Patent
US 8,835,286Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
24 CLAIMS
The manufacturing method of a g raphene substrate according to claim 1, further 10 compr i sing; (c) removing the metal layer after the (b).
5. The manufacturing method of a g raphene substrate according to any one of claims 1 30 to 4, wherein the carbide layer comprises at least one selected from the g roup consisting of silicon carbide (SiC), boron carbide (B 4C), aluminum carbide (A laC₃), titanium carbide (TiC), zirconium carbide (Z rC), hafnium carbide (H fC), vanadium carbide (VC), niobium carbide (NbC), tantalum carbide (TaC), chromium carbide (CrC), molybdenum carbide (MoC), and tungsten carbide (WC).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 5, wherein the metal layer comprises at least one selected from the g roup consisting of gallium (Ga), indium (In), thallium (T l), tin (Sn), lead (Pb), bismuth (Bi), zin c (Zn), and cadmium (Cd).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 6, wherein the heating temperature in the (a) is 800 to 1200 °C.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the metal layer is placed in a holder, the carbide layer is then placed on the metal layer, and the metal layer and the carbide layer are heated to dissolve carbon in the car bide layer into the metal layer.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the substrate is placed in a holder, a frame is placed on the substrate, 20 the metal layer is placed in the frame, a second substrate is placed thereon, and the metal layer, the carbide layer, and the second substrate are heated to dissolve carbon in the carbide layer into the metal layer. 1 1. The manufacturing method of a g raphene substrate according to any one of claims 25 1 to 10, wherein the carbide layer comprises a concavo-convex shape.
The manufacturing method of a g raphene substrate according to claim 1 1, wherein g raphene is segregated on both the projections and recesses of the concavo-convex shape of the car bide layer.
15. A g raphene substrate manufactured by substrate according to any one of claims 1 to 14.
A semiconductor device manufactured using substrate according to claim 1 1, wherein in the of the concavo-convex shape of the car bide substrate according to claim 1 1, wherein in the projections of the concavo-convex shape. the manufacturing method of a g raphene the g raphene substrate according to claim 1 5.
The manufacturing method of a g raphene (b), graphene is segregated only on the projections layer. 26
The manufacturing method of a g raphene (b), graphene is segregated so as to bridge the
Layer stacks claimed or described, ordered top of device to substrate.
graphene substrate
semiconductor device
Materials described outside the worked examples.
graphene
C
carbide layer
heat resistant material layer
silicon carbide
SiC
boron carbide
B₄C
aluminum carbide
Al₄C₃
titanium carbide
TiC
zirconium carbide
ZrC
hafnium carbide
HfC
vanadium carbide
VC
niobium carbide
NbC
tantalum carbide
TaC
chromium carbide
CrC
molybdenum carbide
MoC
tungsten carbide
WC
quartz
SiO₂
alumina
Al₂O₃
boron nitride
BN
zirconia
ZrO₂
aluminum nitride
AlN
gallium
Ga
indium
In
thallium
Tl
tin
Sn
lead
Pb
bismuth
Bi
zinc
Zn
cadmium
Cd
Additional fabrication and treatment steps described in the patent.
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Temperature | 800–1000 °C | — |
Duration | 60–120 minutes | — |
Temperature | 800–1200 °C | — |
Thickness | 3.3–3.4 Å | — |
Thickness | 0.33–0.34 nm | — |
Temperature | 1400–1600 °C | — |
Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
24 CLAIMS
The manufacturing method of a g raphene substrate according to claim 1, further 10 compr i sing; (c) removing the metal layer after the (b).
5. The manufacturing method of a g raphene substrate according to any one of claims 1 30 to 4, wherein the carbide layer comprises at least one selected from the g roup consisting of silicon carbide (SiC), boron carbide (B 4C), aluminum carbide (A laC₃), titanium carbide (TiC), zirconium carbide (Z rC), hafnium carbide (H fC), vanadium carbide (VC), niobium carbide (NbC), tantalum carbide (TaC), chromium carbide (CrC), molybdenum carbide (MoC), and tungsten carbide (WC).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 5, wherein the metal layer comprises at least one selected from the g roup consisting of gallium (Ga), indium (In), thallium (T l), tin (Sn), lead (Pb), bismuth (Bi), zin c (Zn), and cadmium (Cd).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 6, wherein the heating temperature in the (a) is 800 to 1200 °C.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the metal layer is placed in a holder, the carbide layer is then placed on the metal layer, and the metal layer and the carbide layer are heated to dissolve carbon in the car bide layer into the metal layer.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the substrate is placed in a holder, a frame is placed on the substrate, 20 the metal layer is placed in the frame, a second substrate is placed thereon, and the metal layer, the carbide layer, and the second substrate are heated to dissolve carbon in the carbide layer into the metal layer. 1 1. The manufacturing method of a g raphene substrate according to any one of claims 25 1 to 10, wherein the carbide layer comprises a concavo-convex shape.
