Patent
US 9,464,990Patent
Atlas literature
Patent
US 9,464,990Patent drawings and their descriptions. Click a drawing to enlarge it.
Figure 1 shows two schematic of large-area, high-contrast graphene metrology technique.
Figure 2 shows fluorescence image of dyed CVD grown graphene sample (a) before and (b) after background correction.
Figure 3 shows a schematic segmented image of dyed CVD grown graphene sample showing different graphene layers and surface contamination. Arrows show 2 layered areas.
Figure 4 show (a) FQM and (b) segmented images of CVD grown graphene. (c) Raman spectra recorded at colored dots in (a) and (b). Spectra have been offset for visibility. (d) Histogram of FQM image. Colored regions indicate intensity ranges mapped to different graphene layers in segmentation …
Figure 5 show segmented image of dyed CVD grown graphene samples prepared using different transfer techniques. (a) Modified technique where a drop of liquid PMMA is added to the transfer PMMA and (b) unmodified technique where the transfer PMMA is directly dissolved by dipping the sample in acetone.
Figure 6 shows comparison of different regions in the segmented images of graphene samples. Each region covers a 417x3 18p m2 area.
Figure 7 shows dye-doped polymer absorption and fluorescence emission spectra. Detailed Description of the Invention [0020] We demonstrate a high-throughput metrology method for measuring the thickness and uniformity of entire large-area chemical-vapor deposition-grown graphene sheets on arbitrary …
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy includes: applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer and dye mixture is applied by spin-coating a solution of the polymer and dye mixture onto the graphene sample, [[and]] wherein the solution include toluene; and wherein the graphene layers are identified by performing a histogram-based segmentation based on contrast relative to the substrates.
The method of claim 1 in which the polymer is a cured poly(methyl methacrylate).
The method of claim 1 in which individual images of the graphene sample are obtained to collect a montage of the images.
2-4. canceled
canceled
canceled
AMENDMENT AND RESPONSE UNDER 37 C.F.R § 1.111 Page 3 Serial Number: 14/412,948 Dkt: 3868. 00 5US₁ Filing Date: Title: CENTIMETER-SCALE HIGH RESOLUTION METROLOGY OF ENTIRE CVD GROWN GRAPHENE SHEETS canceled
The method of claim [[8]] 1, wherein the segmentation step comprises of collecting a large-scale, high-resolution montage image of the sample and processing the image to remove the effects of non-uniform illumination.
The method of claim 9 wherein the effects of non-uniform illumination is removed by applying the polymer and dye mixture onto a substrate bare of graphene and creating a correction image thereof using the same imaging pathway used to create the montage image.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer is removed by soaking in acetone and including the initial step, prior to said soaking with acetone, of applying a small amount of either acetone or poly(methyl methacrylate) to the polymer and drying said applied acetone or poly(methyl methacrylate).
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, and the graphene layers are identified by performing a histogram- based segmentation based on contrast relative to the substrates.
Materials described outside the worked examples.
graphene
poly(methyl methacrylate)
Additional fabrication and treatment steps described in the patent.
Measurements and analyses referenced in the patent, with their drawing references.
Related documents with shared materials, methods, properties, or citations.
Patent
Atlas literature
Patent
US 9,464,990Patent drawings and their descriptions. Click a drawing to enlarge it.
Figure 1 shows two schematic of large-area, high-contrast graphene metrology technique.
Figure 2 shows fluorescence image of dyed CVD grown graphene sample (a) before and (b) after background correction.
Figure 3 shows a schematic segmented image of dyed CVD grown graphene sample showing different graphene layers and surface contamination. Arrows show 2 layered areas.
Figure 4 show (a) FQM and (b) segmented images of CVD grown graphene. (c) Raman spectra recorded at colored dots in (a) and (b). Spectra have been offset for visibility. (d) Histogram of FQM image. Colored regions indicate intensity ranges mapped to different graphene layers in segmentation …
Figure 5 show segmented image of dyed CVD grown graphene samples prepared using different transfer techniques. (a) Modified technique where a drop of liquid PMMA is added to the transfer PMMA and (b) unmodified technique where the transfer PMMA is directly dissolved by dipping the sample in acetone.
Figure 6 shows comparison of different regions in the segmented images of graphene samples. Each region covers a 417x3 18p m2 area.
