Patent
US 9,527,741graphene oxide (as-synthesized, Hummers method)
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 6 shows X-ray photoelectron spectroscopy (XPS) data comparing carbon is spectra for suspensions comprising a graphene oxide species, according to some …
FIG. 7 shows XPS data comparing carbon i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 8 shows XPS data comparing oxygen i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 9 shows FTIR spectra for solid compositions comprising graphene oxide species, 10 according to some embodiments;
FIG. 14 shows un-normalized UV-Vis absorption spectra for suspensions comprising a graphene oxide species, according to some embodiments (left), and for solid …
FIG. 15 shows (a) Raman mapping on solid compositions comprising graphene oxide 25 species, according to some embodiments; and (b) Raman measurements on solid …
FIG. 16 shows photoluminescence spectra for thin films comprising graphene oxide species, according to some embodiments; and
FIG. 17 shows X-ray diffraction (XRD) data for a composition comprising a graphene 30 oxide species, according to some embodiments. Other aspects, embodiments …
PL Peak | ≤ 500 nm | second graphene oxide species |
Atomic Percent Oxygen | ≥ 20 at% | second graphene oxide species |
Atomic Percent Oxygen Background | 30–35 at% | graphene oxide (as-synthesized, Hummers method) |
Thickness | 350–800 nm | — |
Thickness | 1–5 nm | — |
Thickness | 1–10 nm | — |
Thickness | 1–15 nm | — |
Thickness | 1–20 nm | — |
Thickness | 1–25 nm | — |
Thickness | 1–30 nm | — |
Thickness | 5–10 nm | — |
Thickness | 5–15 nm | — |
Thickness | 5–20 nm | — |
Thickness | 5–25 nm | — |
Thickness | 5–30 nm | — |
Thickness | 10–20 nm | — |
Thickness | 10–25 nm | — |
Thickness | 10–30 nm | — |
Thickness | 15–30 nm | — |
Temperature | 30–80 °C | — |
Temperature | 30–100 °C | — |
Temperature | 30–125 °C | — |
Temperature | 30–150 °C | — |
Temperature | 40–80 °C | — |
Temperature | 40–100 °C | — |
Temperature | 40–125 °C | — |
Temperature | 40–150 °C | — |
Temperature | 50–80 °C | — |
Temperature | 50–125 °C | — |
Temperature | 50–150 °C | — |
Temperature | 60–80 °C | — |
Temperature | 60–100 °C | — |
Temperature | 60–125 °C | — |
Temperature | 60–150 °C | — |
Temperature | 70–100 °C | — |
Temperature | 70–125 °C | — |
Temperature | 70–150 °C | — |
Temperature | 80–100 °C | — |
Temperature | 80–125 °C | — |
Temperature | 80–150 °C | — |
Temperature | 100–125 °C | — |
Temperature | 100–150 °C | — |
Pressure | 1–105 Pa | — |
Pressure | 1–106 Pa | — |
Pressure | 1–109 Pa | — |
Pressure | 3–109 Pa | — |
— | 0.5–1 eV | — |
— | 0.5–1.5 eV | — |
— | 0.5–2 eV | — |
— | 0.5–2.5 eV | — |
— | 0.5–3 eV | — |
— | 0.5–4 eV | — |
— | 0.5–5 eV | — |
— | 1–1.5 eV | — |
— | 1–2.5 eV | — |
— | 1–3 eV | — |
— | 1–4 eV | — |
— | 1–5 eV | — |
— | 1.5–2 eV | — |
— | 1.5–2.5 eV | — |
— | 1.5–3 eV | — |
— | 1.5–4 eV | — |
— | 1.5–5 eV | — |
Thickness | 400–450 nm | — |
Thickness | 400–500 nm | — |
— | 2–2.8 eV | — |
Temperature | 10–300 K | — |
Thickness | 1–2 nm | — |
Thickness | 1–3 nm | — |
Thickness | 1–4 nm | — |
Thickness | 2–4 nm | — |
Thickness | 2–5 nm | — |
Thickness | 2–10 nm | — |
Thickness | 2–15 nm | — |