The manufacturing method of a g raphene substrate according to claim 1 1, wherein g raphene is segregated on both the projections and recesses of the concavo-convex shape of the car bide layer.
15. A g raphene substrate manufactured by substrate according to any one of claims 1 to 14.
A semiconductor device manufactured using substrate according to claim 1 1, wherein in the of the concavo-convex shape of the car bide substrate according to claim 1 1, wherein in the projections of the concavo-convex shape. the manufacturing method of a g raphene the g raphene substrate according to claim 1 5.
The manufacturing method of a g raphene (b), graphene is segregated only on the projections layer. 26
The manufacturing method of a g raphene (b), graphene is segregated so as to bridge the
Layer stacks claimed or described, ordered top of device to substrate.
graphene substrate
semiconductor device
Materials described outside the worked examples.
graphene
C
carbide layer
heat resistant material layer
silicon carbide
SiC
boron carbide
B₄C
aluminum carbide
Al₄C₃
titanium carbide
TiC
zirconium carbide
ZrC
hafnium carbide
HfC
vanadium carbide
VC
niobium carbide
NbC
tantalum carbide
TaC
chromium carbide
CrC
molybdenum carbide
MoC
tungsten carbide
WC
quartz
SiO₂
alumina
Al₂O₃
boron nitride
BN
zirconia
ZrO₂
aluminum nitride
AlN
gallium
Ga
indium
In
thallium
Tl
tin
Sn
lead
Pb
bismuth
Bi
zinc
Zn
cadmium
Cd
Additional fabrication and treatment steps described in the patent.
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Temperature | 800–1000 °C | — |
Duration | 60–120 minutes | — |
Temperature | 800–1200 °C | — |
Thickness | 3.3–3.4 Å | — |
Thickness | 0.33–0.34 nm | — |
Temperature | 1400–1600 °C | — |
Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
24 CLAIMS
The manufacturing method of a g raphene substrate according to claim 1, further 10 compr i sing; (c) removing the metal layer after the (b).
5. The manufacturing method of a g raphene substrate according to any one of claims 1 30 to 4, wherein the carbide layer comprises at least one selected from the g roup consisting of silicon carbide (SiC), boron carbide (B 4C), aluminum carbide (A laC₃), titanium carbide (TiC), zirconium carbide (Z rC), hafnium carbide (H fC), vanadium carbide (VC), niobium carbide (NbC), tantalum carbide (TaC), chromium carbide (CrC), molybdenum carbide (MoC), and tungsten carbide (WC).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 5, wherein the metal layer comprises at least one selected from the g roup consisting of gallium (Ga), indium (In), thallium (T l), tin (Sn), lead (Pb), bismuth (Bi), zin c (Zn), and cadmium (Cd).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 6, wherein the heating temperature in the (a) is 800 to 1200 °C.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the metal layer is placed in a holder, the carbide layer is then placed on the metal layer, and the metal layer and the carbide layer are heated to dissolve carbon in the car bide layer into the metal layer.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the substrate is placed in a holder, a frame is placed on the substrate, 20 the metal layer is placed in the frame, a second substrate is placed thereon, and the metal layer, the carbide layer, and the second substrate are heated to dissolve carbon in the carbide layer into the metal layer. 1 1. The manufacturing method of a g raphene substrate according to any one of claims 25 1 to 10, wherein the carbide layer comprises a concavo-convex shape.
The manufacturing method of a g raphene substrate according to claim 1 1, wherein g raphene is segregated on both the projections and recesses of the concavo-convex shape of the car bide layer.
15. A g raphene substrate manufactured by substrate according to any one of claims 1 to 14.
A semiconductor device manufactured using substrate according to claim 1 1, wherein in the of the concavo-convex shape of the car bide substrate according to claim 1 1, wherein in the projections of the concavo-convex shape. the manufacturing method of a g raphene the g raphene substrate according to claim 1 5.
