Patent
US 10,336,619diethyl ether
(C₂H₅)2O
FIG. 6 is an Atomic Force Microscopy image of a graphene oxide flake on a mica 30 substrate 4 [0019]
FIG. 7 shows TEM images for graphene oxide obtained on a lacey- carbon TEM grid and SAED pattern [0020]
| — |
Temperature | 130–220 °C | — |
Thickness | 1–3500 cm | — |
Temperature | 0–10 °C | — |
Thickness | 3000–4000 cm | — |
Thickness | 1590–1620 cm | — |
Duration | ≥ 8 hours | — |
diethyl ether
(C₂H₅)2O
FIG. 6 is an Atomic Force Microscopy image of a graphene oxide flake on a mica 30 substrate 4 [0019]
FIG. 7 shows TEM images for graphene oxide obtained on a lacey- carbon TEM grid and SAED pattern [0020]
| — |
Temperature | 130–220 °C | — |
Thickness | 1–3500 cm | — |
Temperature | 0–10 °C | — |
Thickness | 3000–4000 cm | — |
Thickness | 1590–1620 cm | — |
Duration | ≥ 8 hours | — |
diethyl ether
(C₂H₅)2O
FIG. 6 is an Atomic Force Microscopy image of a graphene oxide flake on a mica 30 substrate 4 [0019]
FIG. 7 shows TEM images for graphene oxide obtained on a lacey- carbon TEM grid and SAED pattern [0020]
| — |
Temperature | 130–220 °C | — |
Thickness | 1–3500 cm | — |
Temperature | 0–10 °C | — |
Thickness | 3000–4000 cm | — |
Thickness | 1590–1620 cm | — |
Duration | ≥ 8 hours | — |
diethyl ether
(C₂H₅)2O
FIG. 6 is an Atomic Force Microscopy image of a graphene oxide flake on a mica 30 substrate 4 [0019]
FIG. 7 shows TEM images for graphene oxide obtained on a lacey- carbon TEM grid and SAED pattern [0020]
| — |
Temperature | 130–220 °C | — |
Thickness | 1–3500 cm | — |
Temperature | 0–10 °C | — |
Thickness | 3000–4000 cm | — |
Thickness | 1590–1620 cm | — |
Duration | ≥ 8 hours | — |