Thickness | 2–20 nm | — |
Pressure | 0.000001 Pa | — |
Thickness | 200–1100 nm | — |
Thickness | 200–800 nm | — |
Thickness | 800–4000 cm | — |
Thickness | 400–750 nm | — |
— | 2–2.5 eV | — |
Thickness | 400–700 nm | — |
Thickness | 200–300 nm | — |
— | 2.3–2.4 eV | — |
— | 2–2.75 eV | — |
Pressure | ≤ 1 Pa | — |
— | ≤ 0.03 eV | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 2 nm | — |
Thickness | ≥ 3 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 15 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 25 nm | — |
Thickness | ≥ 4 nm | — |
Pressure | ≥ 0.000001 Pa | — |
Pressure | ≥ 0.0001 Pa | — |
Pressure | ≥ 0.01 Pa | — |
Pressure | ≥ 1 Pa | — |
Pressure | ≥ 100 Pa | — |
Pressure | ≥ 10 Pa | — |
Thickness | ≥ 50 nm | — |
Thickness | 5–300 nm | — |
graphene oxide (as-synthesized, Hummers method)
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 6 shows X-ray photoelectron spectroscopy (XPS) data comparing carbon is spectra for suspensions comprising a graphene oxide species, according to some …
FIG. 7 shows XPS data comparing carbon i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 8 shows XPS data comparing oxygen i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 9 shows FTIR spectra for solid compositions comprising graphene oxide species, 10 according to some embodiments;
FIG. 14 shows un-normalized UV-Vis absorption spectra for suspensions comprising a graphene oxide species, according to some embodiments (left), and for solid …
FIG. 15 shows (a) Raman mapping on solid compositions comprising graphene oxide 25 species, according to some embodiments; and (b) Raman measurements on solid …
FIG. 16 shows photoluminescence spectra for thin films comprising graphene oxide species, according to some embodiments; and
FIG. 17 shows X-ray diffraction (XRD) data for a composition comprising a graphene 30 oxide species, according to some embodiments. Other aspects, embodiments …
PL Peak | ≤ 500 nm | second graphene oxide species |
Atomic Percent Oxygen | ≥ 20 at% | second graphene oxide species |
Atomic Percent Oxygen Background | 30–35 at% | graphene oxide (as-synthesized, Hummers method) |
Thickness | 350–800 nm | — |
Thickness | 1–5 nm | — |
Thickness | 1–10 nm | — |
Thickness | 1–15 nm | — |
Thickness | 1–20 nm | — |
Thickness | 1–25 nm | — |
Thickness | 1–30 nm | — |
Thickness | 5–10 nm | — |
Thickness | 5–15 nm | — |
Thickness | 5–20 nm | — |
Thickness | 5–25 nm | — |
Thickness | 5–30 nm | — |
Thickness | 10–20 nm | — |
Thickness | 10–25 nm | — |
Thickness | 10–30 nm | — |
Thickness | 15–30 nm | — |
Temperature | 30–80 °C | — |
Temperature | 30–100 °C | — |
Temperature | 30–125 °C | — |
Temperature | 30–150 °C | — |
Temperature | 40–80 °C | — |
Temperature | 40–100 °C | — |
Temperature | 40–125 °C | — |
Temperature | 40–150 °C | — |
Temperature | 50–80 °C | — |
Temperature | 50–125 °C | — |
Temperature | 50–150 °C | — |
Temperature | 60–80 °C | — |
Temperature | 60–100 °C | — |
Temperature | 60–125 °C | — |
Temperature | 60–150 °C | — |
Temperature | 70–100 °C | — |
Temperature | 70–125 °C | — |
Temperature | 70–150 °C | — |
Temperature | 80–100 °C | — |
Temperature | 80–125 °C | — |
Temperature | 80–150 °C | — |
Temperature | 100–125 °C | — |