Figure 7 shows dye-doped polymer absorption and fluorescence emission spectra. Detailed Description of the Invention [0020] We demonstrate a high-throughput metrology method for measuring the thickness and uniformity of entire large-area chemical-vapor deposition-grown graphene sheets on arbitrary …
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy includes: applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer and dye mixture is applied by spin-coating a solution of the polymer and dye mixture onto the graphene sample, [[and]] wherein the solution include toluene; and wherein the graphene layers are identified by performing a histogram-based segmentation based on contrast relative to the substrates.
The method of claim 1 in which the polymer is a cured poly(methyl methacrylate).
The method of claim 1 in which individual images of the graphene sample are obtained to collect a montage of the images.
2-4. canceled
canceled
canceled
AMENDMENT AND RESPONSE UNDER 37 C.F.R § 1.111 Page 3 Serial Number: 14/412,948 Dkt: 3868. 00 5US₁ Filing Date: Title: CENTIMETER-SCALE HIGH RESOLUTION METROLOGY OF ENTIRE CVD GROWN GRAPHENE SHEETS canceled
The method of claim [[8]] 1, wherein the segmentation step comprises of collecting a large-scale, high-resolution montage image of the sample and processing the image to remove the effects of non-uniform illumination.
The method of claim 9 wherein the effects of non-uniform illumination is removed by applying the polymer and dye mixture onto a substrate bare of graphene and creating a correction image thereof using the same imaging pathway used to create the montage image.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer is removed by soaking in acetone and including the initial step, prior to said soaking with acetone, of applying a small amount of either acetone or poly(methyl methacrylate) to the polymer and drying said applied acetone or poly(methyl methacrylate).
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, and the graphene layers are identified by performing a histogram- based segmentation based on contrast relative to the substrates.
Materials described outside the worked examples.
graphene
poly(methyl methacrylate)
Additional fabrication and treatment steps described in the patent.
Measurements and analyses referenced in the patent, with their drawing references.
Related documents with shared materials, methods, properties, or citations.
Patent
Atlas literature
Patent
US 9,464,990Patent drawings and their descriptions. Click a drawing to enlarge it.
Figure 1 shows two schematic of large-area, high-contrast graphene metrology technique.
Figure 2 shows fluorescence image of dyed CVD grown graphene sample (a) before and (b) after background correction.
Figure 3 shows a schematic segmented image of dyed CVD grown graphene sample showing different graphene layers and surface contamination. Arrows show 2 layered areas.
Figure 4 show (a) FQM and (b) segmented images of CVD grown graphene. (c) Raman spectra recorded at colored dots in (a) and (b). Spectra have been offset for visibility. (d) Histogram of FQM image. Colored regions indicate intensity ranges mapped to different graphene layers in segmentation …
Figure 5 show segmented image of dyed CVD grown graphene samples prepared using different transfer techniques. (a) Modified technique where a drop of liquid PMMA is added to the transfer PMMA and (b) unmodified technique where the transfer PMMA is directly dissolved by dipping the sample in acetone.
Figure 6 shows comparison of different regions in the segmented images of graphene samples. Each region covers a 417x3 18p m2 area.
Figure 7 shows dye-doped polymer absorption and fluorescence emission spectra. Detailed Description of the Invention [0020] We demonstrate a high-throughput metrology method for measuring the thickness and uniformity of entire large-area chemical-vapor deposition-grown graphene sheets on arbitrary …
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy includes: applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer and dye mixture is applied by spin-coating a solution of the polymer and dye mixture onto the graphene sample, [[and]] wherein the solution include toluene; and wherein the graphene layers are identified by performing a histogram-based segmentation based on contrast relative to the substrates.
The method of claim 1 in which the polymer is a cured poly(methyl methacrylate).
The method of claim 1 in which individual images of the graphene sample are obtained to collect a montage of the images.
2-4. canceled
canceled
canceled
AMENDMENT AND RESPONSE UNDER 37 C.F.R § 1.111 Page 3 Serial Number: 14/412,948 Dkt: 3868. 00 5US₁ Filing Date: Title: CENTIMETER-SCALE HIGH RESOLUTION METROLOGY OF ENTIRE CVD GROWN GRAPHENE SHEETS canceled
The method of claim [[8]] 1, wherein the segmentation step comprises of collecting a large-scale, high-resolution montage image of the sample and processing the image to remove the effects of non-uniform illumination.
