positive nonlinear refractive index (n2 > 0). The frequency-dependent nonlinear absorption (β) bear distinct correlations with the bandgap of the films which is also investigated through density-functional-theory (DFT) based simulations. The alteration in bandstructure is primarily due to the Se-deficiency induced defect bands in WSe₂ thin-films which has discernible impact on the optical limiting characteristics.Read more
RF-sputtered WSe₂ thin film sample with thickness 34 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 81 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 130 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 150 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 242 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 326 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
Research paperExperimental GrowthExperimental CharacterizationComputational DFTImpact of Pauli-blocking effect on optical limiting properties of WSe₂ thin filmsKm. Surbhi, Sourav Bhakta, Anupa Kumari, Utkalika P. Sahoo et al.arXiv·2022·10.1016/j.optmat.2022.112479·arXiv:2204.10995AbstractWe present a detailed investigation on thickness-dependent third-order (χ(3)) nonlinear optical properties of RF-sputtered WSe₂ thin-films using ultrashort pulses centered at different excitation wavelengths. The single-beam Z-scan based investigation in the visible spectrum reveals the prominent role of Pauli-blocking towards inducing saturable absorption or optical limiting in WSe₂ thin-films of various thicknesses. The study also explores the dispersion in third-order nonlinear susceptibility (χ(3)) in WSe₂ thin films. Interestingly, WSe₂ thin-films of any thickness exhibit a self-focusing effect depicting a positive nonlinear refractive index (n2 > 0). The frequency-dependent nonlinear absorption (β) bear distinct correlations with the bandgap of the films which is also investigated through density-functional-theory (DFT) based simulations. The alteration in bandstructure is primarily due to the Se-deficiency induced defect bands in WSe₂ thin-films which has discernible impact on the optical limiting characteristics.Read more
RF-sputtered WSe₂ thin film sample with thickness 34 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 81 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 130 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 150 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 242 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 326 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
Research paperExperimental GrowthExperimental CharacterizationComputational DFTImpact of Pauli-blocking effect on optical limiting properties of WSe₂ thin filmsKm. Surbhi, Sourav Bhakta, Anupa Kumari, Utkalika P. Sahoo et al.arXiv·2022·10.1016/j.optmat.2022.112479·arXiv:2204.10995AbstractWe present a detailed investigation on thickness-dependent third-order (χ(3)) nonlinear optical properties of RF-sputtered WSe₂ thin-films using ultrashort pulses centered at different excitation wavelengths. The single-beam Z-scan based investigation in the visible spectrum reveals the prominent role of Pauli-blocking towards inducing saturable absorption or optical limiting in WSe₂ thin-films of various thicknesses. The study also explores the dispersion in third-order nonlinear susceptibility (χ(3)) in WSe₂ thin films. Interestingly, WSe₂ thin-films of any thickness exhibit a self-focusing effect depicting a positive nonlinear refractive index (n2 > 0). The frequency-dependent nonlinear absorption (β) bear distinct correlations with the bandgap of the films which is also investigated through density-functional-theory (DFT) based simulations. The alteration in bandstructure is primarily due to the Se-deficiency induced defect bands in WSe₂ thin-films which has discernible impact on the optical limiting characteristics.Read more
RF-sputtered WSe₂ thin film sample with thickness 34 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 81 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 130 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 150 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 242 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 326 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
Research paperExperimental GrowthExperimental CharacterizationComputational DFTImpact of Pauli-blocking effect on optical limiting properties of WSe₂ thin filmsKm. Surbhi, Sourav Bhakta, Anupa Kumari, Utkalika P. Sahoo et al.arXiv·2022·10.1016/j.optmat.2022.112479·arXiv:2204.10995AbstractWe present a detailed investigation on thickness-dependent third-order (χ(3)) nonlinear optical properties of RF-sputtered WSe₂ thin-films using ultrashort pulses centered at different excitation wavelengths. The single-beam Z-scan based investigation in the visible spectrum reveals the prominent role of Pauli-blocking towards inducing saturable absorption or optical limiting in WSe₂ thin-films of various thicknesses. The study also explores the dispersion in third-order nonlinear susceptibility (χ(3)) in WSe₂ thin films. Interestingly, WSe₂ thin-films of any thickness exhibit a self-focusing effect depicting a positive nonlinear refractive index (n2 > 0). The frequency-dependent nonlinear absorption (β) bear distinct correlations with the bandgap of the films which is also investigated through density-functional-theory (DFT) based simulations. The alteration in bandstructure is primarily due to the Se-deficiency induced defect bands in WSe₂ thin-films which has discernible impact on the optical limiting characteristics.Read more
RF-sputtered WSe₂ thin film sample with thickness 34 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 81 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 130 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 150 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 242 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand
RF-sputtered WSe₂ thin film sample with thickness 326 nm.1 preparation5 characterizations2 properties4 figuresExperimentalWSe₂Studied MaterialExpand