Patent
US 10,435,837anionic surfactant
intercalated graphite flakes
nonionic surfactant
expanded graphite
Thickness (z) of graphene nanoparticles determined by atomic force microscope (profilometer with subnanometer resolution); single graphene layer = 0.34 nm.
C/O ratio in graphene nanoparticles determined by elemental analysis via Inductively Coupled Plasma Mass Spectrometry; values normalized to atomic weights of C and O to yield C/O ratio.
| 0.34–30 nm |
| — |
— | 100–2000 W | — |
Duration | 1–100 hours | — |
Thickness | 50–5000 nm | — |
Thickness | 100–2000 nm | — |
Thickness | 0.34–20 nm | — |
Thickness | 0.34–15 nm | — |
— | 200–1000 W | — |
Duration | 2–80 hours | — |
Thickness | 500–3000 nm | — |
Thickness | 200–2000 nm | — |
Thickness | 0.34–10 nm | — |
Thickness | 100–1000 nm | — |
Thickness | 0.34–6 nm | — |
Thickness | 500–10000 nm | — |
Thickness | 0.5–15 nm | — |
Thickness | 500–5000 nm | — |
Thickness | 0.5–10 nm | — |
Temperature | ≥ 1300 °C | — |
Duration | ≤ 1 second | — |
anionic surfactant
intercalated graphite flakes
nonionic surfactant
expanded graphite
Thickness (z) of graphene nanoparticles determined by atomic force microscope (profilometer with subnanometer resolution); single graphene layer = 0.34 nm.
C/O ratio in graphene nanoparticles determined by elemental analysis via Inductively Coupled Plasma Mass Spectrometry; values normalized to atomic weights of C and O to yield C/O ratio.
| 0.34–30 nm |
| — |
— | 100–2000 W | — |
Duration | 1–100 hours | — |
Thickness | 50–5000 nm | — |
Thickness | 100–2000 nm | — |
Thickness | 0.34–20 nm | — |
Thickness | 0.34–15 nm | — |
— | 200–1000 W | — |
Duration | 2–80 hours | — |
Thickness | 500–3000 nm | — |
Thickness | 200–2000 nm | — |
Thickness | 0.34–10 nm | — |
Thickness | 100–1000 nm | — |
Thickness | 0.34–6 nm | — |
Thickness | 500–10000 nm | — |
Thickness | 0.5–15 nm | — |
Thickness | 500–5000 nm | — |
Thickness | 0.5–10 nm | — |
Temperature | ≥ 1300 °C | — |
Duration | ≤ 1 second | — |
anionic surfactant
intercalated graphite flakes
nonionic surfactant
expanded graphite
Thickness (z) of graphene nanoparticles determined by atomic force microscope (profilometer with subnanometer resolution); single graphene layer = 0.34 nm.
C/O ratio in graphene nanoparticles determined by elemental analysis via Inductively Coupled Plasma Mass Spectrometry; values normalized to atomic weights of C and O to yield C/O ratio.
| 0.34–30 nm |
| — |
— | 100–2000 W | — |
Duration | 1–100 hours | — |
Thickness | 50–5000 nm | — |
Thickness | 100–2000 nm | — |
Thickness | 0.34–20 nm | — |
Thickness | 0.34–15 nm | — |
— | 200–1000 W | — |
Duration | 2–80 hours | — |
Thickness | 500–3000 nm | — |
Thickness | 200–2000 nm | — |
Thickness | 0.34–10 nm | — |
Thickness | 100–1000 nm | — |
Thickness | 0.34–6 nm | — |
Thickness | 500–10000 nm | — |
Thickness | 0.5–15 nm | — |
Thickness | 500–5000 nm | — |
Thickness | 0.5–10 nm | — |
Temperature | ≥ 1300 °C | — |
Duration | ≤ 1 second | — |
anionic surfactant
intercalated graphite flakes
nonionic surfactant
expanded graphite
Thickness (z) of graphene nanoparticles determined by atomic force microscope (profilometer with subnanometer resolution); single graphene layer = 0.34 nm.
C/O ratio in graphene nanoparticles determined by elemental analysis via Inductively Coupled Plasma Mass Spectrometry; values normalized to atomic weights of C and O to yield C/O ratio.
| 0.34–30 nm |
| — |
— | 100–2000 W | — |
Duration | 1–100 hours | — |
Thickness | 50–5000 nm | — |
Thickness | 100–2000 nm | — |
Thickness | 0.34–20 nm | — |
Thickness | 0.34–15 nm | — |
— | 200–1000 W | — |
Duration | 2–80 hours | — |
Thickness | 500–3000 nm | — |
Thickness | 200–2000 nm | — |
Thickness | 0.34–10 nm | — |
Thickness | 100–1000 nm | — |
Thickness | 0.34–6 nm | — |
Thickness | 500–10000 nm | — |
Thickness | 0.5–15 nm | — |
Thickness | 500–5000 nm | — |
Thickness | 0.5–10 nm | — |
Temperature | ≥ 1300 °C | — |
Duration | ≤ 1 second | — |