Temperature | 100–150 °C | — |
Pressure | 1–105 Pa | — |
Pressure | 1–106 Pa | — |
Pressure | 1–109 Pa | — |
Pressure | 3–109 Pa | — |
— | 0.5–1 eV | — |
— | 0.5–1.5 eV | — |
— | 0.5–2 eV | — |
— | 0.5–2.5 eV | — |
— | 0.5–3 eV | — |
— | 0.5–4 eV | — |
— | 0.5–5 eV | — |
— | 1–1.5 eV | — |
— | 1–2.5 eV | — |
— | 1–3 eV | — |
— | 1–4 eV | — |
— | 1–5 eV | — |
— | 1.5–2 eV | — |
— | 1.5–2.5 eV | — |
— | 1.5–3 eV | — |
— | 1.5–4 eV | — |
— | 1.5–5 eV | — |
Thickness | 400–450 nm | — |
Thickness | 400–500 nm | — |
— | 2–2.8 eV | — |
Temperature | 10–300 K | — |
Thickness | 1–2 nm | — |
Thickness | 1–3 nm | — |
Thickness | 1–4 nm | — |
Thickness | 2–4 nm | — |
Thickness | 2–5 nm | — |
Thickness | 2–10 nm | — |
Thickness | 2–15 nm | — |
Thickness | 2–20 nm | — |
Pressure | 0.000001 Pa | — |
Thickness | 200–1100 nm | — |
Thickness | 200–800 nm | — |
Thickness | 800–4000 cm | — |
Thickness | 400–750 nm | — |
— | 2–2.5 eV | — |
Thickness | 400–700 nm | — |
Thickness | 200–300 nm | — |
— | 2.3–2.4 eV | — |
— | 2–2.75 eV | — |
Pressure | ≤ 1 Pa | — |
— | ≤ 0.03 eV | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 2 nm | — |
Thickness | ≥ 3 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 15 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 25 nm | — |
Thickness | ≥ 4 nm | — |
Pressure | ≥ 0.000001 Pa | — |
Pressure | ≥ 0.0001 Pa | — |
Pressure | ≥ 0.01 Pa | — |
Pressure | ≥ 1 Pa | — |
Pressure | ≥ 100 Pa | — |
Pressure | ≥ 10 Pa | — |
Thickness | ≥ 50 nm | — |
Thickness | 5–300 nm | — |
graphene oxide (as-synthesized, Hummers method)
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 6 shows X-ray photoelectron spectroscopy (XPS) data comparing carbon is spectra for suspensions comprising a graphene oxide species, according to some …
FIG. 7 shows XPS data comparing carbon i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 8 shows XPS data comparing oxygen i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 9 shows FTIR spectra for solid compositions comprising graphene oxide species, 10 according to some embodiments;
FIG. 14 shows un-normalized UV-Vis absorption spectra for suspensions comprising a graphene oxide species, according to some embodiments (left), and for solid …
FIG. 15 shows (a) Raman mapping on solid compositions comprising graphene oxide 25 species, according to some embodiments; and (b) Raman measurements on solid …
FIG. 16 shows photoluminescence spectra for thin films comprising graphene oxide species, according to some embodiments; and
FIG. 17 shows X-ray diffraction (XRD) data for a composition comprising a graphene 30 oxide species, according to some embodiments. Other aspects, embodiments …
PL Peak | ≤ 500 nm | second graphene oxide species |
Atomic Percent Oxygen | ≥ 20 at% | second graphene oxide species |
Atomic Percent Oxygen Background | 30–35 at% | graphene oxide (as-synthesized, Hummers method) |
Thickness | 350–800 nm | — |
Thickness | 1–5 nm | — |
Thickness | 1–10 nm | — |
Thickness | 1–15 nm | — |
Thickness | 1–20 nm | — |
Thickness | 1–25 nm | — |
Thickness | 1–30 nm | — |
Thickness | 5–10 nm | — |
Thickness | 5–15 nm | — |
Thickness | 5–20 nm | — |
Thickness | 5–25 nm | — |
Thickness | 5–30 nm | — |
Thickness | 10–20 nm | — |
