Grudinin D.V., Ermolaev G.A., Baranov D.G., Toksumakov A.N. et al.
2025·arXiv:2303.02804
Samples
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Exfoliated hBN flake used for imaging ellipsometry, AFM, Raman, transmittance, and near-field optical microscopy; text reports a thick sample of 310 nm.
6 characterizations4 properties2 figures
ExperimentalhBNStudied Material
Modeled hBN/SiO₂ planar waveguide system used for transfer-matrix validation of the anisotropic optical model.
Grudinin D.V., Ermolaev G.A., Baranov D.G., Toksumakov A.N. et al.
2025·arXiv:2303.02804
Samples
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Exfoliated hBN flake used for imaging ellipsometry, AFM, Raman, transmittance, and near-field optical microscopy; text reports a thick sample of 310 nm.
6 characterizations4 properties2 figures
ExperimentalhBNStudied Material
Modeled hBN/SiO₂ planar waveguide system used for transfer-matrix validation of the anisotropic optical model.
Grudinin D.V., Ermolaev G.A., Baranov D.G., Toksumakov A.N. et al.
2025·arXiv:2303.02804
Samples
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Exfoliated hBN flake used for imaging ellipsometry, AFM, Raman, transmittance, and near-field optical microscopy; text reports a thick sample of 310 nm.
6 characterizations4 properties2 figures
ExperimentalhBNStudied Material
Modeled hBN/SiO₂ planar waveguide system used for transfer-matrix validation of the anisotropic optical model.
Grudinin D.V., Ermolaev G.A., Baranov D.G., Toksumakov A.N. et al.
2025·arXiv:2303.02804
Samples
Each sample groups how it was prepared, characterized, and measured. Click a card to expand.
Exfoliated hBN flake used for imaging ellipsometry, AFM, Raman, transmittance, and near-field optical microscopy; text reports a thick sample of 310 nm.
6 characterizations4 properties2 figures
ExperimentalhBNStudied Material
Modeled hBN/SiO₂ planar waveguide system used for transfer-matrix validation of the anisotropic optical model.