Patent
US 8,357,945hydrazine
N₂H₄
methylamine
CH₃NH₂
ethylenediamine
C₂H₈N₂
melamine
C₃H₆N₆
Ga metal
Ga
PL peak photon energy at 300 K | 3.38–3.41 eV | GaN |
seed crystal dislocation density upper bound | ≤ 100000000 cm⁻² | GaN |
— | 3.38–3.45 eV | — |
Thickness | ≤ 5 cm | — |
Duration | 60–7200 s | — |
Thickness | ≤ 10000 cm | — |
Thickness | ≤ 1000 cm | — |
Thickness | ≤ 1 cm | — |
Thickness | ≤ 100000000 cm | — |
Pressure | ≤ 1 bar | — |
Thickness | 465–700 nm | — |
Thickness | ≥ 2 mm | — |
hydrazine
N₂H₄
methylamine
CH₃NH₂
ethylenediamine
C₂H₈N₂
melamine
C₃H₆N₆
Ga metal
Ga
PL peak photon energy at 300 K | 3.38–3.41 eV | GaN |
seed crystal dislocation density upper bound | ≤ 100000000 cm⁻² | GaN |
— | 3.38–3.45 eV | — |
Thickness | ≤ 5 cm | — |
Duration | 60–7200 s | — |
Thickness | ≤ 10000 cm | — |
Thickness | ≤ 1000 cm | — |
Thickness | ≤ 1 cm | — |
Thickness | ≤ 100000000 cm | — |
Pressure | ≤ 1 bar | — |
Thickness | 465–700 nm | — |
Thickness | ≥ 2 mm | — |
hydrazine
N₂H₄
methylamine
CH₃NH₂
ethylenediamine
C₂H₈N₂
melamine
C₃H₆N₆
Ga metal
Ga
PL peak photon energy at 300 K | 3.38–3.41 eV | GaN |
seed crystal dislocation density upper bound | ≤ 100000000 cm⁻² | GaN |
— | 3.38–3.45 eV | — |
Thickness | ≤ 5 cm | — |
Duration | 60–7200 s | — |
Thickness | ≤ 10000 cm | — |
Thickness | ≤ 1000 cm | — |
Thickness | ≤ 1 cm | — |
Thickness | ≤ 100000000 cm | — |
Pressure | ≤ 1 bar | — |
Thickness | 465–700 nm | — |
Thickness | ≥ 2 mm | — |
hydrazine
N₂H₄
methylamine
CH₃NH₂
ethylenediamine
C₂H₈N₂
melamine
C₃H₆N₆
Ga metal
Ga
PL peak photon energy at 300 K | 3.38–3.41 eV | GaN |
seed crystal dislocation density upper bound | ≤ 100000000 cm⁻² | GaN |
— | 3.38–3.45 eV | — |
Thickness | ≤ 5 cm | — |
Duration | 60–7200 s | — |
Thickness | ≤ 10000 cm | — |
Thickness | ≤ 1000 cm | — |
Thickness | ≤ 1 cm | — |
Thickness | ≤ 100000000 cm | — |
Pressure | ≤ 1 bar | — |
Thickness | 465–700 nm | — |
Thickness | ≥ 2 mm | — |