Thickness | 10–25 nm | — |
Thickness | 10–30 nm | — |
Thickness | 15–30 nm | — |
Temperature | 30–80 °C | — |
Temperature | 30–100 °C | — |
Temperature | 30–125 °C | — |
Temperature | 30–150 °C | — |
Temperature | 40–80 °C | — |
Temperature | 40–100 °C | — |
Temperature | 40–125 °C | — |
Temperature | 40–150 °C | — |
Temperature | 50–80 °C | — |
Temperature | 50–125 °C | — |
Temperature | 50–150 °C | — |
Temperature | 60–80 °C | — |
Temperature | 60–100 °C | — |
Temperature | 60–125 °C | — |
Temperature | 60–150 °C | — |
Temperature | 70–100 °C | — |
Temperature | 70–125 °C | — |
Temperature | 70–150 °C | — |
Temperature | 80–100 °C | — |
Temperature | 80–125 °C | — |
Temperature | 80–150 °C | — |
Temperature | 100–125 °C | — |
Temperature | 100–150 °C | — |
Pressure | 1–105 Pa | — |
Pressure | 1–106 Pa | — |
Pressure | 1–109 Pa | — |
Pressure | 3–109 Pa | — |
— | 0.5–1 eV | — |
— | 0.5–1.5 eV | — |
— | 0.5–2 eV | — |
— | 0.5–2.5 eV | — |
— | 0.5–3 eV | — |
— | 0.5–4 eV | — |
— | 0.5–5 eV | — |
— | 1–1.5 eV | — |
— | 1–2.5 eV | — |
— | 1–3 eV | — |
— | 1–4 eV | — |
— | 1–5 eV | — |
— | 1.5–2 eV | — |
— | 1.5–2.5 eV | — |
— | 1.5–3 eV | — |
— | 1.5–4 eV | — |
— | 1.5–5 eV | — |
Thickness | 400–450 nm | — |
Thickness | 400–500 nm | — |
— | 2–2.8 eV | — |
Temperature | 10–300 K | — |
Thickness | 1–2 nm | — |
Thickness | 1–3 nm | — |
Thickness | 1–4 nm | — |
Thickness | 2–4 nm | — |
Thickness | 2–5 nm | — |
Thickness | 2–10 nm | — |
Thickness | 2–15 nm | — |
Thickness | 2–20 nm | — |
Pressure | 0.000001 Pa | — |
Thickness | 200–1100 nm | — |
Thickness | 200–800 nm | — |
Thickness | 800–4000 cm | — |
Thickness | 400–750 nm | — |
— | 2–2.5 eV | — |
Thickness | 400–700 nm | — |
Thickness | 200–300 nm | — |
— | 2.3–2.4 eV | — |
— | 2–2.75 eV | — |
Pressure | ≤ 1 Pa | — |
— | ≤ 0.03 eV | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 2 nm | — |
Thickness | ≥ 3 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 15 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 25 nm | — |
Thickness | ≥ 4 nm | — |
Pressure | ≥ 0.000001 Pa | — |
Pressure | ≥ 0.0001 Pa | — |
Pressure | ≥ 0.01 Pa | — |
Pressure | ≥ 1 Pa | — |
Pressure | ≥ 100 Pa | — |
Pressure | ≥ 10 Pa | — |
Thickness | ≥ 50 nm | — |
Thickness | 5–300 nm | — |
graphene oxide (as-synthesized, Hummers method)
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 2 shows (a) thermogravimetric thermograms for graphene oxide species, according to some embodiments; (b) FTIR spectra for graphene oxide species, …
FIG. 6 shows X-ray photoelectron spectroscopy (XPS) data comparing carbon is spectra for suspensions comprising a graphene oxide species, according to some …
FIG. 7 shows XPS data comparing carbon i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 8 shows XPS data comparing oxygen i s spectra for solid compositions comprising a graphene oxide species, according to some embodiments;
FIG. 9 shows FTIR spectra for solid compositions comprising graphene oxide species, 10 according to some embodiments;
FIG. 14 shows un-normalized UV-Vis absorption spectra for suspensions comprising a graphene oxide species, according to some embodiments (left), and for solid …