The method of claim 9 wherein the effects of non-uniform illumination is removed by applying the polymer and dye mixture onto a substrate bare of graphene and creating a correction image thereof using the same imaging pathway used to create the montage image.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer is removed by soaking in acetone and including the initial step, prior to said soaking with acetone, of applying a small amount of either acetone or poly(methyl methacrylate) to the polymer and drying said applied acetone or poly(methyl methacrylate).
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, and the graphene layers are identified by performing a histogram- based segmentation based on contrast relative to the substrates.
Materials described outside the worked examples.
graphene
poly(methyl methacrylate)
Additional fabrication and treatment steps described in the patent.
Measurements and analyses referenced in the patent, with their drawing references.
Related documents with shared materials, methods, properties, or citations.
Patent
Atlas literature
Patent
US 9,464,990Patent drawings and their descriptions. Click a drawing to enlarge it.
Figure 1 shows two schematic of large-area, high-contrast graphene metrology technique.
Figure 2 shows fluorescence image of dyed CVD grown graphene sample (a) before and (b) after background correction.
Figure 3 shows a schematic segmented image of dyed CVD grown graphene sample showing different graphene layers and surface contamination. Arrows show 2 layered areas.
Figure 4 show (a) FQM and (b) segmented images of CVD grown graphene. (c) Raman spectra recorded at colored dots in (a) and (b). Spectra have been offset for visibility. (d) Histogram of FQM image. Colored regions indicate intensity ranges mapped to different graphene layers in segmentation …
Figure 5 show segmented image of dyed CVD grown graphene samples prepared using different transfer techniques. (a) Modified technique where a drop of liquid PMMA is added to the transfer PMMA and (b) unmodified technique where the transfer PMMA is directly dissolved by dipping the sample in acetone.
Figure 6 shows comparison of different regions in the segmented images of graphene samples. Each region covers a 417x3 18p m2 area.
Figure 7 shows dye-doped polymer absorption and fluorescence emission spectra. Detailed Description of the Invention [0020] We demonstrate a high-throughput metrology method for measuring the thickness and uniformity of entire large-area chemical-vapor deposition-grown graphene sheets on arbitrary …
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy includes: applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer and dye mixture is applied by spin-coating a solution of the polymer and dye mixture onto the graphene sample, [[and]] wherein the solution include toluene; and wherein the graphene layers are identified by performing a histogram-based segmentation based on contrast relative to the substrates.
The method of claim 1 in which the polymer is a cured poly(methyl methacrylate).
The method of claim 1 in which individual images of the graphene sample are obtained to collect a montage of the images.
2-4. canceled
canceled
canceled
AMENDMENT AND RESPONSE UNDER 37 C.F.R § 1.111 Page 3 Serial Number: 14/412,948 Dkt: 3868. 00 5US₁ Filing Date: Title: CENTIMETER-SCALE HIGH RESOLUTION METROLOGY OF ENTIRE CVD GROWN GRAPHENE SHEETS canceled
The method of claim [[8]] 1, wherein the segmentation step comprises of collecting a large-scale, high-resolution montage image of the sample and processing the image to remove the effects of non-uniform illumination.
The method of claim 9 wherein the effects of non-uniform illumination is removed by applying the polymer and dye mixture onto a substrate bare of graphene and creating a correction image thereof using the same imaging pathway used to create the montage image.
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, wherein the polymer is removed by soaking in acetone and including the initial step, prior to said soaking with acetone, of applying a small amount of either acetone or poly(methyl methacrylate) to the polymer and drying said applied acetone or poly(methyl methacrylate).
A method for analyzing graphene comprising performing fluorescence quenching microscopy on a graphene sample to identify graphene layers on arbitrary substrates, the fluorescence quenching microscopy including applying a polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope, and the graphene layers are identified by performing a histogram- based segmentation based on contrast relative to the substrates.
Materials described outside the worked examples.
graphene
poly(methyl methacrylate)
Additional fabrication and treatment steps described in the patent.
Measurements and analyses referenced in the patent, with their drawing references.
Related documents with shared materials, methods, properties, or citations.
toluene
C₇H₈
acetone
C₃H₆O
fluorescent dye
CVD grown graphene
toluene
C₇H₈
acetone
C₃H₆O
fluorescent dye
CVD grown graphene
toluene
C₇H₈
acetone
C₃H₆O
fluorescent dye
CVD grown graphene
toluene
C₇H₈
acetone
C₃H₆O
fluorescent dye
CVD grown graphene
