Abstract

Scanning probe techniques can image van der Waals moiré superlattices in real space, but raw images contain systematic distortions from scan geometry and thermal drift. This paper introduces a correction protocol using X/Y position sensors and drift-velocity correction to improve extraction of moiré lattice vectors, twist angle, and heterostrain from torsional force microscopy images of twisted bilayer graphene.

Abstract

Scanning probe techniques can image van der Waals moiré superlattices in real space, but raw images contain systematic distortions from scan geometry and thermal drift. This paper introduces a correction protocol using X/Y position sensors and drift-velocity correction to improve extraction of moiré lattice vectors, twist angle, and heterostrain from torsional force microscopy images of twisted bilayer graphene.

Abstract

Scanning probe techniques can image van der Waals moiré superlattices in real space, but raw images contain systematic distortions from scan geometry and thermal drift. This paper introduces a correction protocol using X/Y position sensors and drift-velocity correction to improve extraction of moiré lattice vectors, twist angle, and heterostrain from torsional force microscopy images of twisted bilayer graphene.

Abstract

Scanning probe techniques can image van der Waals moiré superlattices in real space, but raw images contain systematic distortions from scan geometry and thermal drift. This paper introduces a correction protocol using X/Y position sensors and drift-velocity correction to improve extraction of moiré lattice vectors, twist angle, and heterostrain from torsional force microscopy images of twisted bilayer graphene.