The manufacturing method of a g raphene (b), graphene is segregated only on the projections layer. 26
The manufacturing method of a g raphene (b), graphene is segregated so as to bridge the
Layer stacks claimed or described, ordered top of device to substrate.
graphene substrate
semiconductor device
Materials described outside the worked examples.
graphene
C
carbide layer
heat resistant material layer
silicon carbide
SiC
boron carbide
B₄C
aluminum carbide
Al₄C₃
titanium carbide
TiC
zirconium carbide
ZrC
hafnium carbide
HfC
vanadium carbide
VC
niobium carbide
NbC
tantalum carbide
TaC
chromium carbide
CrC
molybdenum carbide
MoC
tungsten carbide
WC
quartz
SiO₂
alumina
Al₂O₃
boron nitride
BN
zirconia
ZrO₂
aluminum nitride
AlN
gallium
Ga
indium
In
thallium
Tl
tin
Sn
lead
Pb
bismuth
Bi
zinc
Zn
cadmium
Cd
Additional fabrication and treatment steps described in the patent.
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Temperature | 800–1000 °C | — |
Duration | 60–120 minutes | — |
Temperature | 800–1200 °C | — |
Thickness | 3.3–3.4 Å | — |
Thickness | 0.33–0.34 nm | — |
Temperature | 1400–1600 °C | — |
Patent drawings and their descriptions. Click a drawing to enlarge it.
Claims define the patent's legal scope. Independent claims stand alone; dependent claims (nested) narrow them. Click a claim to expand its dependents.
24 CLAIMS
The manufacturing method of a g raphene substrate according to claim 1, further 10 compr i sing; (c) removing the metal layer after the (b).
5. The manufacturing method of a g raphene substrate according to any one of claims 1 30 to 4, wherein the carbide layer comprises at least one selected from the g roup consisting of silicon carbide (SiC), boron carbide (B 4C), aluminum carbide (A laC₃), titanium carbide (TiC), zirconium carbide (Z rC), hafnium carbide (H fC), vanadium carbide (VC), niobium carbide (NbC), tantalum carbide (TaC), chromium carbide (CrC), molybdenum carbide (MoC), and tungsten carbide (WC).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 5, wherein the metal layer comprises at least one selected from the g roup consisting of gallium (Ga), indium (In), thallium (T l), tin (Sn), lead (Pb), bismuth (Bi), zin c (Zn), and cadmium (Cd).
The manufacturing method of a g raphene substrate according to any one of claims 1 to 6, wherein the heating temperature in the (a) is 800 to 1200 °C.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the metal layer is placed in a holder, the carbide layer is then placed on the metal layer, and the metal layer and the carbide layer are heated to dissolve carbon in the car bide layer into the metal layer.
The manufacturing method of a g raphene substrate according to any one of claims 1 to 8, wherein in the (a), the substrate is placed in a holder, a frame is placed on the substrate, 20 the metal layer is placed in the frame, a second substrate is placed thereon, and the metal layer, the carbide layer, and the second substrate are heated to dissolve carbon in the carbide layer into the metal layer. 1 1. The manufacturing method of a g raphene substrate according to any one of claims 25 1 to 10, wherein the carbide layer comprises a concavo-convex shape.
The manufacturing method of a g raphene substrate according to claim 1 1, wherein g raphene is segregated on both the projections and recesses of the concavo-convex shape of the car bide layer.
15. A g raphene substrate manufactured by substrate according to any one of claims 1 to 14.
A semiconductor device manufactured using substrate according to claim 1 1, wherein in the of the concavo-convex shape of the car bide substrate according to claim 1 1, wherein in the projections of the concavo-convex shape. the manufacturing method of a g raphene the g raphene substrate according to claim 1 5.
The manufacturing method of a g raphene (b), graphene is segregated only on the projections layer. 26
The manufacturing method of a g raphene (b), graphene is segregated so as to bridge the
Layer stacks claimed or described, ordered top of device to substrate.
graphene substrate
semiconductor device
Materials described outside the worked examples.
graphene
C
carbide layer
heat resistant material layer
silicon carbide
SiC
boron carbide
B₄C
aluminum carbide
Al₄C₃
titanium carbide
TiC
zirconium carbide
ZrC
hafnium carbide
HfC
vanadium carbide
VC
niobium carbide
NbC
tantalum carbide
TaC
chromium carbide
CrC
molybdenum carbide
MoC
tungsten carbide
WC
quartz
SiO₂
alumina
Al₂O₃
boron nitride
BN
zirconia
ZrO₂
aluminum nitride
AlN
gallium
Ga
indium
In
thallium
Tl
tin
Sn
lead
Pb
bismuth
Bi
zinc
Zn
cadmium
Cd
Additional fabrication and treatment steps described in the patent.
Performance values and ranges asserted in the specification or claims.
| Property | Value | Material |
|---|---|---|
Temperature | 800–1000 °C | — |
Duration | 60–120 minutes | — |
Temperature | 800–1200 °C | — |
Thickness | 3.3–3.4 Å | — |
Thickness | 0.33–0.34 nm | — |
Temperature | 1400–1600 °C | — |