FIG. 15 shows (a) Raman mapping on solid compositions comprising graphene oxide 25 species, according to some embodiments; and (b) Raman measurements on solid …
FIG. 16 shows photoluminescence spectra for thin films comprising graphene oxide species, according to some embodiments; and
FIG. 17 shows X-ray diffraction (XRD) data for a composition comprising a graphene 30 oxide species, according to some embodiments. Other aspects, embodiments …
PL Peak | ≤ 500 nm | second graphene oxide species |
Atomic Percent Oxygen | ≥ 20 at% | second graphene oxide species |
Atomic Percent Oxygen Background | 30–35 at% | graphene oxide (as-synthesized, Hummers method) |
Thickness | 350–800 nm | — |
Thickness | 1–5 nm | — |
Thickness | 1–10 nm | — |
Thickness | 1–15 nm | — |
Thickness | 1–20 nm | — |
Thickness | 1–25 nm | — |
Thickness | 1–30 nm | — |
Thickness | 5–10 nm | — |
Thickness | 5–15 nm | — |
Thickness | 5–20 nm | — |
Thickness | 5–25 nm | — |
Thickness | 5–30 nm | — |
Thickness | 10–20 nm | — |
Thickness | 10–25 nm | — |
Thickness | 10–30 nm | — |
Thickness | 15–30 nm | — |
Temperature | 30–80 °C | — |
Temperature | 30–100 °C | — |
Temperature | 30–125 °C | — |
Temperature | 30–150 °C | — |
Temperature | 40–80 °C | — |
Temperature | 40–100 °C | — |
Temperature | 40–125 °C | — |
Temperature | 40–150 °C | — |
Temperature | 50–80 °C | — |
Temperature | 50–125 °C | — |
Temperature | 50–150 °C | — |
Temperature | 60–80 °C | — |
Temperature | 60–100 °C | — |
Temperature | 60–125 °C | — |
Temperature | 60–150 °C | — |
Temperature | 70–100 °C | — |
Temperature | 70–125 °C | — |
Temperature | 70–150 °C | — |
Temperature | 80–100 °C | — |
Temperature | 80–125 °C | — |
Temperature | 80–150 °C | — |
Temperature | 100–125 °C | — |
Temperature | 100–150 °C | — |
Pressure | 1–105 Pa | — |
Pressure | 1–106 Pa | — |
Pressure | 1–109 Pa | — |
Pressure | 3–109 Pa | — |
— | 0.5–1 eV | — |
— | 0.5–1.5 eV | — |
— | 0.5–2 eV | — |
— | 0.5–2.5 eV | — |
— | 0.5–3 eV | — |
— | 0.5–4 eV | — |
— | 0.5–5 eV | — |
— | 1–1.5 eV | — |
— | 1–2.5 eV | — |
— | 1–3 eV | — |
— | 1–4 eV | — |
— | 1–5 eV | — |
— | 1.5–2 eV | — |
— | 1.5–2.5 eV | — |
— | 1.5–3 eV | — |
— | 1.5–4 eV | — |
— | 1.5–5 eV | — |
Thickness | 400–450 nm | — |
Thickness | 400–500 nm | — |
— | 2–2.8 eV | — |
Temperature | 10–300 K | — |
Thickness | 1–2 nm | — |
Thickness | 1–3 nm | — |
Thickness | 1–4 nm | — |
Thickness | 2–4 nm | — |
Thickness | 2–5 nm | — |
Thickness | 2–10 nm | — |
Thickness | 2–15 nm | — |
Thickness | 2–20 nm | — |
Pressure | 0.000001 Pa | — |
Thickness | 200–1100 nm | — |
Thickness | 200–800 nm | — |
Thickness | 800–4000 cm | — |
Thickness | 400–750 nm | — |
— | 2–2.5 eV | — |
Thickness | 400–700 nm | — |
Thickness | 200–300 nm | — |
— | 2.3–2.4 eV | — |
— | 2–2.75 eV | — |
Pressure | ≤ 1 Pa | — |
— | ≤ 0.03 eV | — |
Thickness | ≥ 1 nm | — |
Thickness | ≥ 2 nm | — |
Thickness | ≥ 3 nm | — |
Thickness | ≥ 10 nm | — |
Thickness | ≥ 5 nm | — |
Thickness | ≥ 15 nm | — |
Thickness | ≥ 20 nm | — |
Thickness | ≥ 25 nm | — |
Thickness | ≥ 4 nm | — |
Pressure | ≥ 0.000001 Pa | — |
Pressure | ≥ 0.0001 Pa | — |
Pressure | ≥ 0.01 Pa | — |
Pressure | ≥ 1 Pa | — |
Pressure | ≥ 100 Pa | — |
Pressure | ≥ 10 Pa | — |
Thickness | ≥ 50 nm | — |
Thickness | 5–300 nm | — |